GENERATING WORST CASE BIT PATTERNS FOR SIMULTANEOUS SWITCHING NOISE (SSN) IN DIGITAL SYSTEMS
    1.
    发明申请
    GENERATING WORST CASE BIT PATTERNS FOR SIMULTANEOUS SWITCHING NOISE (SSN) IN DIGITAL SYSTEMS 审中-公开
    为数字系统中的同时切换噪声(SSN)生成最差的案例位图

    公开(公告)号:US20100017158A1

    公开(公告)日:2010-01-21

    申请号:US12176811

    申请日:2008-07-21

    CPC classification number: G01R31/318385 G01R31/318307

    Abstract: A methodology to determine a bit pattern that may excite a worse case or near worse case simultaneous switching noise on a memory or input/output (IO) interface of a digital system is provided. This methodology involves determining an impedance profile of the IO interface of the digital system. The amplitude response of signal X(f) may be matched in the impedance profile of the IO interface. The phase response of the signal X(f) is also set. The signal X(f) having a matched amplitude response may be converted from a frequency domain signal to a time domain signal to produce a signal X(t). Signal X(t) the time domain signal X(t) may be digitized to represent a bit stream B(t). This bit stream may be used as a switching pattern to determine simultaneous switching noise of the IO interface of the digital system

    Abstract translation: 提供了一种确定可能激发更糟糕情况或接近较差情况的位模式的方法,用于在数字系统的存储器或输入/输出(IO)接口上同时切换噪声。 该方法涉及确定数字系统的IO接口的阻抗曲线。 信号X(f)的振幅响应可以在IO接口的阻抗曲线上匹配。 信号X(f)的相位响应也被设定。 具有匹配振幅响应的信号X(f)可以从频域信号转换为时域信号以产生信号X(t)。 时域信号X(t)的信号X(t)可以被数字化以表示比特流B(t)。 该比特流可以用作切换模式以确定数字系统的IO接口的同时切换噪声

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