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33 条记录 (耗时 0.022 秒)

    DRIVE CONTROL CIRCUIT, EMISSION CONTROL CIRCUIT, COMMUNICATION APPARATUS AND DRIVE CONTROL METHOD
    3.
    发明申请
    DRIVE CONTROL CIRCUIT, EMISSION CONTROL CIRCUIT, COMMUNICATION APPARATUS AND DRIVE CONTROL METHOD 审中-公开
    驱动控制电路，排放控制电路，通讯装置和驱动控制方法

    公开(公告)号：US20090096382A1

    公开(公告)日：2009-04-16

    申请号：US12335277

    申请日：2008-12-15

    申请人： Isao YAMAMOTO ,  Tomoyuki ITO ,  Hiroyuki IWAKI

    发明人： Isao YAMAMOTO ,  Tomoyuki ITO ,  Hiroyuki IWAKI

    IPC分类号： H05B41/30

    CPC分类号： H05B33/0866 ,  H04M1/22 ,  H05B33/0818 ,  H05B33/0857 ,  Y02B20/346

    摘要： A drive control circuit sends out pulse signals of various pulse signals so as to control the light emission amount and luminance of LEDs by gradually increasing and decreasing the pulse width in predetermined cycles during predetermined periods based on parameters supplied from an LED drive controller that determine a first emission control processing period, a second emission control processing period, first to fourth slope periods and the like. The tone of an emitted color realized by a plurality of LEDs is controlled by synchronizing the periods of time of light emission control processings.

    摘要翻译： 驱动控制电路发出各种脉冲信号的脉冲信号，以便根据从LED驱动控制器提供的参数来逐步增加和减少预定周期内的脉冲宽度来控制LED的发光量和亮度。 第一发光控制处理期间，第二发光控制处理期间，第一至第四斜坡期间等。 通过使发光控制处理的时间段同步来控制由多个LED实现的发射色调的色调。

    Column A/D converter, column A/D conversion method, solid-state imaging element and camera system
    6.
    发明授权
    Column A/D converter, column A/D conversion method, solid-state imaging element and camera system 有权
    列A / D转换器，列A / D转换方法，固态成像元件和相机系统

    公开(公告)号：US09019138B2

    公开(公告)日：2015-04-28

    申请号：US13637870

    申请日：2011-04-22

    申请人： Hiroyuki Iwaki

    发明人： Hiroyuki Iwaki

    IPC分类号： H04N5/378 ,  H03M1/56 ,  H03M1/08 ,  H04N5/376

    CPC分类号： H04N5/3765 ,  H03M1/002 ,  H03M1/0872 ,  H03M1/36 ,  H03M1/56 ,  H03M7/16 ,  H04N5/378

    摘要： A solid-state imaging device having an analog-digital converter, and an analog-digital conversion method are described herein. An example of a solid-state imaging device includes a column processing section that includes a low-level bit latching section. The low-level bit latching section receives a comparator output from a comparator and a count output from a counter, and the low-level bit latching section latches a count value.

    摘要翻译： 本文描述了具有模拟数字转换器和模数转换方法的固态成像装置。 固态成像装置的示例包括列处理部分，其包括低级位锁存部分。 低电平位锁存部分接收比较器的比较器输出和从计数器输出的计数，而低电平位锁存部分锁存计数值。

    Method of cutting object to be processed
    7.
    发明授权
    Method of cutting object to be processed 有权
    切割待处理物体的方法

    公开(公告)号：US08816245B2

    公开(公告)日：2014-08-26

    申请号：US13107056

    申请日：2011-05-13

    申请人： Hiroyuki Iwaki ,  Takafumi Ogiwara ,  Takeshi Sakamoto ,  Masaharu Hoshikawa ,  Kazuhiro Atsumi ,  Daisuke Kawaguchi

    发明人： Hiroyuki Iwaki ,  Takafumi Ogiwara ,  Takeshi Sakamoto ,  Masaharu Hoshikawa ,  Kazuhiro Atsumi ,  Daisuke Kawaguchi

    IPC分类号： B23K26/40

    CPC分类号： B23K26/40 ,  B23K26/53 ,  B23K2103/50

    摘要： A method of cutting an object to be processed comprises the steps of irradiating an object to be processed with a laser light which is an elliptically-polarized light having an ellipticity other than 1 such that a direction of polarization of the laser light intersects a line to cut the object and a thickness direction of the object, while locating a converging point of the laser light within the object, so as to form a modified region within the object along the line and generate a fracture from the modified region in the thickness direction of the object, and causing the fracture to reach front and rear faces of the object so as to cut the object along the line.

    摘要翻译： 切割待处理物体的方法包括以下步骤：用激光照射被处理物体，所述激光是椭圆偏振光以外的椭圆偏振光以外的激光，使得激光的偏振方向与 切割物体和物体的厚度方向，同时将激光的会聚点定位在物体内，以沿着线形成在物体内的改质区域，并从该改质区域在厚度方向上产生断裂 并且使裂缝到达物体的前后面以沿着该线切割物体。

    Solid-state imaging device, method of driving the device, and camera system
    8.
    发明申请
    Solid-state imaging device, method of driving the device, and camera system 有权
    固态成像装置，驱动装置的方法和相机系统

    公开(公告)号：US20110115959A1

    公开(公告)日：2011-05-19

    申请号：US12923915

    申请日：2010-10-14

    申请人： Takayuki Toyama ,  Hiroyuki Iwaki

    发明人： Takayuki Toyama ,  Hiroyuki Iwaki

    IPC分类号： H04N5/335

    CPC分类号： H04N5/378 ,  H04N5/335 ,  H04N5/374

    摘要： A solid-state imaging device includes: a pixel section formed by pixels performing photoelectric conversion arranged in a matrix; a pixel signal readout section capable of column-parallel processing including an A/D conversion function for reading out a pixel signal from the pixel section and performing analog-digital conversion of the signal, the pixels being read in groups; a voltage sampling section sampling a bias voltage generated by an internal or external voltage generating circuit for a period in accordance with a control signal and supplying the sampled bias voltage to the pixel signal readout section; and a control section controlling the signal readout operation of the pixel signal readout section and the voltage sampling operation of the voltage sampling section. The pixel signal readout section includes a functional portion. The control section exercises control such that the voltage sampling operation is performed in a period other than at least either of a period in which an analog signal is read out or in which A/D conversion is carried out.

    摘要翻译： 固态成像装置包括：由以矩阵形式布置的执行光电转换的像素形成的像素部分; 能够进行列并行处理的像素信号读出部，其包括用于从像素部读出像素信号的A / D转换功能，并进行信号的模拟数字转换，所述像素被分组读取; 电压采样部分，根据控制信号对由内部或外部电压产生电路产生的偏置电压进行一段时间的采样，并将采样的偏置电压提供给像素信号读出部分; 以及控制部分，控制像素信号读出部分的信号读出操作和电压采样部分的电压采样操作。 像素信号读出部包括功能部。 控制部进行控制，使得在除了读出模拟信号的周期或执行A / D转换的周期之外的时段中执行电压采样操作。

    Abnormal circuit operation detection system
    9.
    发明授权
    Abnormal circuit operation detection system 有权
    电路运行异常检测系统

    公开(公告)号：US07796050B2

    公开(公告)日：2010-09-14

    申请号：US11207831

    申请日：2005-08-22

    申请人： Takanori Yasui ,  Masato Hashizume ,  Yoshihisa Ikeda ,  Chikashi Hashimoto ,  Hiroyuki Iwaki

    发明人： Takanori Yasui ,  Masato Hashizume ,  Yoshihisa Ikeda ,  Chikashi Hashimoto ,  Hiroyuki Iwaki

    IPC分类号： G08B21/00

    CPC分类号： G01R31/3004

    摘要： An abnormality in operation is detected by meticulously monitoring the operation of a monitored device that comprises a state machine. The state number, indicating the state the monitored device is currently in, is output from the device. The upper and lower limit values of current consumption is set for each state number. A monitoring circuit, using the upper and lower limit values for the present state number, judges the value of current consumption detected by a current detection circuit and detects whether there is abnormality in operation.

    摘要翻译： 通过认真监视包括状态机的被监视设备的操作来检测操作异常。 指示被监视设备当前处于的状态的状态号从设备输出。 电流消耗的上下限值为每个状态数设定。 使用当前状态数的上限值和下限值的监视电路，判断由电流检测电路检测出的电流消耗的值，并检测是否存在操作异常。