Method for estimating the early failure rate of semiconductor devices
    1.
    发明申请
    Method for estimating the early failure rate of semiconductor devices 有权
    估算半导体器件早期故障率的方法

    公开(公告)号:US20060107094A1

    公开(公告)日:2006-05-18

    申请号:US10982348

    申请日:2004-11-03

    IPC分类号: G06F11/00

    CPC分类号: G06F11/008 G06F11/24

    摘要: According to one embodiment of the invention, a method for estimating the failure rate of semiconductor devices includes obtaining accelerated stress duration data for a plurality of semiconductor devices, determining which of the semiconductor devices fail, classifying the defects for the failed semiconductor devices, determining a distribution model for the accelerated stress duration data, determining a set of parameters for the distribution model, determining a relative proportion of each defect classification to the total number of defect classifications, determining temperature and voltage acceleration factors for each defect classification, identifying actual operating conditions for the semiconductor devices, comparing the actual operating conditions for the semiconductor device with the distribution model, and determining a defect ratio for the semiconductor devices at the actual operating conditions for a predetermined time period based on the comparison.

    摘要翻译: 根据本发明的一个实施例,一种用于估计半导体器件的故障率的方法包括:获得用于多个半导体器件的加速应力持续时间数据,确定半导体器件中的哪一个失效,分类故障半导体器件的缺陷,确定 加速应力持续时间数据的分布模型,确定分布模型的一组参数,确定每个缺陷分类与缺陷分类总数的相对比例,确定每个缺陷分类的温度和电压加速因子,识别实际操作条件 对于半导体器件,将半导体器件的实际工作条件与分布模型进行比较,并且基于该比较,在实际工作条件下确定预定时间段内的半导体器件的缺陷率。

    COMPOSITION AND METHODS FOR THE DETECTION OF CRIPTO-3
    3.
    发明申请
    COMPOSITION AND METHODS FOR THE DETECTION OF CRIPTO-3 审中-公开
    用于检测CRIPTO-3的组合物和方法

    公开(公告)号:US20100041032A1

    公开(公告)日:2010-02-18

    申请号:US12298875

    申请日:2007-04-30

    摘要: The present invention is based, at least in part, on the discovery that the pseudogene TDGF3 (Cripto-3) is expressed in cells and, in particular, that TDGF3 overexpression is associated with transformation of a cell, e.g., TDGF3 is overexpressed in cancer cell lines and cells from tumor tissue. Accordingly, the invention provides compositions, kits, and methods for detecting the presence of a TDGF3 polynucleotide or polypeptide in a sample. The invention further provides compositions, kits and methods for assessing whether a cell is transformed as well as for assessing whether a patient is a suitable candidate for an anti-Cripto antibody therapy.

    摘要翻译: 本发明至少部分地基于在细胞中表达假性TDGF3(Cripto-3)的发现,特别是TDGF3过表达与细胞的转化相关,例如TDGF3在癌症中过表达 来自肿瘤组织的细胞系和细胞。 因此,本发明提供用于检测样品中TDGF3多核苷酸或多肽的存在的组合物,试剂盒和方法。 本发明还提供用于评估细胞是否被转化以及评估患者是否是抗Cripto抗体治疗的合适候选者的组合物,试剂盒和方法。