Sensor with symmetrical limiting of a signal
    1.
    发明授权
    Sensor with symmetrical limiting of a signal 有权
    传感器对称限制信号

    公开(公告)号:US07134338B2

    公开(公告)日:2006-11-14

    申请号:US10996224

    申请日:2004-11-23

    CPC classification number: G01P15/125 G01P15/08

    Abstract: A sensor having a seismic mass and having an arrangement for detecting the deflection of the mass and converting it into an electrical signal; in at least one operating mode of the sensor, a mechanical stop asymmetrically limiting the deflection of the seismic mass with respect to a vibrational center position. An arrangement for symmetrical limiting of the signal provided on the sensor.

    Abstract translation: 一种具有地震质量并具有用于检测质量的偏转并将其转换为电信号的装置的传感器; 在传感器的至少一个操作模式中,机械停止以不对称的方式限制地震质量相对于振动中心位置的偏转。 用于传感器上提供的信号的对称限制的装置。

    Sensor with symmetrical limiting of a signal
    3.
    发明申请
    Sensor with symmetrical limiting of a signal 有权
    传感器对称限制信号

    公开(公告)号:US20050126288A1

    公开(公告)日:2005-06-16

    申请号:US10996224

    申请日:2004-11-23

    CPC classification number: G01P15/125 G01P15/08

    Abstract: A sensor having a seismic mass and having means for detecting the deflection of the mass and converting it into an electrical signal; in at least one operating mode of the sensor, a mechanical stop asymmetrically limiting the deflection of the seismic mass with respect to a vibrational center position. Means for symmetrical limiting of the signal are provided on the sensor.

    Abstract translation: 具有地震质量并具有用于检测质量的偏转并将其转换为电信号的装置的传感器; 在传感器的至少一个操作模式中,机械停止以不对称的方式限制地震质量相对于振动中心位置的偏转。 在传感器上提供信号对称限制的装置。

    Micromechanical sensor having fault identification
    4.
    发明申请
    Micromechanical sensor having fault identification 有权
    具有故障识别的微机械传感器

    公开(公告)号:US20050268718A1

    公开(公告)日:2005-12-08

    申请号:US11133834

    申请日:2005-05-19

    CPC classification number: G01P21/00 G01P15/125

    Abstract: A sensor includes a micromechanical functional part and an electronic evaluation circuit which are in electrical connection to each other using electrical conductors. An arrangement for carrying out an auto-test of the sensor is provided in such a way that fault identification of at least one electrical connection is implemented.

    Abstract translation: 传感器包括使用电导体彼此电连接的微机械功能部件和电子评估电路。 提供用于执行传感器的自动测试的装置,以便实现至少一个电连接的故障识别。

    Micromechanical sensor having fault identification
    5.
    发明授权
    Micromechanical sensor having fault identification 有权
    具有故障识别的微机械传感器

    公开(公告)号:US07555929B2

    公开(公告)日:2009-07-07

    申请号:US11133834

    申请日:2005-05-19

    CPC classification number: G01P21/00 G01P15/125

    Abstract: A sensor includes a micromechanical functional part and an electronic evaluation circuit which are in electrical connection to each other using electrical conductors. An arrangement for carrying out an auto-test of the sensor is provided in such a way that fault identification of at least one electrical connection is implemented.

    Abstract translation: 传感器包括使用电导体彼此电连接的微机械功能部件和电子评估电路。 提供用于执行传感器的自动测试的装置,以便实现至少一个电连接的故障识别。

    Application specified integrated circuit for use in wavefront detection
    7.
    发明授权
    Application specified integrated circuit for use in wavefront detection 失效
    应用指定用于波前检测的集成电路

    公开(公告)号:US06563947B1

    公开(公告)日:2003-05-13

    申请号:US09459170

    申请日:1999-12-10

    Applicant: Dirk Droste

    Inventor: Dirk Droste

    CPC classification number: G01J9/00

    Abstract: A device for detecting a wavefront that is defined by a plurality of contiguous light beams includes an array of lenslets for isolating the individual light beams and focusing each individual light beam to a focal point in an x-y plane. The device also has a plurality of clusters which are positioned in the x-y plane, and each cluster includes a plurality of pixels that are arranged in rows aligned in an x-direction, and columns aligned in a y-direction. Additionally, each pixel of a cluster includes both a first photocell for generating an x-signal and a second photocell for generating a y-signal, respectively, in response to an illumination of the pixel by a light beam. Further, the device includes circuitry for converting the x and y signals to digital signals and then using the digital signals to determine an x-y position for the focal point of the particular light beam that is incident on the cluster. A computer then compares the respective x-y positions of the various focal points to detect the wavefront. Depending on the particular application of the device, either photodiodes or phototransistors may be selected for use as the photocells in the pixels.

    Abstract translation: 用于检测由多个相邻光束限定的波前的装置包括用于隔离各个光束并将每个单独的光束聚焦到x-y平面中的焦点的小透镜阵列。 该装置还具有定位在x-y平面中的多个簇,并且每个簇包括沿x方向排列成行的多个像素和沿y方向排列的列。 此外,群集的每个像素响应于光束照射像素,分别包括用于产生x信号的第一光电池和用于产生y信号的第二光电管。 此外,该装置包括用于将x和y信号转换成数字信号的电路,然后使用数字信号来确定入射到簇上的特定光束的焦点的x-y位置。 然后计算机比较各个焦点的各个x-y位置以检测波前。 根据器件的具体应用,可以选择光电二极管或光电晶体管用作像素中的光电池。

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