Achromatic gradient index singlet lens
    1.
    发明授权
    Achromatic gradient index singlet lens 有权
    消色差梯度折射率单晶透镜

    公开(公告)号:US08659834B2

    公开(公告)日:2014-02-25

    申请号:US13493439

    申请日:2012-06-11

    IPC分类号: G02B3/00

    摘要: A method of making an achromatic gradient index singlet lens comprising utilizing a gradient index material with a curved front surface in which light does not follow a straight line as it travels through the material and wherein different color rays traverse different curved paths, utilizing the natural dispersion of the curved front surface as a strong positive lens, and developing a weakly diverging GRIN distribution within the lens to balance the chromatic aberrations of the curved front surface.

    摘要翻译: 一种制造消色差梯度折射率单透镜的方法,包括利用具有弯曲前表面的梯度折射率材料,其中光在其穿过材料时不遵循直线,并且其中不同的彩色光线穿过不同的弯曲路径,利用天然分散体 的弯曲前表面作为强正透镜,并且在透镜内展开弱发散的GRIN分布以平衡弯曲前表面的色差。

    Scene independent method for image formation in lenslet array imagers
    2.
    发明授权
    Scene independent method for image formation in lenslet array imagers 失效
    用于在小透镜阵列成像器中形成图像的场景独立方法

    公开(公告)号:US08462179B2

    公开(公告)日:2013-06-11

    申请号:US12505851

    申请日:2009-07-20

    IPC分类号: G09G5/00

    摘要: A method and system is provided for performing high-resolution image assembly regardless of observed scene content. An imaging system, including a focal plane array and lenslet array can be calibrated to account for subimage shifts. A calibration module can determine the subimage shifts by calculating an average point source position reference point coordinates for each of the subimages, and then determining the difference between the average point source position and the reference point coordinates for each subimage. The imaging system can then be calibrated utilizing the subimage shifts for each of the plurality of subimages. Finally, an assembly module can perform a high-resolution image assembly with the calibrated imaging system.

    摘要翻译: 提供了用于执行高分辨率图像组合的方法和系统,而不管观察到的场景内容如何。 可以校准包括焦平面阵列和小透镜阵列的成像系统以考虑子图像偏移。 校准模块可以通过计算每个子图像的平均点源位置参考点坐标来确定子图像偏移,然后确定每个子图像的平均点源位置和参考点坐标之间的差。 然后可以利用多个子图像中的每一个的子图像偏移校准成像系统。 最后,组装模块可以使用校准的成像系统执行高分辨率图像组合。

    Scene Independent Method for Image Formation in Lenslet Array Imagers
    3.
    发明申请
    Scene Independent Method for Image Formation in Lenslet Array Imagers 失效
    镜头阵列成像仪中图像形成的场景独立方法

    公开(公告)号:US20100013857A1

    公开(公告)日:2010-01-21

    申请号:US12505851

    申请日:2009-07-20

    IPC分类号: G09G5/00

    摘要: A method and system is provided for performing high-resolution image assembly regardless of observed scene content. An imaging system, including a focal plane array and lenslet array can be calibrated to account for subimage shifts. A calibration module can determine the subimage shifts by calculating an average point source position reference point coordinates for each of the subimages, and then determining the difference between the average point source position and the reference point coordinates for each subimage. The imaging system can then be calibrated utilizing the subimage shifts for each of the plurality of subimages. Finally, an assembly module can perform a high-resolution image assembly with the calibrated imaging system.

    摘要翻译: 提供了用于执行高分辨率图像组合的方法和系统,而不管观察到的场景内容如何。 可以校准包括焦平面阵列和小透镜阵列的成像系统以考虑子图像偏移。 校准模块可以通过计算每个子图像的平均点源位置参考点坐标来确定子图像偏移,然后确定每个子图像的平均点源位置和参考点坐标之间的差。 然后可以利用多个子图像中的每一个的子图像偏移校准成像系统。 最后,组装模块可以使用校准的成像系统执行高分辨率图像组合。

    APPLICATIONS OF SEMICONDUCTOR NANO-SIZED PARTICLES FOR PHOTOLITHOGRAPHY
    4.
    发明申请
    APPLICATIONS OF SEMICONDUCTOR NANO-SIZED PARTICLES FOR PHOTOLITHOGRAPHY 审中-公开
    半导体纳米尺寸颗粒的应用于光刻机

    公开(公告)号:US20090239161A1

    公开(公告)日:2009-09-24

    申请号:US12415013

    申请日:2009-03-31

    IPC分类号: G03F1/00

    摘要: Semiconductor nano-sized particles possess unique optical properties, which make them ideal candidates for various applications in the UV photolithography. In this patent several such applications, including using semiconductor nano-sized particles or semiconductor nano-sized particle containing materials as highly refractive medium in immersion lithography, as anti-reflection coating in optics, as pellicle in lithography and as sensitizer in UV photoresists are described.

    摘要翻译: 半导体纳米尺寸颗粒具有独特的光学性质,使其成为UV光刻技术中各种应用的理想选择。 在该专利中,描述了包括在浸没式光刻中使用半导体纳米尺寸颗粒或含半导体纳米尺寸颗粒的材料作为高折射介质的几种这样的应用,作为光学中的抗反射涂层,光刻中的防护薄膜和UV光致抗蚀剂中的敏化剂 。

    Applications of semiconductor nano-sized particles for photolithography
    7.
    发明授权
    Applications of semiconductor nano-sized particles for photolithography 失效
    半导体纳米粒子用于光刻的应用

    公开(公告)号:US07524616B2

    公开(公告)日:2009-04-28

    申请号:US10792377

    申请日:2004-03-04

    IPC分类号: G03F7/26 G03F7/20

    摘要: Semiconductor nano-sized particles possess unique optical properties, which make them ideal candidates for various applications in the UV photolithography. In this patent several such applications, including using semiconductor nano-sized particles or semiconductor nano-sized particle containing materials as highly refractive medium in immersion lithography, as anti-reflection coating in optics, as pellicle in lithography and as sensitizer in UV photoresists are described.

    摘要翻译: 半导体纳米尺寸颗粒具有独特的光学性质,使其成为UV光刻技术中各种应用的理想选择。 在该专利中,描述了包括在浸没式光刻中使用半导体纳米尺寸颗粒或含半导体纳米尺寸颗粒的材料作为高折射介质的几种这样的应用,作为光学中的抗反射涂层,光刻中的防护薄膜和UV光致抗蚀剂中的敏化剂 。

    Achromatic Gradient Index Singlet Lens
    10.
    发明申请
    Achromatic Gradient Index Singlet Lens 有权
    消色差梯度指数单晶透镜

    公开(公告)号:US20130003186A1

    公开(公告)日:2013-01-03

    申请号:US13493439

    申请日:2012-06-11

    IPC分类号: G02B3/00 B29D11/00

    摘要: A method of making an achromatic gradient index singlet lens comprising utilizing a gradient index material with a curved front surface in which light does not follow a straight line as it travels through the material and wherein different color rays traverse different curved paths, utilizing the natural dispersion of the curved front surface as a strong positive lens, and developing a weakly diverging GRIN distribution within the lens to balance the chromatic aberrations of the curved front surface.

    摘要翻译: 一种制造消色差梯度折射率单透镜的方法,包括利用具有弯曲前表面的梯度折射率材料,其中光在其穿过材料时不遵循直线,并且其中不同的彩色光线穿过不同的弯曲路径,利用天然分散体 的弯曲前表面作为强正透镜,并且在透镜内展开弱发散的GRIN分布以平衡弯曲前表面的色差。