D. c. Charged particle accelerator, a method of accelerating charged particles using d. c. voltages and a high voltage power supply apparatus for use therewith
    1.
    发明授权
    D. c. Charged particle accelerator, a method of accelerating charged particles using d. c. voltages and a high voltage power supply apparatus for use therewith 有权
    D. c。 带电粒子加速器,使用d加速带电粒子的方法。 C。 电压和与其一起使用的高压电源装置

    公开(公告)号:US08558486B2

    公开(公告)日:2013-10-15

    申请号:US12962723

    申请日:2010-12-08

    IPC分类号: H05H7/22 H02K16/00

    摘要: A d.c. charged particle accelerator comprises accelerator electrodes separated by insulating spacers defining acceleration gaps between adjacent pairs of electrodes. Individually regulated gap voltages are applied across each adjacent pair of accelerator electrodes. In embodiments, the individually regulated gap voltages are generated by electrically isolated alternators mounted on a common rotor shaft driven by an electric motor. Alternating power outputs from the alternators provide inputs to individual regulated d.c. power supplies to generate the gap voltages. The power supplies are electrically isolated and have outputs connected in series across successive pairs of accelerator electrodes. The described embodiment enables an ion beam to be accelerated to high energies and high beam currents, with good accelerator stability.

    摘要翻译: 一个d.c. 带电粒子加速器包括通过绝缘垫片间隔开的加速器电极,其限定相邻电极对之间的加速间隙。 单独调节的间隙电压施加在每个相邻的加速器电极对之间。 在实施例中,单独调节的间隙电压由安装在由电动机驱动的公共转子轴上的电隔离交流发电机产生。 交流发电机的交流电源输出为各个调节直流电源提供输入。 电源产生间隙电压。 电源是电隔离的,并且具有串联连接成对的加速器电极的输出。 所描述的实施例使得能够将离子束加速到高能量和高束流,具有良好的加速器稳定性。

    Ion Source and a Method of Generating an Ion Beam Using an Ion Source
    4.
    发明申请
    Ion Source and a Method of Generating an Ion Beam Using an Ion Source 有权
    离子源和使用离子源产生离子束的方法

    公开(公告)号:US20120104273A1

    公开(公告)日:2012-05-03

    申请号:US12917510

    申请日:2010-11-02

    IPC分类号: H01J27/00

    摘要: Multiple control electrodes are provided asymmetrically within the plasma chamber of an ion source at respective positions along the length of the plasma chamber. Biasing the control electrodes selectively can selectively enhance the ion extraction current at adjacent positions along the length of the extraction slit. A method of generating an ion beam is disclosed in which the strengths of the transverse electric fields at different locations along the length of the plasma chamber are controlled to modify the ion beam linear current density profile along the length of the slit. The method is used for controlling the uniformity of a ribbon beam.

    摘要翻译: 多个控制电极在离子源的等离子体室内沿着等离子体室的长度的各个位置处非对称地设置。 选择性地偏压控制电极可以选择性地提高沿着提取狭缝的长度的相邻位置处的离子提取电流。 公开了一种产生离子束的方法,其中控制沿着等离子体室的长度的不同位置处的横向电场的强度,以沿着狭缝的长度修改离子束线性电流密度分布。 该方法用于控制带束束的均匀性。

    Ion source and a method of generating an ion beam using an ion source
    6.
    发明授权
    Ion source and a method of generating an ion beam using an ion source 有权
    离子源和使用离子源产生离子束的方法

    公开(公告)号:US08324592B2

    公开(公告)日:2012-12-04

    申请号:US12917510

    申请日:2010-11-02

    IPC分类号: H01J27/00 H01J27/02 H01J27/04

    摘要: Multiple control electrodes are provided asymmetrically within the plasma chamber of an ion source at respective positions along the length of the plasma chamber. Biasing the control electrodes selectively can selectively enhance the ion extraction current at adjacent positions along the length of the extraction slit. A method of generating an ion beam is disclosed in which the strengths of the transverse electric fields at different locations along the length of the plasma chamber are controlled to modify the ion beam linear current density profile along the length of the slit. The method is used for controlling the uniformity of a ribbon beam.

    摘要翻译: 多个控制电极在离子源的等离子体室内沿着等离子体室的长度的各个位置处非对称地设置。 选择性地偏压控制电极可以选择性地提高沿着提取狭缝的长度的相邻位置处的离子提取电流。 公开了一种产生离子束的方法,其中控制沿着等离子体室的长度的不同位置处的横向电场的强度,以沿着狭缝的长度修改离子束线性电流密度分布。 该方法用于控制带束束的均匀性。

    Substrate scanner apparatus
    7.
    发明授权
    Substrate scanner apparatus 有权
    基板扫描仪装置

    公开(公告)号:US07994486B2

    公开(公告)日:2011-08-09

    申请号:US11589312

    申请日:2006-10-30

    IPC分类号: G01J1/00

    摘要: This invention relates to an apparatus for scanning substrates through an ion beam in the process chamber of an ion implanter. The apparatus comprises a substrate carriage and reaction mass carriage movably mounted to a fixed base. The substrate carriage is adapted to support a substrate holder. Movement of the substrate carriage results in movement of the substrate holder, and substrate mounted therein, through the ion beam. The reaction mass carriage moves in the opposite direction to the substrate carriage to counter any reaction forces exerted on the fixed base as a result of acceleration of the substrate carriage.

    摘要翻译: 本发明涉及一种用于通过离子注入机的处理室中的离子束扫描基板的装置。 该装置包括可移动地安装到固定基座的基底托架和反作用物质托架。 衬底托架适于支撑衬底保持器。 衬底托架的移动导致衬底保持器和其中安装的衬底通过离子束的移动。 反作用物质托架在与基板托架相反的方向上移动,以抵抗由于基板托架的加速而施加在固定基座上的任何反作用力。

    Substrate scanner apparatus
    10.
    发明申请
    Substrate scanner apparatus 有权
    基板扫描仪装置

    公开(公告)号:US20080141802A1

    公开(公告)日:2008-06-19

    申请号:US11589312

    申请日:2006-10-30

    IPC分类号: F16H21/00

    摘要: This invention relates to an apparatus for scanning substrates through an ion beam in the process chamber of an ion implanter. The apparatus comprises a substrate carriage and reaction mass carriage movably mounted to a fixed base. The substrate carriage is adapted to support a substrate holder. Movement of the substrate carriage results in movement of the substrate holder, and substrate mounted therein, through the ion beam. The reaction mass carriage moves in the opposite direction to the substrate carriage to counter any reaction forces exerted on the fixed base as a result of acceleration of the substrate carriage.

    摘要翻译: 本发明涉及一种用于通过离子注入机的处理室中的离子束扫描基板的装置。 该装置包括可移动地安装到固定基座的基底托架和反作用物质托架。 衬底托架适于支撑衬底保持器。 衬底托架的移动导致衬底保持器和其中安装的衬底通过离子束的移动。 反作用物质托架在与基板托架相反的方向上移动,以抵抗由于基板托架的加速而施加在固定基座上的任何反作用力。