摘要:
A synchronous dynamic random access memory has spare columns which can be tested before shipping. In the memory, a mode set register outputs a multibank write signal in the test mode. A CBS latch circuit generates not only a signal for selecting the spare column decoders in banks and in the test mode but also signals for selecting the column decoders. Write driving circuits write the data onto the column lines selected by the column decoders and onto the spare column lines selected by the spare column decoders.
摘要:
A memory may include word lines; bit lines; cells provided corresponding to intersections between the word lines and the bit lines; sense amplifiers detecting data; a column decoder selecting a certain bit line for the sense amplifiers to output read data or receive write data; a row decoder configured to select a certain word line; a charge pump supplying power to the sense amplifiers, the column decoder, and the row decoder; a logic circuit controlling the sense amplifiers, the column decoder, and the row decoder based on an address selecting the memory cells; a first power source input applying a voltage to the logic circuit; and a second power source input applying a voltage higher than a voltage of the first power source input to the charge pump, and to supply power to the charge pump at least at a data reading time and a data writing time.
摘要:
A semiconductor integrated circuit, comprising: a first output driving part which outputs a data signal in sync with a reference clock signal; a second output driving part which outputs a data strobe signal prescribing a timing of said data signal; and a driving control part which separately controls driving ability of said first and second output driving parts.
摘要:
A specifying circuit specifies either the first masking method or the second masking method. A first generation circuit generates a signal corresponding to the first method. A second generation circuit generates a signal corresponding to the second method. A third generation circuit generates a write pulse signal on the basis of the output signal of the first generation circuit in response to the specification of the first masking method made by the specifying circuit and on the basis of the output signal of the second generation circuit in response to the specification of the second masking method made by the specifying circuit.
摘要:
A row access command and column access command are supplied as one packet to an FCRAM in two successive clock cycles in order to shorten random access time and random cycle time. At this time, definition of the read/write operation is made by use of a first command and a decode address of a memory cell array is fetched in response to the first command. When the decode address of the memory cell array is fetched in response to the first command, command control pins of the conventional SDR/DDR-SDRAM are used as address pins.
摘要:
A clock control circuit includes a forward pulse delay circuit including a plurality of delay circuits for delaying a forward pulse signal FCL, a backward pulse delay circuit including a plurality of delay circuits for delaying a backward pulse signal RCL, a state-hold section including a plurality of state-hold circuits for controlling the operation of the backward pulse delay circuit in accordance with the transmission condition of the forward pulse signal in the forward pulse delay circuit, and an input stop circuit for stopping inputting a pulse corresponding to an external clock signal to the backward pulse delay circuit during a predetermined period from the time point when the external clock signal begins to be supplied.
摘要:
A synchronous semiconductor memory device comprises: a memory cell array; a decoder circuit for decoding an address, which is supplied in synchronism with a clock, to select a memory cell of the memory cell array; a plurality of main data line pairs, to which data of the memory cell array are transferred; a plurality of data line buffers, each of which is provided in a corresponding one of the main data line pairs and each of which includes a latch circuit; and a plurality of peripheral data lines for transferring data of each of the data line buffers to a data input/output terminal, wherein a plurality of bits of data per data input/output terminal read out of the memory cell array are transferred to the data line buffers via the main data line pairs in parallel, and while head data of the plurality of bits of data pass through the latch circuits to be transferred to one of the peripheral data lines, a plurality of continuous data are temporarily held by the latch circuit, and subsequent data are sequentially transferred to the same peripheral data line as the one of the peripheral data lines, to which the head data have been transferred. Thus, it is possible to decrease the number of peripheral data lines to reduce the chip size of an SDRAM while adopting a pre-fetch system for accelerating a data transfer cycle.
摘要:
Memory cells disposed in a matrix are divided into a plurality of blocks. Each block is constructed of n (n is a positive integer larger than 2) memory cell columns. One block is selected by one column address. One memory cell column in the n memory cell columns in a selected block is selected by a first gate. One memory cell column in the n memory cell colunns in a selected block is selected by a second gate. One memory cell in a selected memory cell column is selected by a row address. The data in a selected memory cell are stored in a register and output therefrom.
摘要:
For a semiconductor integrated circuit having a data output buffer, separate power source pads and separate reference pads are provided for the data output buffer and the circuit components. Thus, any potential fluctuations or noise generated in the data output buffer are not transmitted to the circuit components, resulting in decreased circuit malfunction.
摘要:
The present invention provides a method for writing data to a non-volatile memory device having first wirings and second wirings intersecting one another and memory cells arranged at each intersection therebetween, each of the memory cells having a variable resistive element and a rectifying element connected in series. According to the method, the second wirings are charged to a certain voltage not less than a rectifying-element threshold value, prior to a rise in a selected first wiring. Then, a selected first wiring is charged to a voltage required for writing or erasing, after which a selected second wiring is discharged.