摘要:
A FET for driving an electric motor includes a source electrode. The source electrode has main electrode surfaces to which bonding wires, through which a drive current for an electric motor passes, are joined, and inspection electrode surfaces that are arranged so as to be independent of and apart from the main electrode surfaces. The inspection electrode surfaces are provided so as to contact a probe of an inspection device that performs an inspection of the FET 3.
摘要:
A laser scanning microscope provided with a laser light source, an illuminating optical system for condensing the light from the laser light source to form a light spot on a specimen, a scanning device for causing relative movement of the light spot with respect to the specimen, a photodetector for measuring the amount of light transmitted or reflected by the specimen, and an optical system with positive refraction power for guiding the light beam, transmitted or reflected by the specimen, to the light-receiving plane of the photodetector, wherein the photodetector is composed of a two-dimensional image sensor provided in a position displaced from the conjugate point of the light spot by such an amount that the light beam forms a far-field diffraction pattern of the specimen on the light-receiving plane of the photodetector.
摘要:
A FET for driving an electric motor includes a source electrode. The source electrode has main electrode surfaces to which bonding wires, through which a drive current for an electric motor passes, are joined, and inspection electrode surfaces that are arranged so as to be independent of and apart from the main electrode surfaces. The inspection electrode surfaces are provided so as to contact a probe of an inspection device that performs an inspection of the FET 3.
摘要:
A confocal microscope with improved light use efficiency is provided. Thus, the confocal microscope has a section which concentrates illumination light to a target point of a specimen and non-target points adjacent thereto for simultaneous illumination; a section which receives light entering into a light reception portion conjugated with the target point, without distinguishing light emitted from the target point and light emitted from the non-target points, and outputs a light reception signal according to the intensity of the light; a section which changes the number of non-target points and successively captures the light reception signals before and after the change in the number of the target points; and a section which generates a confocal signal according to intensity of light emitted from the target point, based on a relationship between the captured light reception signals and the number of non-target points.
摘要:
A confocal microscope with improved light use efficiency is provided. Thus, the confocal microscope has a section which concentrates illumination light to a target point of a specimen and non-target points adjacent thereto for simultaneous illumination; a section which receives light entering into a light reception portion conjugated with the target point, without distinguishing light emitted from the target point and light emitted from the non-target points, and outputs a light reception signal according to the intensity of the light; a section which changes the number of non-target points and successively captures the light reception signals before and after the change in the number of the target points; and a section which generates a confocal signal according to intensity of light emitted from the target point, based on a relationship between the captured light reception signals and the number of non-target points.
摘要:
A method and apparatus for measuring a wave front aberration of a projection lens with high precision and a related calibration method. The apparatus includes: either a light source and an element producing a first point source in combination with the light source or a first point source generating part; a magnifying projection optical system projecting and magnifying a point image of the first point source projected by a test object; a detector detecting the magnified point image projected and magnified by the magnifying projection optical system; a supporting member supporting the magnifying projection optical system and the detector; a calculating part calculating a wave front aberration; and either a second point source producing element or a second point source generating part.