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    Linear temperature calibration compensation for spectrometer systems
    1.
    发明授权
    Linear temperature calibration compensation for spectrometer systems 有权

    公开(公告)号：US12163835B2

    公开(公告)日：2024-12-10

    申请号：US17299908

    申请日：2019-12-17

    Applicant: ams Sensors Singapore Pte. Ltd.

    Inventor： Javier Miguel Sánchez

    IPC: G01J3/02 ,  G01J3/12 ,  G01J3/26 ,  G01J3/45

    Abstract: In an example method, light is emitted towards a sample region, and sample light is received at an interferometer. A subset of the sample light is transmitted from the interferometer to a detector. Transmitting the subset of the sample light includes determining a reference voltage corresponding to the range of wavelengths of the subset of sample light, and a reference temperature. Transmitting the subset of sample light also includes determining a temperature of an environment, determining a bias voltage corresponding to a difference between the reference temperature and the temperature of the environment, and applying, to the interferometer, an input voltage corresponding to the sum of the reference voltage and the bias voltage. The subset of the sample light is measured by the detector, and a spectral distribution of light is determined based on the measurements.

    Spectrometer including an illumination channel that includes a light pipe
    2.
    发明授权
    Spectrometer including an illumination channel that includes a light pipe 有权

    公开(公告)号：US12140532B2

    公开(公告)日：2024-11-12

    申请号：US17600191

    申请日：2020-04-23

    Applicant: ams Sensors Singapore Pte. Ltd.

    Inventor： Elisa Parola ,  Bassam Hallal

    IPC: G01N21/31

    Abstract: An apparatus includes a spectrometer. A housing is attached to a substrate and defines an illumination channel and a receiving channel. The illumination channel includes an illumination source mounted on the substrate and operable to produce light in a particular part of the spectrum. A light pipe is disposed over the illumination source so as to direct light from the illumination source out of the illumination channel toward a target. The receiving channel includes a sensor chip mounted on the substrate. The sensor chip includes light sensitive elements, each of which is selectively sensitive to a respective region of the particular part of the spectrum. The sensor chip further includes an electronic control unit operable to analyze signals from the light sensitive elements.

    Optical detection system calibration
    4.
    发明授权
    Optical detection system calibration 有权

    公开(公告)号：US12092567B2

    公开(公告)日：2024-09-17

    申请号：US17762456

    申请日：2021-05-24

    Applicant: ams Sensors Singapore Pte. Ltd.

    Inventor： Francesco Paolo D'Aleo ,  Javier Miguel Sánchez ,  Kotaro Ishizaki ,  Peter Roentgen

    IPC: G01N21/27 ,  G01N21/55

    CPC classification number: G01N21/274 ,  G01N21/55 ,  G01N2201/127

    Abstract: According to a first aspect of the present invention there is provided a method of measuring the optical reflectance R of a target using a detection system comprising a light emitter and a light detector spaced apart from one another. The method comprises illuminating the target with the light emitter, detecting light reflected from the target using the light detector, wherein the light detector provides an electrical output signal SS indicative of the intensity of the detected light, and determining the optical reflectance R of the target according to (Formula 1), where RR is the spectral reflectance of a reference standard, SR is the detector electrical output signal with the reference standard in place, SH is the detector electrical output signal with no target in front of the light emitter and light detector, and M is a calibration factor.








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    APPARATUS AND METHOD FOR DETECTING MOVEMENT ALONG AN AXIS
    7.
    发明公开
    APPARATUS AND METHOD FOR DETECTING MOVEMENT ALONG AN AXIS 审中-公开

    公开(公告)号：US20240159573A1

    公开(公告)日：2024-05-16

    申请号：US18549593

    申请日：2022-03-15

    Applicant: AMS SENSORS SINGAPORE PTE. LTD.

    Inventor： Markus DANTLER ,  Laurent NEVOU ,  Jens GEIGER ,  Markus ROSSI ,  Ferran SUAREZ

    IPC: G01D5/30 ,  G04C3/00 ,  G04G21/00

    CPC classification number: G01D5/30 ,  G04C3/001 ,  G04G21/00

    Abstract: An apparatus may provide a control signal based on an axial position of a controller displaceable along an axis. The apparatus may include a component for displacement with said controller along said axis, a radiation source and detector arrangement configured to direct radiation towards a target region and generate a detector signal dependent upon radiation reflected from within that target region, and a computer processor configured to process said detector signal to determine a measure of distance or change of distance to a reflecting surface region within said target region, and to use said measure to provide said control signal. The component may define a reflecting surface that passes through said target region such that a reflecting surface region is present within said target region with a distance that varies with the axial position of the component along said axis.

    Self-calibrating spectral sensor modules
    8.
    发明授权
    Self-calibrating spectral sensor modules 有权

    公开(公告)号：US11821790B2

    公开(公告)日：2023-11-21

    申请号：US17433793

    申请日：2020-03-25

    Applicant: ams Sensors Singapore Pte. Ltd.

    Inventor： Javier Miguel Sánchez

    IPC: G01J3/02 ,  G01J3/10 ,  G01J3/28

    CPC classification number: G01J3/027 ,  G01J2003/102 ,  G01J2003/2879

    Abstract: An example system includes a first light source, a second light source, a photodetector, and an electronic control device. The electronic control device is operable to cause the first light source to emit first light within a range of wavelengths towards a subject, and measure, using the photodetector, the first light reflected from the subject. The electronic control device is also operable to cause the second light source to emit second light including a plurality of emission peaks within the range of wavelengths, and measure, using the photodetector, the second light. The electronic control device is also operable to determine spectral information regarding the subject based on the measured first light and the measured second light.

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