摘要:
A nonvolatile memory device includes an array of rows and columns of memory cells and a plurality of word lines and bit lines associated with the memory cells. The memory device further includes a word line booster circuit coupled with the word lines for supplying a selected word line with the specific voltage as a drive voltage during an operation of the memory device, wherein the word line booster circuit includes a first boosting capacitor and a second boosting capacitor connected in parallel each other adapted to generate a boosting voltage and a first precharge circuit for precharging the first boosting capacitor and the second boosting capacitor. the word line booster circuit further includes a third boosting capacitor operatively connected to the first boosting capacitor and the second boosting capacitor via a charge-sharing transistor, the third boosting capacitor being connected to one end of a load resistor to generate an output signal at the other end of the load resistor when the charge sharing transistor is enabled. In addition, the word line booster circuit includes a high voltage detector to generate a detecting signal in response to a control signal from an address transition detector and the output signal generated by the third boosting capacitor and load resistor and a clock control circuit adapted to enable the charge sharing transistor and to disable one of the first boosting capacitor and the second boosting capacitor upon receiving the control signal from the address transition detector and the detecting signal from the voltage detector. The word line booster circuit further includes a discharge circuit to discharge the boosting voltage at a node connected to the third boosting capacitor.
摘要:
A high-voltage regulator includes a charge pump for generating a high voltage, a voltage regulator for generating a regulated voltage, and an oscillator having an oscillation frequency. The voltage regulator includes an operational amplifier having the high voltage as power supply, a first input, a second input coupled to a voltage reference, and an output. The voltage regulator further includes a first transistor having gate coupled to the output of the operational amplifier, a first terminal coupled to the high voltage and a second terminal coupled to a first voltage divider. The first voltage divider generates a first divided voltage that is coupled to the first input of the operational amplifier. The voltage regulator also includes a second voltage divider for providing a second divided voltage, wherein the second divided voltage controls the oscillator frequency.
摘要:
A high-voltage regulator includes a charge pump for generating a high voltage, a voltage regulator for generating a regulated voltage, and an oscillator having an oscillation frequency. The voltage regulator includes an operational amplifier having the high voltage as power supply, a first input, a second input coupled to a voltage reference, and an output. The voltage regulator further includes a first transistor having gate coupled to the output of the operational amplifier, a first terminal coupled to the high voltage and a second terminal coupled to a first voltage divider. The first voltage divider generates a first divided voltage that is coupled to the first input of the operational amplifier. The voltage regulator also includes a second voltage divider for providing a second divided voltage, wherein the second divided voltage controls the oscillator frequency.
摘要:
A flash memory which is electrically erasable programmable and has a negative voltage generator for data erasure. The negative voltage generator comprises a charge pump for pumping a negative charge, a regulator for regulating the level of an output voltage from the charge pump according to the level of a supply voltage, and a negative voltage supply for supplying a voltage of the level regulated by the regulator to a gate of a memory cell transistor. This construction of the negative voltage generator enables a data erase operation of the flash memory to be performed under the condition that an output voltage from the negative voltage supply is applied to the gate of the cell transistor, the supply voltage is applied to a source of the cell transistor and a drain of the cell transistor floats. Further, a sufficient amount of erase current is secured by the voltages applied to the source and gate of the cell transistor for the data erase operation. Moreover, the negative voltage generator compensates for a variation in the supply voltage suffered by the source side. Therefore, the flash memory of the present invention is capable of performing a stable data erase operation.
摘要:
The present invention discloses a flash memory device, a first well and second well are formed in a substrate, a plurality of memory cell are formed in the second well and arranged in an array having a multiplicity of bit lines and word lines. Voltage is applied to the first well and second well, respectively, with time interval so that an over erasing of the memory cell and lowering of cycling characteristic can be prevented.
摘要:
A nonvolatile memory device includes an array of rows and columns of memory cells and a plurality of word lines and bit lines associated with the memory cells. The memory device further includes a word line booster circuit coupled with the word lines for supplying a selected word line with a specific voltage as a drive voltage during an operation of the memory device. The word line booster circuit includes a first boosting capacitor and a second boosting capacitor connected in parallel to generate a boosting voltage and a first precharge circuit for precharging the first and second boosting capacitors. The word line booster circuit further includes a third boosting capacitor operatively connected to the first and second boosting capacitors via a charge-sharing transistor, the third boosting capacitor being connected to one end of a load resistor to generate an output signal at the other end of the load resistor when the charge sharing transistor is enabled.
摘要:
The present invention relates to a flash memory device for read-out. The flash memory device comprises a pumping circuit for generating a pumping voltage higher than the power supply voltage depending on an enable signal generated when a standby mode, a read-out mode and a power supply voltage are set up, a capacitor for charging the potential depending on the pumping voltage of the pumping circuit, a word line decoder and a bit line decoder for decoding an address signal to select a word line and a bit line of a given cell from the flash memory cell array, and a word line driver and a bit line driver for applying a given voltage depending on an electric charge stored at the capacitor to the word line and the bit line of the selected cell in the flash memory cell array so that a read-out operation is performed. At this time, a voltage depending on the charge stored at the capacitor is applied to the word line driver and the bit line driver in the read-out mode. Therefore, lowering in the read-out speed by loading of the word line can be significantly improved.
摘要:
This invention relates to a flash memory device capable of performing a multi bit program by sequentially supplying a data stored on a data storage circuit to a word line coupled to a select gate of a memory cell selected by a row decoder when a program bias voltage is applied to a bit line.
摘要:
The present invention provides a method for programming and erasing a plurality of flash memory cells simultaneously while the power consumptions for those operations are significantly reduced, and the method for programming a memory cell of a flash memory device, wherein the memory cell is formed on a P-well surrounded by an N-well of a semiconductor substrate, including the steps of: applying a negative voltage to a control gate of the memory cell; applying a positive voltage to a drain of the memory cell; applying a positive voltage to the P-well, wherein the voltage is the same as or lower than the voltage applied to the drain; applying a power supply voltage to the N-well; and leaving a source of the memory cell uncoupled, wherein the steps are performed either in sequence or at random.