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    Method and apparatus for controlled pencil beam therapy with rapid beam compensation
    1.
    发明授权
    Method and apparatus for controlled pencil beam therapy with rapid beam compensation 有权

    公开(公告)号：US10195465B2

    公开(公告)日：2019-02-05

    申请号：US15840604

    申请日：2017-12-13

    Applicant: Pyramid Technical Consultants Inc.

    Inventor： John Stuart Gordon ,  Raymond Paul Boisseau

    IPC: A61N5/10

    Abstract: A control system for fine tuning or spreading a charged particle pencil beam includes a low-inductance, low-power compensation or fine-tuning magnet assembly. The feedback loop that includes the compensation magnet assembly has a faster response rate than the feedback loop that includes the scan nozzle. The compensation or fine-tuning magnet assembly is preferably disposed upstream of the scan nozzle magnet(s) with respect to the beam path to make rapid but minor adjustments to the beam position between iterations of the scan nozzle.

    Safety dose interlock for charged particle beams
    3.
    发明授权
    Safety dose interlock for charged particle beams 有权

    公开(公告)号：US10300304B2

    公开(公告)日：2019-05-28

    申请号：US15904571

    申请日：2018-02-26

    Applicant: Pyramid Technical Consultants Inc.

    Inventor： William P. Nett ,  John Gordon ,  Raymond Paul Boisseau

    IPC: H01J37/244 ,  A61N5/00 ,  A61N5/10 ,  H01J37/24

    Abstract: An assembly for preventing an overdose of a charged particle beam during therapy to a patient includes a pixelated detector apparatus and a controller. The controller includes, for each pixel: a current integrator circuit that converts the local measured current into a total local detected charge integrated from a start time, the integrator circuit outputting an integrator voltage that corresponds to the total local detected charge; and a discriminator circuit that compares the integrator voltage with a reference voltage, the reference voltage corresponding to a maximum acceptable dose for the patient. A logic circuit generates an overdose fault signal if, at any of the pixels, the integrator voltage is higher than the reference voltage.

    SYSTEM, APPARATUS AND METHOD FOR DEFLECTING A PARTICLE BEAM
    4.
    发明申请
    SYSTEM, APPARATUS AND METHOD FOR DEFLECTING A PARTICLE BEAM 有权
    用于偏转粒子束的系统，装置和方法

    公开(公告)号：US20130043403A1

    公开(公告)日：2013-02-21

    申请号：US13214118

    申请日：2011-08-19

    Applicant: John Gordon ,  Raymond Paul Boisseau ,  Andrew Dart

    Inventor： John Gordon ,  Raymond Paul Boisseau ,  Andrew Dart

    IPC: H01J1/50

    CPC classification number: G21K1/093 ,  A61N5/1043 ,  A61N2005/1087 ,  H05H2007/046

    Abstract: A variety of systems, apparatus and methods for deflecting a particle beam are described. An apparatus comprises at least six electromagnetic portions disposed on a plane. Each of the at least six electromagnetic portions is aligned with a radius emanating from an axis normal to the plane and is distanced from the axis to form a volume about the axis. At least six coils are configured for affecting a dipole magnetic field in the volume in response to electrical currents applied to physically opposing coils where a particle beam entering the volume is deflected. Each of the at least six coils is disposed about a one of the at least six electromagnetic portions. A yoke structure is configured for returning a generated magnetic flux.

    Abstract translation: 描述了用于偏转粒子束的各种系统，装置和方法。 一种设备包括设置在平面上的至少六个电磁部分。 所述至少六个电磁部分中的每一个与从所述平面垂直的轴线发出的半径对准，并且与所述轴线分开以形成围绕所述轴线的体积。 至少六个线圈被配置为响应于施加到物理相对的线圈的电流而影响体积中的偶极磁场，其中进入体积的粒子束被偏转。 所述至少六个线圈中的每一个围绕所述至少六个电磁部分中的一个设置。 轭结构被配置为返回产生的磁通量。

    Method and apparatus for controlled pencil beam therapy
    7.
    发明授权
    Method and apparatus for controlled pencil beam therapy 有权

    公开(公告)号：US10183178B2

    公开(公告)日：2019-01-22

    申请号：US15146541

    申请日：2016-05-04

    Applicant: Pyramid Technical Consultants Inc.

    Inventor： Raymond Paul Boisseau ,  John Gordon ,  William P. Nett ,  Kan Ota

    IPC: A61N5/10

    Abstract: A control system for providing a closed loop, real time control of a charged particle pencil beam is disclosed. The system includes a first detector apparatus, a second detector apparatus, a first orthogonal magnetic deflector apparatus, a second orthogonal magnetic deflector apparatus, and a controller. The controller compares the measured position and beam angle of the beam with a model position and beam angle of a model beam to determine an offset error and a beam angle error. The first orthogonal magnetic deflector apparatus includes a pair of electromagnets to correct a first component of the offset and beam angle errors. The second orthogonal magnetic deflector apparatus includes a pair of electromagnets to correct a second component of the offset and beam angle errors. The beam can be iteratively adjusted during patient therapy or short pauses in patient therapy.

    Multi-resolution detectors for measuring and controlling a charged particle pencil beam
    10.
    发明授权
    Multi-resolution detectors for measuring and controlling a charged particle pencil beam 有权
    用于测量和控制带电粒子笔束的多分辨率检测器

    公开(公告)号：US09427599B1

    公开(公告)日：2016-08-30

    申请号：US14632270

    申请日：2015-02-26

    Applicant: Pyramid Technical Consultants, Inc.

    Inventor： R. Paul Boisseau ,  Andrew Dart ,  John Gordon ,  Kan Ota

    IPC: G01T1/24 ,  A61N5/10

    CPC classification number: A61N5/1048 ,  A61N5/1075 ,  A61N5/1077 ,  A61N2005/1074 ,  A61N2005/1087 ,  H01J47/02

    Abstract: A multi-resolution detector includes a high-resolution pixelated electrode and a low-resolution pixelated electrode. The high-resolution pixelated electrode includes a plurality of sub-arrays of first pixels. Each respective first pixel at each relative position in each sub-array is electrically connected in parallel with one another. The low-resolution pixelated electrode includes a plurality of second pixels. A control system receives as inputs an output from each pixelated detector. The control system uses the inputs to determine a physical position and a transverse intensity distribution of an incident charged particle pencil beam at the resolution of the high-resolution pixelated electrode.

    Abstract translation: 多分辨率检测器包括高分辨率像素电极和低分辨率像素化电极。 高分辨率像素化电极包括多个第一像素的子阵列。 每个子阵列中的每个相对位置处的每个相应的第一像素彼此并联地电连接。 低分辨率像素化电极包括多个第二像素。 控制系统接收来自每个像素化检测器的输出作为输入。 控制系统使用这些输入来确定入射带电粒子束在高分辨率像素化电极的分辨率下的物理位置和横向强度分布。

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