WIRE BONDER AND METHOD OF CALIBRATING A WIRE BONDER
    2.
    发明申请
    WIRE BONDER AND METHOD OF CALIBRATING A WIRE BONDER 有权
    电线接头和校准线接头的方法

    公开(公告)号:US20140209663A1

    公开(公告)日:2014-07-31

    申请号:US14162336

    申请日:2014-01-23

    Abstract: Disclosed is a wire bonder comprising: a processor; a bond head coupled to the processor, the processor being configured to control motion of the bond head; a bonding tool mounted to the bond head, the bonding tool being drivable by the bond head to form an electrical interconnection between a semiconductor die and a substrate to which the semiconductor die is mounted using a bonding wire; and a measuring device coupled to the bond head, the measuring device being operable to measure a deformation of a bonding portion of the bonding wire as the bonding tool is driven by the bond head to connect the bonding wire to the semiconductor die via the bonding portion. Specifically, the processor is configured to derive at least one correlation between the measured deformation of the bonding portion and an operating parameter of the wire bonder; compare the at least one derived correlation against a predetermined correlation between the operating parameter of the wire bonder and a desired deformation of the bonding portion; and calibrate the operating parameter of the wire bonder based on the comparison between the at least one derived correlation and the predetermined correlation of the deformation of the bonding portion against the operating parameter of the wire bonder. A method of calibrating a wire bonder is also disclosed.

    Abstract translation: 公开了一种引线键合机,包括:处理器; 耦合到所述处理器的接合头,所述处理器被配置为控制所述接合头的运动; 粘合工具安装到接合头,所述接合工具可由所述接合头驱动,以在半导体管芯和使用接合线安装所述半导体管芯的衬底之间形成电互连; 以及耦合到所述接合头的测量装置,所述测量装置可操作以在所述接合工具由所述接合头驱动时测量所述接合线的接合部的变形,以通过所述接合部将所述接合线连接到所述半导体管芯 。 具体地,处理器被配置为导出测量的接合部分的变形与引线接合器的操作参数之间的至少一个相关性; 将所述至少一个导出相关性与所述引线接合器的操作参数与所述接合部分的期望变形之间的预定相关性进行比较; 并且基于所述至少一个导出的相关性与所述接合部的变形与所述引线接合器的操作参数的预定相关性之间的比较来校准所述引线接合器的操作参数。 还公开了一种校准引线接合器的方法。

    Method and apparatus for measuring a free air ball size during wire bonding

    公开(公告)号:US10163845B2

    公开(公告)日:2018-12-25

    申请号:US14320851

    申请日:2014-07-01

    Abstract: Disclosed is a method of measuring a free air ball size during a wire bonding process of a wire bonder, which comprises a position sensor and a bonding tool for forming an electrical connection between a semiconductor device and a substrate using a bonding wire. Specifically, the method comprises the steps of: forming a free air ball from a wire tail of the bonding wire; using the position sensor to determine a positional difference between a first and a second position of the bonding tool with respect to a reference position, wherein the first position of the bonding tool is a position of the bonding tool with respect to the reference position when the free air ball contacts a conductive surface; and measuring the free air ball size based on the positional difference of the bonding tool as determined by the position sensor. A wire bonder configured to perform such a method is also disclosed.

    Wire bonder and method of calibrating a wire bonder

    公开(公告)号:US09620477B2

    公开(公告)日:2017-04-11

    申请号:US14162336

    申请日:2014-01-23

    Abstract: Disclosed is a wire bonder comprising: a processor; a bond head coupled to the processor, the processor being configured to control motion of the bond head; a bonding tool mounted to the bond head, the bonding tool being drivable by the bond head to form an electrical interconnection between a semiconductor die and a substrate to which the semiconductor die is mounted using a bonding wire; and a measuring device coupled to the bond head, the measuring device being operable to measure a deformation of a bonding portion of the bonding wire as the bonding tool is driven by the bond head to connect the bonding wire to the semiconductor die via the bonding portion. Specifically, the processor is configured to derive at least one correlation between the measured deformation of the bonding portion and an operating parameter of the wire bonder; compare the at least one derived correlation against a predetermined correlation between the operating parameter of the wire bonder and a desired deformation of the bonding portion; and calibrate the operating parameter of the wire bonder based on the comparison between the at least one derived correlation and the predetermined correlation of the deformation of the bonding portion against the operating parameter of the wire bonder. A method of calibrating a wire bonder is also disclosed.

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