Abstract:
Methods and structures for heterogeneous integration of diverse material systems and device technologies onto a single substrate incorporate layer transfer techniques into an epitaxy level packaging process. A planar substrate surface of multiple epitaxial areas of different materials can be heterogeneously integrated with a substrate material. Complex assembly and lattice engineering is significantly reduced. Microsystems of different circuits made from different materials can be built from a single wafer Fab line employing the claimed processes.
Abstract:
Methods and structures for heterogeneous integration of diverse material systems and device technologies onto a single substrate incorporate layer transfer techniques into an epitaxy level packaging process. A planar substrate surface of multiple epitaxial areas of different materials can be heterogeneously integrated with a substrate material. Complex assembly and lattice engineering is significantly reduced. Microsystems of different circuits made from different materials can be built from a single wafer Fab line employing the claimed processes.
Abstract:
Methods and structures for heterogeneous integration of diverse material systems and device technologies onto a single substrate incorporate layer transfer techniques into an epitaxy level packaging process. A planar substrate surface of multiple epitaxial areas of different materials can be heterogeneously integrated with a substrate material. Complex assembly and lattice engineering is significantly reduced. Microsystems of different circuits made from different materials can be built from a single wafer Fab line employing the claimed processes.
Abstract:
Systems and methods provide techniques to support design specific testing for programmable logic devices in accordance with one or more embodiments. For example in one embodiment, a method of generating configuration data for a programmable logic device includes mapping a design for the programmable logic device, wherein the mapped design incorporates scan test logic; placing and routing the mapped design; and generating configuration data based on the mapped design, wherein the incorporated scan test logic is disabled and not selectable within the programmable logic device configured with the configuration data. The method may further include generating a second configuration data based on the mapped design, wherein the incorporated scan test logic is enabled and selectable within the programmable logic device configured with the second configuration data.
Abstract:
A method of growing an epitaxial film and transferring it to an assembly substrate is disclosed. The film growth and transfer are made using an epitaxy lateral overgrowth technique. The formed epitaxial film on an assembly substrate can be further processed to form devices such as solar cell, light emitting diode, and other devices and assembled into higher integration of desired applications.
Abstract:
An epitaxy-level packaging grows an epitaxial film and transfers it to an assembly substrate. The film growth and transfer are made using an epitaxy lateral overgrowth technique. The formed epitaxial film on an assembly substrate can be further processed to form devices such as solar cell, light emitting diode, and other devices and assembled into higher integration of desired applications.
Abstract:
The invention addresses area utilization and capital efficiency of systems for converting solar energy into electricity. A solid-state solar conversion system includes photovoltaic cells which are arranged within a concentrated solar insolation flux path on different substrates/boards to collect different respective portions of the radiation spectrum.
Abstract:
A biasing system for an FET utilizes a source biasing capacitor which is charged to a positive DC ground voltage relative to RF ground. The gate of the FET is thus biased negative to the source without requiring a negative power supply.
Abstract:
A method of growing an epitaxial film and transferring it to an assembly substrate is disclosed. The film growth and transfer are made using an epitaxy lateral overgrowth technique. The formed epitaxial film on an assembly substrate can be further processed to form devices such as solar cell, light emitting diode, and other devices and assembled into higher integration of desired applications.
Abstract:
A method of growth and transfer of epitaxial structures from semiconductor crystalline substrate(s) to an assembly substrate. Using this method, the assembly substrate encloses one or more semiconductor materials and defines a wafer size that is equal to or larger than the semiconductor crystalline substrate for further wafer processing. The process also provides a unique platform for heterogeneous integration of diverse material systems and device technologies onto one single substrate.