Lithographic apparatus and device manufacturing method
    1.
    发明申请
    Lithographic apparatus and device manufacturing method 有权
    平版印刷设备和器件制造方法

    公开(公告)号:US20070046920A1

    公开(公告)日:2007-03-01

    申请号:US11209032

    申请日:2005-08-23

    CPC classification number: G03F7/70941 G03F7/70533 G03F7/70625

    Abstract: A lithographic apparatus having a controller that sets at lest one system parameter such that the difference between the critical dimension of pattern features formed on the substrate in regions of relatively high and relatively low pattern feature density is minimised for an area on the substrate on which a patterned beam of radiation is to be projected and which re-sets the at least one system parameter between a projection of the patterned radiation beam onto two areas of the substrate.

    Abstract translation: 一种光刻设备,其具有控制器,该控制器设置至少一个系统参数,使得在基板上形成的图案特征的相对高度和相对低图案特征密度区域中的图案特征的临界尺寸之间的差最小化, 图案化的辐射束将被投影,并且将图案化的辐射束的投影重新设置在衬底的两个区域上的至少一个系统参数。

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