Abstract:
A memory cell includes a memory element, a current-limiting element electrically coupled to the memory element, and a high-selection-ratio element electrically coupled to the current-limiting element. The memory element is configured to store data as a resistance state. The current-limiting element is a voltage-controlled resistor (VCR) having a resistance that decreases when a voltage applied thereto increases. The high-selection-ratio element has a first resistance that is small when a voltage applied to the memory cell is approximately equal to a selection voltage of the memory cell, and has a second resistance that is substantially larger than the first resistance when the voltage applied to the memory cell is approximately equal to one-half of the selection voltage.
Abstract:
A control method for at least one memory cell is disclosed. The memory cell includes a transistor and a resistor. The resistor is connected to the transistor between a first node and a second node. In a programming mode, the memory cell is programmed. The step of programming the memory cell includes providing a first controlling voltage to a gate of the transistor, providing a first setting voltage to the first node, and providing a second setting voltage to the second node. When it is determined that the memory cell has been successfully programmed, a specific action is executed.
Abstract:
A testing circuit board used in a testing system with a tester and a handler is disclosed. The testing circuit board is used for transmitting a plurality of testing signals provided by the tester to test at least two devices under test located on the handler. The testing circuit board includes a connecting board, a load board and at least two connecting interfaces. The connecting board coupled to the handler has at least two connecting sockets for respectively connecting to the devices under testing. The load board coupled to the tester has two joining sockets located corresponding to the connecting sockets. The at least two connecting interfaces are coupled between the connecting sockets and the joining sockets for transmitting the testing signals for testing the devices under testing.
Abstract:
The invention provides a handler and a method for testing the same. The handler comprises a sorter and a testing module. The testing module further comprises a signal generator, a sensor, and a signal comparator. The signal generator generates and sends out a first handling signal. The sorter receives the first handling signal and correspondingly places a first electronic component on a first region according to the first handling signal. The sensor senses the first electronic component on the first region, and then correspondingly generates and sends out a second handling signal. The signal comparator is electrically connected to the sensor and the signal generator, and receives the first handling signal and the second handling signal. The signal comparator determines whether the first handling signal is equivalent to the second handling signal, and correspondingly sends out a comparing signal.
Abstract:
An electrical connector includes an insulating body with a main body portion in which a first receiving space is concavely formed. Spaced first terminal passages extend in a top surface of the first receiving space. A second receiving space is formed in the front end of the main body portion and connected with the first receiving space. A tongue plate extends forwards from a front end face of the main body portion and has a working surface in which spaced second terminal passages extend. The second receiving space is located above the tongue plate. First and second conductive terminals are respectively correspondingly received in the first and the second terminal passages. When a memory card is inserted into the connector, there is no other in-series disturbed signal noise for stable signal transmission; and when the memory card is inserted to its position, it cannot swing and can be connected stably.
Abstract:
An electrical connector includes an insulating body with a main body portion in which a first receiving space is concavely formed. Spaced first terminal passages extend in a top surface of the first receiving space. A second receiving space is formed in the front end of the main body portion and connected with the first receiving space. A tongue plate extends forwards from a front end face of the main body portion and has a working surface in which spaced second terminal passages extend. The second receiving space is located above the tongue plate. First and second conductive terminals are respectively correspondingly received in the first and the second terminal passages. When a memory card is inserted into the connector, there is no other in-series disturbed signal noise for stable signal transmission; and when the memory card is inserted to its position, it cannot swing and can be connected stably.
Abstract:
A one-way action mechanism capable of rotating steplessly includes a main body, a rotary element and a friction element. The main body is provided thereon with a pivotal hole and a recessed space in communication with the pivotal hole. One side of the recessed space away from the pivotal hole has a friction surface. The rotary element is formed into a circular ring and is pivotally connected in the pivotal hole. The outer periphery of the rotary element is formed by a plurality of teeth. The friction element is received in the recessed space and has a gear and a friction wheel covering the gear. The friction element is restricted by an elastic element, so that the friction wheel can be brought into a rotary and frictional contact with the friction surface. An intermediate gear is drivingly engaged between the rotary element and the gear of the friction element.
Abstract:
An apparatus and method for automatically offsetting the linear deviation of a V/F converter, the offset adjust pin of which is connected to a fixed resistance, and the frequency output pin of which is connected to a microcontroller unit (MCU) via an opto-isolator, a standard V/F transfer function being pre-stored in the MCU, wherein standard frequencies F1 and F0 (i.e., two coordination points (V1, F1) and (V0, F0)) are output by the V/F converter, when V1 and V0 are input as standard voltages, and the MCU may detect an error status in the V/F converter, when the V/F converter obtains real output frequencies F1′ and F0′ from real input voltages V1 and V2, and standard coordination points (F1, K1) and (F0, K0) will be corrected to (F1′, K1) and (F0′, K0′), from which a transfer function of offsetting frequency down is obtained, when the MCU processes a frequency down procedure.
Abstract:
The present invention discloses an electrical connector, comprising an insulating body whose front end protrudes to form a mating portion to mate with mating electronic devices; a plurality of electrical terminals, and a shielding metal sheet capable of encompassing the insulating body. The present invention also discloses an electrical connector assembly, comprising: a first connector having an insulating body which is protrudingly disposed with a mating portion to mate with electronic device and a plurality of electrical terminals; a second connector capable of connecting with the first connector; and a shielding metal sheet which can at least encompass the first connector. The present invention can effectively shield the electrical connector from the interfering of external electronic signals to achieve normal input and output of electronic signals.