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公开(公告)号:US08389331B2
公开(公告)日:2013-03-05
申请号:US13593549
申请日:2012-08-24
申请人: Tyler Mueller , Geoffrey Batchelder , Ralph B. Danzl , Paul F. Gerrish , Anna J. Malin , Trevor D. Marrott , Michael F. Mattes
发明人: Tyler Mueller , Geoffrey Batchelder , Ralph B. Danzl , Paul F. Gerrish , Anna J. Malin , Trevor D. Marrott , Michael F. Mattes
IPC分类号: H01L21/00
CPC分类号: H05K1/144 , H01L23/3107 , H01L23/3185 , H01L23/564 , H01L24/05 , H01L24/06 , H01L24/80 , H01L24/81 , H01L24/94 , H01L25/0657 , H01L2224/0401 , H01L2224/05541 , H01L2224/0556 , H01L2224/05599 , H01L2224/16 , H01L2224/818 , H01L2224/81894 , H01L2224/83894 , H01L2225/06513 , H01L2924/00014 , H01L2924/0002 , H01L2924/01013 , H01L2924/01014 , H01L2924/01022 , H01L2924/01029 , H01L2924/01032 , H01L2924/01033 , H01L2924/0105 , H01L2924/01074 , H01L2924/01079 , H01L2924/01082 , H01L2924/014 , H01L2924/12042 , H01L2924/14 , H01L2924/15788 , H01L2924/19041 , H01L2924/3025 , H05K1/0298 , H05K1/11 , H05K2201/041 , Y10T29/49117 , Y10T29/49147 , H01L2224/05552 , H01L2924/00
摘要: Apparatus and methods to protect circuitry from moisture ingress, e.g., using a metallic structure as part of a moisture ingress barrier.
摘要翻译: 保护电路免受水分侵入的装置和方法,例如使用金属结构作为湿气入口屏障的一部分。
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公开(公告)号:US08072056B2
公开(公告)日:2011-12-06
申请号:US12569504
申请日:2009-09-29
申请人: Tyler Mueller , Geoffrey Batchelder , Ralph B. Danzl , Paul F. Gerrish , Anna J. Malin , Trevor D. Marrott , Michael F. Mattes
发明人: Tyler Mueller , Geoffrey Batchelder , Ralph B. Danzl , Paul F. Gerrish , Anna J. Malin , Trevor D. Marrott , Michael F. Mattes
IPC分类号: H01L23/02
CPC分类号: H05K1/144 , H01L23/3107 , H01L23/3185 , H01L23/564 , H01L24/05 , H01L24/06 , H01L24/80 , H01L24/81 , H01L24/94 , H01L25/0657 , H01L2224/0401 , H01L2224/05541 , H01L2224/0556 , H01L2224/05599 , H01L2224/16 , H01L2224/818 , H01L2224/81894 , H01L2224/83894 , H01L2225/06513 , H01L2924/00014 , H01L2924/0002 , H01L2924/01013 , H01L2924/01014 , H01L2924/01022 , H01L2924/01029 , H01L2924/01032 , H01L2924/01033 , H01L2924/0105 , H01L2924/01074 , H01L2924/01079 , H01L2924/01082 , H01L2924/014 , H01L2924/12042 , H01L2924/14 , H01L2924/15788 , H01L2924/19041 , H01L2924/3025 , H05K1/0298 , H05K1/11 , H05K2201/041 , Y10T29/49117 , Y10T29/49147 , H01L2224/05552 , H01L2924/00
摘要: Apparatus and methods to protect circuitry from moisture ingress, e.g., using a metallic structure as part of a moisture ingress barrier.
摘要翻译: 保护电路免受水分侵入的装置和方法,例如使用金属结构作为湿气入口屏障的一部分。
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公开(公告)号:US20100315110A1
公开(公告)日:2010-12-16
申请号:US12569474
申请日:2009-09-29
申请人: Andreas Armin Fenner , Geoffrey Batchelder , Paul F. Gerrish , Lary R. Larson , Anna J. Malin , Trevor D. Marrott , Tyler Mueller , David A. Ruben
发明人: Andreas Armin Fenner , Geoffrey Batchelder , Paul F. Gerrish , Lary R. Larson , Anna J. Malin , Trevor D. Marrott , Tyler Mueller , David A. Ruben
CPC分类号: H05K1/144 , H01L23/3107 , H01L23/3185 , H01L23/564 , H01L24/05 , H01L24/06 , H01L24/80 , H01L24/81 , H01L24/94 , H01L25/0657 , H01L2224/0401 , H01L2224/05541 , H01L2224/0556 , H01L2224/05599 , H01L2224/16 , H01L2224/818 , H01L2224/81894 , H01L2224/83894 , H01L2225/06513 , H01L2924/00014 , H01L2924/0002 , H01L2924/01013 , H01L2924/01014 , H01L2924/01022 , H01L2924/01029 , H01L2924/01032 , H01L2924/01033 , H01L2924/0105 , H01L2924/01074 , H01L2924/01079 , H01L2924/01082 , H01L2924/014 , H01L2924/12042 , H01L2924/14 , H01L2924/15788 , H01L2924/19041 , H01L2924/3025 , H05K1/0298 , H05K1/11 , H05K2201/041 , Y10T29/49117 , Y10T29/49147 , H01L2224/05552 , H01L2924/00
摘要: Electrical circuit apparatus and methods including hermeticity testing structures for testing the hermeticity of the electrical circuit apparatus.
摘要翻译: 包括用于测试电路装置的气密性的气密性测试结构的电路装置和方法。
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公开(公告)号:US20100314733A1
公开(公告)日:2010-12-16
申请号:US12569504
申请日:2009-09-29
申请人: Tyler Mueller , Geoffrey Batchelder , Ralph B. Danzl , Paul F. Gerrish , Anna J. Malin , Trevor D. Marrott , Michael F. Mattes
发明人: Tyler Mueller , Geoffrey Batchelder , Ralph B. Danzl , Paul F. Gerrish , Anna J. Malin , Trevor D. Marrott , Michael F. Mattes
CPC分类号: H05K1/144 , H01L23/3107 , H01L23/3185 , H01L23/564 , H01L24/05 , H01L24/06 , H01L24/80 , H01L24/81 , H01L24/94 , H01L25/0657 , H01L2224/0401 , H01L2224/05541 , H01L2224/0556 , H01L2224/05599 , H01L2224/16 , H01L2224/818 , H01L2224/81894 , H01L2224/83894 , H01L2225/06513 , H01L2924/00014 , H01L2924/0002 , H01L2924/01013 , H01L2924/01014 , H01L2924/01022 , H01L2924/01029 , H01L2924/01032 , H01L2924/01033 , H01L2924/0105 , H01L2924/01074 , H01L2924/01079 , H01L2924/01082 , H01L2924/014 , H01L2924/12042 , H01L2924/14 , H01L2924/15788 , H01L2924/19041 , H01L2924/3025 , H05K1/0298 , H05K1/11 , H05K2201/041 , Y10T29/49117 , Y10T29/49147 , H01L2224/05552 , H01L2924/00
摘要: Apparatus and methods to protect circuitry from moisture ingress, e.g., using a metallic structure as part of a moisture ingress barrier.
摘要翻译: 保护电路免受水分侵入的装置和方法,例如使用金属结构作为湿气入口屏障的一部分。
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公开(公告)号:US07477943B2
公开(公告)日:2009-01-13
申请号:US10723016
申请日:2003-11-26
申请人: Ralph B. Danzl , Mark R. Boone , Paul F. Gerrish , Michael F. Mattes , Tyler Mueller , Jeff Van Wagoner
发明人: Ralph B. Danzl , Mark R. Boone , Paul F. Gerrish , Michael F. Mattes , Tyler Mueller , Jeff Van Wagoner
IPC分类号: A61N1/39
CPC分类号: H01L29/66712 , A61N1/3912 , A61N1/3956 , A61N1/3968 , H01L23/481 , H01L29/41741 , H01L29/41766 , H01L29/7809 , H01L29/7824 , H01L2224/48091 , H01L2224/48227 , H01L2224/49111 , H01L2224/49175 , H01L2924/181 , H01L2924/00014 , H01L2924/00 , H01L2924/00012
摘要: Methods and apparatus are provided for manufacturing a medical device. An implantable medical device includes a semiconductor substrate, an epitaxial layer, and a power transistor. The epitaxial layer overlies the semiconductor substrate. The power transistor is formed in the epitaxial layer and includes a first electrode, a control electrode, and a second electrode. The power transistor has a voltage breakdown greater than 100 volts. The current flow of the power transistor is vertical through the epitaxial layer to the semiconductor substrate. A backside contact couples to the first electrode of the power transistor. A method of manufacturing a medical device includes a power transistor formed in an epitaxial layer overlying a semiconductor substrate. A deep trench is etched through the epitaxial layer exposing the semiconductor substrate. A first electrode contact region couples to an exposed area of the semiconductor substrate in the deep trench.
摘要翻译: 提供了用于制造医疗装置的方法和装置。 可植入医疗装置包括半导体衬底,外延层和功率晶体管。 外延层覆盖在半导体衬底上。 功率晶体管形成在外延层中,并且包括第一电极,控制电极和第二电极。 功率晶体管具有大于100伏特的电压击穿。 功率晶体管的电流通过外延层垂直于半导体衬底。 背面接触耦合到功率晶体管的第一电极。 一种制造医疗装置的方法包括形成在覆盖半导体衬底的外延层中的功率晶体管。 通过暴露半导体衬底的外延层蚀刻深沟槽。 第一电极接触区域耦合到深沟槽中的半导体衬底的暴露区域。
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公开(公告)号:US20120311855A1
公开(公告)日:2012-12-13
申请号:US13593549
申请日:2012-08-24
申请人: Tyler Mueller , Geoffrey Batchelder , Ralph B. Danzl , Paul F. Gerrish , Anna J. Malin , Trevor D. Marrott , Michael F. Mattes
发明人: Tyler Mueller , Geoffrey Batchelder , Ralph B. Danzl , Paul F. Gerrish , Anna J. Malin , Trevor D. Marrott , Michael F. Mattes
IPC分类号: H01R43/00
CPC分类号: H05K1/144 , H01L23/3107 , H01L23/3185 , H01L23/564 , H01L24/05 , H01L24/06 , H01L24/80 , H01L24/81 , H01L24/94 , H01L25/0657 , H01L2224/0401 , H01L2224/05541 , H01L2224/0556 , H01L2224/05599 , H01L2224/16 , H01L2224/818 , H01L2224/81894 , H01L2224/83894 , H01L2225/06513 , H01L2924/00014 , H01L2924/0002 , H01L2924/01013 , H01L2924/01014 , H01L2924/01022 , H01L2924/01029 , H01L2924/01032 , H01L2924/01033 , H01L2924/0105 , H01L2924/01074 , H01L2924/01079 , H01L2924/01082 , H01L2924/014 , H01L2924/12042 , H01L2924/14 , H01L2924/15788 , H01L2924/19041 , H01L2924/3025 , H05K1/0298 , H05K1/11 , H05K2201/041 , Y10T29/49117 , Y10T29/49147 , H01L2224/05552 , H01L2924/00
摘要: Apparatus and methods to protect circuitry from moisture ingress, e.g., using a metallic structure as part of a moisture ingress barrier.
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公开(公告)号:US07902851B2
公开(公告)日:2011-03-08
申请号:US12569474
申请日:2009-09-29
申请人: Andreas Armin Fenner , Geoffrey Batchelder , Paul F. Gerrish , Lary R. Larson , Anna J. Malin , Trevor D. Marrott , Tyler Mueller , David A. Ruben
发明人: Andreas Armin Fenner , Geoffrey Batchelder , Paul F. Gerrish , Lary R. Larson , Anna J. Malin , Trevor D. Marrott , Tyler Mueller , David A. Ruben
CPC分类号: H05K1/144 , H01L23/3107 , H01L23/3185 , H01L23/564 , H01L24/05 , H01L24/06 , H01L24/80 , H01L24/81 , H01L24/94 , H01L25/0657 , H01L2224/0401 , H01L2224/05541 , H01L2224/0556 , H01L2224/05599 , H01L2224/16 , H01L2224/818 , H01L2224/81894 , H01L2224/83894 , H01L2225/06513 , H01L2924/00014 , H01L2924/0002 , H01L2924/01013 , H01L2924/01014 , H01L2924/01022 , H01L2924/01029 , H01L2924/01032 , H01L2924/01033 , H01L2924/0105 , H01L2924/01074 , H01L2924/01079 , H01L2924/01082 , H01L2924/014 , H01L2924/12042 , H01L2924/14 , H01L2924/15788 , H01L2924/19041 , H01L2924/3025 , H05K1/0298 , H05K1/11 , H05K2201/041 , Y10T29/49117 , Y10T29/49147 , H01L2224/05552 , H01L2924/00
摘要: Electrical circuit apparatus and methods including hermeticity testing structures for testing the hermeticity of the electrical circuit apparatus.
摘要翻译: 包括用于测试电路装置的气密性的气密性测试结构的电路装置和方法。
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公开(公告)号:US20050113895A1
公开(公告)日:2005-05-26
申请号:US10723016
申请日:2003-11-26
申请人: Ralph Danzl , Mark Boone , Paul Gerrish , Michael Mattes , Tyler Mueller , Jeff Van Wagoner
发明人: Ralph Danzl , Mark Boone , Paul Gerrish , Michael Mattes , Tyler Mueller , Jeff Van Wagoner
IPC分类号: A61N1/39 , H01L21/336 , H01L23/48 , H01L29/417 , H01L29/78 , A61N1/375
CPC分类号: H01L29/66712 , A61N1/3912 , A61N1/3956 , A61N1/3968 , H01L23/481 , H01L29/41741 , H01L29/41766 , H01L29/7809 , H01L29/7824 , H01L2224/48091 , H01L2224/48227 , H01L2224/49111 , H01L2224/49175 , H01L2924/181 , H01L2924/00014 , H01L2924/00 , H01L2924/00012
摘要: Methods and apparatus are provided for manufacturing a medical device. An implantable medical device includes a semiconductor substrate, an epitaxial layer, and a power transistor. The epitaxial layer overlies the semiconductor substrate. The power transistor is formed in the epitaxial layer and includes a first electrode, a control electrode, and a second electrode. The power transistor has a voltage breakdown greater than 100 volts. The current flow of the power transistor is vertical through the epitaxial layer to the semiconductor substrate. A backside contact couples to the first electrode of the power transistor. A method of manufacturing a medical device includes a power transistor formed in an epitaxial layer overlying a semiconductor substrate. A deep trench is etched through the epitaxial layer exposing the semiconductor substrate. A first electrode contact region couples to an exposed area of the semiconductor substrate in the deep trench.
摘要翻译: 提供了用于制造医疗装置的方法和装置。 可植入医疗装置包括半导体衬底,外延层和功率晶体管。 外延层覆盖半导体衬底。 功率晶体管形成在外延层中,并且包括第一电极,控制电极和第二电极。 功率晶体管具有大于100伏特的电压击穿。 功率晶体管的电流通过外延层垂直于半导体衬底。 背面接触耦合到功率晶体管的第一电极。 一种制造医疗装置的方法包括形成在覆盖半导体衬底的外延层中的功率晶体管。 通过暴露半导体衬底的外延层蚀刻深沟槽。 第一电极接触区域耦合到深沟槽中的半导体衬底的暴露区域。
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公开(公告)号:US08263436B2
公开(公告)日:2012-09-11
申请号:US13302725
申请日:2011-11-22
申请人: Tyler Mueller , Geoffrey Batchelder , Ralph B. Danzl , Paul F. Gerrish , Anna J. Malin , Trevor D. Marrott , Michael F. Mattes
发明人: Tyler Mueller , Geoffrey Batchelder , Ralph B. Danzl , Paul F. Gerrish , Anna J. Malin , Trevor D. Marrott , Michael F. Mattes
IPC分类号: H01L21/00
CPC分类号: H05K1/144 , H01L23/3107 , H01L23/3185 , H01L23/564 , H01L24/05 , H01L24/06 , H01L24/80 , H01L24/81 , H01L24/94 , H01L25/0657 , H01L2224/0401 , H01L2224/05541 , H01L2224/0556 , H01L2224/05599 , H01L2224/16 , H01L2224/818 , H01L2224/81894 , H01L2224/83894 , H01L2225/06513 , H01L2924/00014 , H01L2924/0002 , H01L2924/01013 , H01L2924/01014 , H01L2924/01022 , H01L2924/01029 , H01L2924/01032 , H01L2924/01033 , H01L2924/0105 , H01L2924/01074 , H01L2924/01079 , H01L2924/01082 , H01L2924/014 , H01L2924/12042 , H01L2924/14 , H01L2924/15788 , H01L2924/19041 , H01L2924/3025 , H05K1/0298 , H05K1/11 , H05K2201/041 , Y10T29/49117 , Y10T29/49147 , H01L2224/05552 , H01L2924/00
摘要: Apparatus and methods to protect circuitry from moisture ingress, e.g., using a metallic structure as part of a moisture ingress barrier.
摘要翻译: 保护电路免受水分侵入的装置和方法,例如使用金属结构作为湿气入口屏障的一部分。
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公开(公告)号:US20100314149A1
公开(公告)日:2010-12-16
申请号:US12569431
申请日:2009-09-29
申请人: Paul F. Gerrish , Geoffrey Batchelder , Andreas Armin Fenner , Lary R. Larson , Anna J. Malin , Michael F. Mattes , Tyler Mueller , David A. Ruben , Larry E. Tyler
发明人: Paul F. Gerrish , Geoffrey Batchelder , Andreas Armin Fenner , Lary R. Larson , Anna J. Malin , Michael F. Mattes , Tyler Mueller , David A. Ruben , Larry E. Tyler
IPC分类号: H05K5/06
CPC分类号: H05K1/144 , H01L23/3107 , H01L23/3185 , H01L23/564 , H01L24/05 , H01L24/06 , H01L24/80 , H01L24/81 , H01L24/94 , H01L25/0657 , H01L2224/0401 , H01L2224/05541 , H01L2224/0556 , H01L2224/05599 , H01L2224/16 , H01L2224/80895 , H01L2224/80896 , H01L2224/80986 , H01L2224/818 , H01L2224/81894 , H01L2224/83894 , H01L2225/06513 , H01L2924/00014 , H01L2924/0002 , H01L2924/01013 , H01L2924/01014 , H01L2924/01022 , H01L2924/01029 , H01L2924/01032 , H01L2924/01033 , H01L2924/0105 , H01L2924/01074 , H01L2924/01079 , H01L2924/01082 , H01L2924/014 , H01L2924/12042 , H01L2924/14 , H01L2924/15788 , H01L2924/19041 , H01L2924/3025 , H05K1/0298 , H05K1/11 , H05K2201/041 , Y10T29/49117 , Y10T29/49147 , H01L2224/05552 , H01L2924/00
摘要: Hermetically-sealed electrical circuit apparatus and methods for constructing such apparatus using one or more seal portions.
摘要翻译: 气密密封电路装置和使用一个或多个密封部分构造这种装置的方法。
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