摘要:
A semiconductor memory device includes a memory cell array, a repair control circuit and a refresh control circuit. The memory cell array includes a plurality of memory cells and a plurality of redundancy memory cells. The repair control circuit receives a repair command and performs a repair operation on a first defective memory cell among the plurality of memory cells during a repair mode. The semiconductor memory device may operate in a repair mode in response to the repair command. The refresh control circuit performs a refresh operation on non-defective ones of the plurality of memory cells during the repair mode.
摘要:
The present invention discloses a semiconductor memory device that includes first and second memory banks. A first control signal generating circuit generates a first control signal responsive to an external clock. A first data output circuit transmits a first output data responsive to the first control signal. An internal clock signal generating circuit outputs first and second buffered clock signals responsive to the external clock. A second control signal generating circuit generates a second control signal responsive to the first buffered clock signal and the first control signal. A second data output circuit transmits a second output data responsive to the second control signal. A third data output circuit transmits a third output data responsive to the first and second buffered clock signals. The present invention prevents data read errors resulting from variations in power supply voltage and temperature.
摘要:
Delay line circuits and methods include a series of unit delay cells, a respective one of which includes an input and an output that are sequentially connected such that an output of a preceding unit delay cell is connected to an input of a succeeding unit delay cell. At least two of the unit delay cells in the series are sequentially activated in response to an activation signal. The sequential activation may be performed by a control circuit that is connected to the series of unit delay cells.
摘要:
Provided are a system for integrated analysis of a real-time polymerase chain reaction and a DNA chip and a method for integrated analysis using the same, and more particularly to an apparatus for integrated analysis of a real-time polymerase chain reaction and a DNA chip and a method for integrated analysis using the same. According to the method for integrated analysis of a biomaterial of the present invention, gene amplification proceeds and subsequently hybridization proceeds in a single reactor, thereby preventing contamination of the sample due to external factors, which may be caused while the sample is transferred for reaction, and automating a series of procedures such as injection of the sample, reaction of the biomaterial, and detection and analysis of results.
摘要:
Provided is a biomaterial detecting device for confirming or detecting a biomaterial reaction, and more particularly to a biomaterial detecting device, which is formed in a stick type to thereby be immersed in a tube containing a biomaterial solution to be tested; has an upper portion with a cap structure to thereby induce reaction with a biomaterial, and thus facilitate confirmation and detection of the biomaterial; and is formed in a cap structure to thereby prevent evaporation of a sample and infiltration of an external material at the time of a biomaterial reaction in the tube, and thus improve reliability in analysis.
摘要:
Provided is a bio-reaction device chip for confirming or detecting a biomaterial reaction, and more particularly, is a bio-reaction device chip, where a plurality of wells are formed in the plate to contain biomaterials to be tested, thereby simultaneously analyzing various targets, and the well is formed to have a structure of two or more steps such that the sample to be tested is contained in the lower well and a protective layer for protecting the sample, such as oil, is contained in the upper well, thereby preventing evaporation of the sample due to heating at the time of the biomaterial reaction, and thus, improving reliability in analysis.
摘要:
Semiconductor memory devices include a memory cell array region having a plurality of memory cells, a local data I/O line pair that is electrically connected to the plurality of memory cells, a local sense amplifier that is electrically connected to the local data I/O line pair, a read global data I/O line pair that is electrically connected to the local sense amplifier and that is configured to transmit data during a read operation and a write global data I/O line pair that is electrically connected to the local sense amplifier that is configured to transmit data during a write operation.
摘要:
Provided are a buffer circuit and a memory system for selectively outputting a data strobe signal according to the number of data bits. The buffer circuit includes a first buffer unit, a second buffer unit, and a third buffer unit. The first buffer unit amplifies and outputs a first signal. The second buffer unit amplifies and outputs a second signal or outputs the first signal according to the logic level of a control signal. The third buffer unit amplifies the first signal to send or not to send the amplified first signal to the second buffer unit depending on the logic level of an inverted control signal. The logic levels of the control signal and the inverted control signal are determined according to the number of processed data bits. When the number of processed data bits is n, the control signal is set to a first level and the inverted control signal is set to a second level, and when the number of processed data bits is k, the control signal is set to a second level and the inverted control signal is set to a first level. Since the buffer circuit and the memory system selectively output the data strobe signal according to the number of data bits, a point of time when the data are latched can be advanced and a setup/hold time of the data can be reduced.
摘要:
For selecting anti-fuses in a semiconductor memory device, a decoder block may be enabled to receive selection information for selecting the anti-fuses. The selection information is decoded in the decoder block to select at least one of the anti-fuses. Target operation is performed on the selected anti-fuses. The decoder block is disabled.
摘要:
Embodiments feature a sensor including a nanostructure and methods for manufacturing the same. In some embodiments, a sensor includes a substrate, a first electrode disposed on the substrate, and a second electrode disposed on the substrate. The second electrode is spaced apart from the first electrode and surrounding the first electrode. The sensor includes at least one nanostructure contacting the first electrode and the second electrode, in which the nanostructure is configured to vary an electrical characteristic according to an object to be sensed.