Processes for producing a sputtering target from a silicon-based alloy, a sputtering target
    1.
    发明申请
    Processes for producing a sputtering target from a silicon-based alloy, a sputtering target 审中-公开
    用于从硅基合金制造溅射靶的工艺,溅射靶

    公开(公告)号:US20060207740A1

    公开(公告)日:2006-09-21

    申请号:US11357525

    申请日:2006-02-17

    IPC分类号: B22D27/15

    摘要: A sputtering target and a process for producing a sputtering target from a silicon-based alloy with an aluminum content of more than 6 wt. % up to 50 wt. %. Preferably, the aluminum content of the alloy is at least 8 wt. %, but no more than 30 wt. %. The target material is produced by a casting technique in which the material is melted and vacuum-cast, such that the casting is carried out in a hollow cylindrical casting mold.

    摘要翻译: 溅射靶和铝含量大于6重量%的硅基合金制造溅射靶的方法。 %至50重量% %。 优选地,合金的铝含量为至少8重量%。 %,但不超过30wt。 %。 目标材料通过铸造技术制造,其中材料被熔化和真空铸造,使得铸造在中空圆柱形铸模中进行。

    Target for cathode sputtering and method of its production
    6.
    发明授权
    Target for cathode sputtering and method of its production 失效
    阴极溅射靶及其制造方法

    公开(公告)号:US5480531A

    公开(公告)日:1996-01-02

    申请号:US106986

    申请日:1993-08-16

    摘要: Oxide-ceramic targets of partially reduced indium oxide-tin oxide mixtures are described. The targets provide high sputter performances, and they exhibit an essentially defined degree of reduction between 0.02 and 0.3, a density between 75 and 98% of the theoretical density and a specific electric resistance between 89.times.10.sup.-3 and 0.25.times.10.sup.-3 .OMEGA. cm. The degree of reduction must not deviate at any point on the target surface by more than 5% from the average degree of reduction of the target. The targets are produced by means of hot-pressing the oxide mixtures which were partially reduced beforehand in a special method step.

    摘要翻译: 描述部分还原的氧化铟 - 氧化锡混合物的氧化物 - 陶瓷靶。 这些靶提供高的溅射性能,并且它们表现出基本上限定的0.02和0.3之间的减小程度,理论密度的75-98%之间的密度以及89×10 -3和0.25×10 -3欧米加厘米之间的比电阻。 目标表面的任何一点的减少程度不能偏离目标平均减少程度的5%以上。 通过在特殊的方法步骤中预先将部分减少的氧化物混合物热压制备目标物。