ACCUMULATION FIELD EFFECT MICROELECTRONIC DEVICE AND PROCESS FOR THE FORMATION THEREOF
    5.
    发明申请
    ACCUMULATION FIELD EFFECT MICROELECTRONIC DEVICE AND PROCESS FOR THE FORMATION THEREOF 有权
    累积效应微电子器件及其形成过程

    公开(公告)号:US20080251862A1

    公开(公告)日:2008-10-16

    申请号:US12102398

    申请日:2008-04-14

    IPC分类号: H01L29/00 H01L21/336

    摘要: A gated microelectronic device is provided that has a source with a source ohmic contact with the source characterized by a source dopant type and concentration. A drain with a drain ohmic contact with the drain characterized by a drain dopant type and concentration. An intermediate channel portion characterized by a channel portion dopant type and concentration. An insulative dielectric is in contact with the channel portion and overlaid in turn by a gate. A gate contact applies a gate voltage bias to control charge carrier accumulation and depletion in the underlying channel portion. This channel portion has a dimension normal to the gate which is fully depleted in the off-state. The dopant type is the same across the source, drain and the channel portion of the device. The device on-state current is determined by the doping and, unlike a MOSFET, is not directly proportional to device capacitance.

    摘要翻译: 提供了门控微电子器件,其具有源极与源极源极接触的源极,源极的源极掺杂剂类型和浓度为特征。 具有与漏极欧姆接触的漏极,其特征在于漏极掺杂剂类型和浓度。 中间通道部分,其特征在于通道部分掺杂剂型和浓度。 绝缘电介质与通道部分接触并依次由栅极覆盖。 栅极接触器施加栅极电压偏置以控制底层通道部分中的载流子累积和耗尽。 该通道部分具有​​垂直于关断状态完全耗尽的栅极的尺寸。 掺杂剂类型在器件的源极,漏极和沟道部分上是相同的。 器件导通电流由掺杂决定,与MOSFET不同,器件电容不成正比。