Output buffer circuit, input buffer circuit, and input/output buffer circuit
    1.
    发明授权
    Output buffer circuit, input buffer circuit, and input/output buffer circuit 有权
    输出缓冲电路,输入缓冲电路,输入/输出缓冲电路

    公开(公告)号:US08405432B2

    公开(公告)日:2013-03-26

    申请号:US12963114

    申请日:2010-12-08

    IPC分类号: H03K3/01

    CPC分类号: H03K19/00384 H03K19/01721

    摘要: An output buffer circuit in accordance with an embodiment comprises a plurality of buffer circuits, each of the buffer circuits including a transistor operative to change an output signal of an output terminal in response to a change in an input signal, the output buffer circuit being configured to enable the plurality of buffer circuits to be driven selectively. Each of the plurality of buffer circuits includes a plurality of output transistors having respective current paths formed in parallel to one another between a fixed voltage terminal supplying a certain fixed voltage and an output terminal, and being selectively rendered in an operable state in accordance with a control signal provided from external. The plurality of output transistors included in each of the plurality of buffer circuits are formed having a certain size ratio.

    摘要翻译: 根据实施例的输出缓冲器电路包括多个缓冲电路,每个缓冲电路包括一个晶体管,用于响应于输入信号的变化而改变输出端的输出信号,该输出缓冲电路被配置 以使得能够选择性地驱动多个缓冲电路。 多个缓冲电路中的每一个包括多个输出晶体管,其具有在提供一定固定电压的固定电压端子和输出端子之间彼此并联形成的各自的电流路径,并且根据 控制信号由外部提供。 包含在多个缓冲电路的每一个中的多个输出晶体管形成为具有一定的尺寸比。

    Power supply circuit and semiconductor memory
    2.
    发明授权
    Power supply circuit and semiconductor memory 有权
    电源电路和半导体存储器

    公开(公告)号:US07576523B2

    公开(公告)日:2009-08-18

    申请号:US12125589

    申请日:2008-05-22

    IPC分类号: G05F1/40 H02M3/18 G11C7/00

    摘要: A power supply circuit that outputs a set voltage from an output terminal, has a boosting circuit that boosts a voltage supplied from a power supply and outputs the voltage to the output terminal; a voltage detecting circuit that outputs a first detecting signal when the voltage outputted from the boosting circuit is not lower than a first detection voltage set lower than the set voltage, and outputs a second detecting signal when the voltage outputted from the boosting circuit is not lower than the set voltage; and a clock signal generating circuit that outputs, based on a reference clock signal, a clock signal and an inverted clock signal obtained by inverting the clock signal, and stops outputs of the clock signal and the inverted clock signal in response to the second detecting signal.

    摘要翻译: 从输出端子输出设定电压的电源电路具有升压电路,其升压从电源供给的电压,并将该电压输出到输出端子; 电压检测电路,当从升压电路输出的电压不低于设定电压以下的第一检测电压时,输出第一检测信号,并且当从升压电路输出的电压不低时输出第二检测信号 比设定电压; 以及时钟信号发生电路,其基于参考时钟信号输出通过反相时钟信号而获得的时钟信号和反相时钟信号,并响应于第二检测信号停止时钟信号和反相时钟信号的输出 。

    Buffer circuit
    4.
    发明授权
    Buffer circuit 有权
    缓冲电路

    公开(公告)号:US08242812B2

    公开(公告)日:2012-08-14

    申请号:US12963194

    申请日:2010-12-08

    IPC分类号: H03K3/00

    CPC分类号: H03K19/00384

    摘要: A buffer circuit in accordance with an embodiment comprises output transistors connected between a first fixed voltage terminal and an output terminal, and gate control transistors connected between a second fixed voltage terminal and a gate of one of the output transistors or between two of gates of the output transistors. The output transistors are configured to turn on to change a voltage of the output terminal. The gate control transistors are configured to apply a gate voltage to the gates of the output transistors. A gate of each of the gate control transistors is applied with a certain voltage, such that when a source of each of the gate control transistors changes from a first potential to a second potential, a potential difference between the gate and the source attains a threshold voltage or greater, whereby each of the gate control transistors is turned on.

    摘要翻译: 根据实施例的缓冲电路包括连接在第一固定电压端子和输出端子之间的输出晶体管,以及连接在第二固定电压端子和输出晶体管之一的栅极之间或栅极控制晶体管的两个栅极之间的栅极控制晶体管 输出晶体管。 输出晶体管被配置为导通以改变输出端子的电压。 栅极控制晶体管被配置为向输出晶体管的栅极施加栅极电压。 每个栅极控制晶体管的栅极被施加一定电压,使得当每个栅极控制晶体管的源极从第一电位变为第二电位时,栅极和源极之间的电位差达到阈值 电压或更大,由此每个栅极控制晶体管导通。

    BUFFER CIRCUIT
    5.
    发明申请
    BUFFER CIRCUIT 有权
    缓冲电路

    公开(公告)号:US20110133792A1

    公开(公告)日:2011-06-09

    申请号:US12963194

    申请日:2010-12-08

    IPC分类号: H03K3/00

    CPC分类号: H03K19/00384

    摘要: A buffer circuit in accordance with an embodiment comprises output transistors connected between a first fixed voltage terminal and an output terminal, and gate control transistors connected between a second fixed voltage terminal and a gate of one of the output transistors or between two of gates of the output transistors. The output transistors are configured to turn on to change a voltage of the output terminal. The gate control transistors are configured to apply a gate voltage to the gates of the output transistors. A gate of each of the gate control transistors is applied with a certain voltage, such that when a source of each of the gate control transistors changes from a first potential to a second potential, a potential difference between the gate and the source attains a threshold voltage or greater, whereby each of the gate control transistors is turned on.

    摘要翻译: 根据实施例的缓冲电路包括连接在第一固定电压端子和输出端子之间的输出晶体管,以及连接在第二固定电压端子和输出晶体管之一的栅极之间或栅极控制晶体管的两个栅极之间的栅极控制晶体管 输出晶体管。 输出晶体管被配置为导通以改变输出端子的电压。 栅极控制晶体管被配置为向输出晶体管的栅极施加栅极电压。 每个栅极控制晶体管的栅极被施加一定电压,使得当每个栅极控制晶体管的源极从第一电位变为第二电位时,栅极和源极之间的电位差达到阈值 电压或更大,由此每个栅极控制晶体管导通。

    Semiconductor device and method for testing the same
    6.
    发明申请
    Semiconductor device and method for testing the same 失效
    半导体装置及其测试方法

    公开(公告)号:US20050088870A1

    公开(公告)日:2005-04-28

    申请号:US10941999

    申请日:2004-09-16

    摘要: A semiconductor device that generates a desired internal power supply by using, as a reference potential, a potential obtained by adjusting a preset standard potential, the semiconductor device comprises; a reference potential selection circuit selecting said reference potential on the basis of digital data from among a plurality of potentials of different levels which are obtained by dividing a power supply voltage, and outputting said reference potential in place of said standard potential; a first decision circuit deciding bits of said digital data; a second decision circuit deciding the bits of said digital data, separately from said first decision circuit; and a data transfer circuit transferring to said reference potential selection circuit said digital data which is decided by either one of said first and second decision circuits.

    摘要翻译: 一种半导体器件,其通过使用通过调整预设标准电位而获得的电位作为参考电位来产生期望的内部电源,所述半导体器件包括: 参考电位选择电路,其基于通过分割电源电压获得的不同电平的多个电位中的数字数据来选择所述参考电位,并输出所述参考电位代替所述标准电位; 确定所述数字数据的位的第一判定电路; 第二判定电路,与所述第一判定电路分离地决定所述数字数据的位; 以及数据传送电路,传送到所述参考电位选择电路,所述数字数据由所述第一和第二判定电路中的任一个决定。

    OUTPUT BUFFER CIRCUIT, INPUT BUFFER CIRCUIT, AND INPUT/OUTPUT BUFFER CIRCUIT
    7.
    发明申请
    OUTPUT BUFFER CIRCUIT, INPUT BUFFER CIRCUIT, AND INPUT/OUTPUT BUFFER CIRCUIT 有权
    输出缓冲电路,输入缓冲电路和输入/输出缓冲电路

    公开(公告)号:US20110133791A1

    公开(公告)日:2011-06-09

    申请号:US12963114

    申请日:2010-12-08

    IPC分类号: H03K3/01

    CPC分类号: H03K19/00384 H03K19/01721

    摘要: An output buffer circuit in accordance with an embodiment comprises a plurality of buffer circuits, each of the buffer circuits including a transistor operative to change an output signal of an output terminal in response to a change in an input signal, the output buffer circuit being configured to enable the plurality of buffer circuits to be driven selectively. Each of the plurality of buffer circuits includes a plurality of output transistors having respective current paths formed in parallel to one another between a fixed voltage terminal supplying a certain fixed voltage and an output terminal, and being selectively rendered in an operable state in accordance with a control signal provided from external. The plurality of output transistors included in each of the plurality of buffer circuits are formed having a certain size ratio.

    摘要翻译: 根据实施例的输出缓冲器电路包括多个缓冲电路,每个缓冲电路包括一个晶体管,用于响应于输入信号的变化而改变输出端的输出信号,该输出缓冲电路被配置 以使得能够选择性地驱动多个缓冲电路。 多个缓冲电路中的每一个包括多个输出晶体管,其具有在提供一定固定电压的固定电压端子和输出端子之间彼此并联形成的各自的电流路径,并且根据 控制信号由外部提供。 包含在多个缓冲电路的每一个中的多个输出晶体管形成为具有一定的尺寸比。

    Semiconductor integrated circuit device
    8.
    发明授权
    Semiconductor integrated circuit device 失效
    半导体集成电路器件

    公开(公告)号:US07173479B2

    公开(公告)日:2007-02-06

    申请号:US10962617

    申请日:2004-10-13

    申请人: Yasuhiro Suematsu

    发明人: Yasuhiro Suematsu

    IPC分类号: G05F3/02

    CPC分类号: G11C5/14

    摘要: A semiconductor integrated circuit device according to a first aspect of the present invention includes: a first internal power source voltage generating circuit which includes a voltage boosting circuit and a level determining circuit, and outputs a first internal power source voltage, the voltage boosting circuit boosting a voltage based upon a voltage boosting start instruction signal after putting on a power supply, and the level determining circuit which generates a first control signal when an output voltage from the voltage boosting circuit reaches a first level and generates a second control signal for stopping the voltage boosting of the voltage boosting circuit when the output voltage from the voltage boosting circuit reaches a second level higher than the first level; a first control circuit which generates a first action start instruction signal based upon the voltage boosting start instruction signal and the first control signal; and a second internal power source voltage generating circuit which generates a second internal power source voltage based upon the first action start instruction signal.

    摘要翻译: 根据本发明的第一方面的半导体集成电路器件包括:第一内部电源电压产生电路,其包括升压电路和电平确定电路,并且输出第一内部电源电压,所述升压电路升压 在施加电源之后基于升压开始指令信号的电压;以及当来自升压电路的输出电压达到第一电平时产生第一控制信号的电平确定电路,并且产生用于停止电压的第二控制信号 当升压电路的输出电压达到高于第一电平的第二电平时升压电路的升压; 第一控制电路,其基于所述升压开始指示信号和所述第一控制信号生成第一动作开始指示信号; 以及第二内部电源电压产生电路,其基于第一动作开始指令信号产生第二内部电源电压。

    Semiconductor memory device with testable spare columns and rows
    9.
    发明授权
    Semiconductor memory device with testable spare columns and rows 失效
    半导体存储器件具有可测试的备用列和行

    公开(公告)号:US6046955A

    公开(公告)日:2000-04-04

    申请号:US271468

    申请日:1999-03-17

    CPC分类号: G11C8/12

    摘要: A synchronous dynamic random access memory has spare columns which can be tested before shipping. In the memory, a mode set register outputs a multibank write signal in the test mode. A CBS latch circuit generates not only a signal for selecting the spare column decoders in banks and in the test mode but also signals for selecting the column decoders. Write driving circuits write the data onto the column lines selected by the column decoders and onto the spare column lines selected by the spare column decoders.

    摘要翻译: 同步动态随机存取存储器有备用列,可在发货前进行测试。 在存储器中,模式设置寄存器在测试模式下输出多存储器写入信号。 CBS锁存电路不仅产生用于在存储体和测试模式中选择备用列解码器的信号,而且还生成用于选择列解码器的信号。 写驱动电路将数据写入由列解码器选择的列线上,并将其写入由备用列解码器选择的备用列线上。

    Semiconductor memory having a page mode in which previous data in an
output circuit is reset before new data is supplied
    10.
    发明授权
    Semiconductor memory having a page mode in which previous data in an output circuit is reset before new data is supplied 失效
    具有页面模式的半导体存储器,其中输出电路中的先前数据在提供新数据之前被复位

    公开(公告)号:US5914899A

    公开(公告)日:1999-06-22

    申请号:US947124

    申请日:1997-10-08

    申请人: Yasuhiro Suematsu

    发明人: Yasuhiro Suematsu

    IPC分类号: G11C7/10 G11C7/00

    摘要: A semiconductor memory device resets a latch data output before new data is transferred in a successive data output mode, in order to improve a high-speed access operation of the semiconductor memory. Data stored in a memory cell of a memory cell array or a register portion arranged in a column direction are successively accessed with a signal /CAS as a trigger. The accessed data is output through an output buffer in a clock cycle between a trigger of the signal /CAS and a next trigger thereof. In the output buffer of the semiconductor memory, immediately before an output cycle of new data transmitted from the memory cell through a data line, the previous data is reset and a data output portion is set to a high-impedance state by the signal /CAS. Thereafter, the new data is supplied to the output buffer through the data line.

    摘要翻译: 为了改善半导体存储器的高速存取操作,半导体存储器件在连续数据输出模式下传输新数据之前复位锁存数据输出。 存储在存储单元阵列的存储单元中的数据或以列方向排列的寄存器部分的数据以信号/ CAS作为触发来连续访问。 所访问的数据通过输出缓冲器以信号/ CAS的触发和其下一个触发之间的时钟周期输出。 在半导体存储器的输出缓冲器中,在从存储器单元通过数据线发送的新数据的输出周期之前,先前数据被复位,并且数据输出部分被信号/ CAS设置为高阻抗状态 。 此后,通过数据线将新数据提供给输出缓冲器。