Crystallization apparatus, crystallization method, device and phase modulation element
    1.
    发明授权
    Crystallization apparatus, crystallization method, device and phase modulation element 有权
    结晶装置,结晶方法,装置及相位调制元件

    公开(公告)号:US08259375B2

    公开(公告)日:2012-09-04

    申请号:US12773577

    申请日:2010-05-04

    摘要: The present invention comprises a light modulation optical system having a first element which forms a desired light intensity gradient distribution to an incident light beam and a second element which forms a desired light intensity minimum distribution with an inverse peak shape to the same, and an image formation optical system which is provided between the light modulation optical system and a substrate having a polycrystal semiconductor film or an amorphous semiconductor film, wherein the incident light beam to which the light intensity gradient distribution and the light intensity minimum distribution are formed is applied to the polycrystal semiconductor film or the amorphous semiconductor film through the image formation optical system, thereby crystallizing a non-crystal semiconductor film. The pattern of the first element is opposed to the pattern of the second element.

    摘要翻译: 本发明包括光调制光学系统,其具有形成对入射光束的期望光强度梯度分布的第一元件和形成具有相反峰值形状的期望光强度最小分布的第二元件,以及图像 形成光学系统,其设置在光调制光学系统和具有多晶半导体膜或非晶半导体膜的基板之间,其中形成有光强度梯度分布和光强度最小分布的入射光束被施加到 多晶半导体膜或通过图像形成光学系统的非晶半导体膜,从而使非晶半导体膜结晶。 第一元件的图案与第二元件的图案相反。

    Crystallization apparatus, crystallization method, device, and light modulation element
    2.
    发明授权
    Crystallization apparatus, crystallization method, device, and light modulation element 有权
    结晶装置,结晶方法,装置和光调制元件

    公开(公告)号:US08009345B2

    公开(公告)日:2011-08-30

    申请号:US12962750

    申请日:2010-12-08

    IPC分类号: G02F1/01

    CPC分类号: B23K26/066

    摘要: A crystallization apparatus includes a light modulation element, and an image forming optical system that forms a light intensity distribution set based on light transmitted through the light modulation element on an irradiation surface. The crystallization apparatus irradiates a non-single crystal semiconductor film with light having the light intensity distribution to generate a crystallized semiconductor film. A curvature radius of at least one isointensity line of a light intensity substantially varies along the isointensity line in the light intensity distribution on the irradiation surface, and a curvature radius of at least a part of the isointensity line has a minimum value of 0.3 μm or below.

    摘要翻译: 结晶装置包括光调制元件和形成光学系统,其形成基于在照射表面上透过光调制元件的光的光强度分布。 结晶装置用具有光强度分布的光照射非单晶半导体膜以产生结晶半导体膜。 光强度的至少一个等距线的曲率半径沿着照射面上的光强度分布中的强度线实质上变化,并且至少部分等距线的曲率半径具有0.3μm的最小值或 下面。

    Light irradiation apparatus, light irradiation method, crystallization apparatus, crystallization method, and semiconductor device
    3.
    发明授权
    Light irradiation apparatus, light irradiation method, crystallization apparatus, crystallization method, and semiconductor device 有权
    光照射装置,光照射法,结晶装置,结晶法和半导体装置

    公开(公告)号:US07927421B2

    公开(公告)日:2011-04-19

    申请号:US11687113

    申请日:2007-03-16

    申请人: Yukio Taniguchi

    发明人: Yukio Taniguchi

    IPC分类号: C30B1/02

    摘要: A light irradiation apparatus irradiates a target plane with light having a predetermined light intensity distribution. The apparatus includes a light modulation element having a light modulation pattern of a periodic structure represented by a primitive translation vector (a1, a2), an illumination system for illuminating the modulation element with the light, and an image forming optical system for forming the predetermined light intensity distribution obtained by the modulation pattern on the target plane. A shape of an exit pupil of the illumination system is similar to the Wigner-Seitz cell of a primitive reciprocal lattice vector (b1, b2) obtained from the primitive translation vector (a1, a2) by the following equations: b1=2π(a2×a3)/(a1·(a2×a3)) and b2=2π(a3×a1)/(a1·(a2×a3)) in which a3 is a vector having an arbitrary size in a normal direction of a flat surface of the modulation pattern of the modulation element, “·” is an inner product of the vector, and “×” is an outer product of the vector.

    摘要翻译: 光照射装置用具有预定光强度分布的光照射目标平面。 该装置包括具有由原始平移向量(a1,a2)表示的周期性结构的光调制图案的光调制元件,用于用光照亮调制元件的照明系统,以及用于形成预定的 通过目标平面上的调制图案获得的光强度分布。 照明系统的出射光瞳的形状类似于通过以下等式从原始平移向量(a1,a2)获得的原始互逆格子向量(b1,b2)的Wigner-Seitz单元:b1 = 2&pgr a2×a3)/(a1·(a2×a3))和b2 = 2&pgr(a3×a1)/(a1·(a2×a3)),其中a3是在 调制元件的调制图案的平坦面,“·”是矢量的内积,“×”是矢量的外积。

    Light irradiation apparatus, light irradiation method, crystallization apparatus, crystallization method, device, and light modulation element
    4.
    发明授权
    Light irradiation apparatus, light irradiation method, crystallization apparatus, crystallization method, device, and light modulation element 有权
    光照射装置,光照射法,结晶装置,结晶方法,装置和光调制元件

    公开(公告)号:US07813022B2

    公开(公告)日:2010-10-12

    申请号:US11785314

    申请日:2007-04-17

    申请人: Yukio Taniguchi

    发明人: Yukio Taniguchi

    IPC分类号: G02B26/00

    摘要: A light irradiation apparatus includes a light modulation element which modulates a phase of an incident light beam to obtain a V-shaped light intensity distribution having a bottom portion of a minimum light intensity, and an image formation optical system which applies the modulated light beam from the light modulation element to an irradiation target surface in such a manner that the V-shaped light intensity distribution is provided on the irradiation target surface. The light modulation element has such a complex amplitude transmittance distribution that a secondary derivative of a phase value of a complex amplitude distribution becomes substantially zero at the bottom portion of the V-shaped light intensity distribution in an image space of the image formation optical system.

    摘要翻译: 光照射装置包括光调制元件,其调制入射光束的相位以获得具有最小光强度的底部的V形光强分布;以及图像形成光学系统,其施加来自 光调制元件以照射目标表面上的V形光强度分布的方式照射到照射目标表面。 光调制元件具有这样的复振幅透射率分布,使得复数振幅分布的相位值的二次导数在图像形成光学系统的图像空间中的V形光强度分布的底部处变为基本为零。

    CRYSTALLIZATION APPARATUS, CRYSTALLIZATION METHOD, DEVICE AND PHASE MODULATION ELEMENT
    5.
    发明申请
    CRYSTALLIZATION APPARATUS, CRYSTALLIZATION METHOD, DEVICE AND PHASE MODULATION ELEMENT 有权
    结晶装置,结晶方法,装置和相位调制元件

    公开(公告)号:US20100214641A1

    公开(公告)日:2010-08-26

    申请号:US12773577

    申请日:2010-05-04

    IPC分类号: G02F1/01

    摘要: The present invention comprises a light modulation optical system having a first element which forms a desired light intensity gradient distribution to an incident light beam and a second element which forms a desired light intensity minimum distribution with an inverse peak shape to the same, and an image formation optical system which is provided between the light modulation optical system and a substrate having a polycrystal semiconductor film or an amorphous semiconductor film, wherein the incident light beam to which the light intensity gradient distribution and the light intensity minimum distribution are formed is applied to the polycrystal semiconductor film or the amorphous semiconductor film through the image formation optical system, thereby crystallizing a non-crystal semiconductor film. The pattern of the first element is opposed to the pattern of the second element.

    摘要翻译: 本发明包括光调制光学系统,其具有形成对入射光束的期望光强度梯度分布的第一元件和形成具有相反峰值形状的期望光强度最小分布的第二元件,以及图像 形成光学系统,其设置在光调制光学系统和具有多晶半导体膜或非晶半导体膜的基板之间,其中形成有光强度梯度分布和光强度最小分布的入射光束被施加到 多晶半导体膜或通过图像形成光学系统的非晶半导体膜,从而使非晶半导体膜结晶。 第一元件的图案与第二元件的图案相反。

    ABERRATION MEASUREMENT APPARATUS AND ABERRATION MEASUREMENT METHOD
    8.
    发明申请
    ABERRATION MEASUREMENT APPARATUS AND ABERRATION MEASUREMENT METHOD 失效
    ABERRATION测量设备和测量方法

    公开(公告)号:US20090009751A1

    公开(公告)日:2009-01-08

    申请号:US12043657

    申请日:2008-03-06

    申请人: Yukio Taniguchi

    发明人: Yukio Taniguchi

    IPC分类号: G01J1/00

    CPC分类号: G01M11/0264 G01M11/0257

    摘要: An aberration measurement apparatus measures the aberration of an imaging optical system. The apparatus includes an illumination system, a separation member, and a measurement unit. The illumination system supplies the imaging optical system with measurement light used to measure an aberration of the imaging optical system and background light different from the measurement light. The separation member separates the measurement light and the background light which have passed through the imaging optical system. The measurement unit measures the aberration of the imaging optical system on the basis of the measurement light separated by the separation member.

    摘要翻译: 像差测量装置测量成像光学系统的像差。 该装置包括照明系统,分离构件和测量单元。 照明系统向成像光学系统提供用于测量成像光学系统的像差和与测量光不同的背景光的测量光。 分离构件分离已经通过成像光学系统的测量光和背景光。 测量单元基于由分离构件分离的测量光来测量成像光学系统的像差。

    CRYSTALLIZATION APPARATUS, CRYSTALLIZATION METHOD, DEVICE AND PHASE MODULATION ELEMENT
    9.
    发明申请
    CRYSTALLIZATION APPARATUS, CRYSTALLIZATION METHOD, DEVICE AND PHASE MODULATION ELEMENT 失效
    结晶装置,结晶方法,装置和相位调制元件

    公开(公告)号:US20070151507A1

    公开(公告)日:2007-07-05

    申请号:US11681030

    申请日:2007-03-01

    IPC分类号: C30B23/00 C30B25/00

    摘要: The present invention comprises a light modulation optical system having a first element which forms a desired light intensity gradient distribution to an incident light beam and a second element which forms a desired light intensity minimum distribution with an inverse peak shape to the same, and an image formation optical system which is provided between the light modulation optical system and a substrate having a polycrystal semiconductor film or an amorphous semiconductor film, wherein the incident light beam to which the light intensity gradient distribution and the light intensity minimum distribution are formed is applied to the polycrystal semiconductor film or the amorphous semiconductor film through the image formation optical system, thereby crystallizing a non-crystal semiconductor film. The pattern of the first element is opposed to the pattern of the second element.

    摘要翻译: 本发明包括光调制光学系统,其具有形成对入射光束的期望光强度梯度分布的第一元件和形成具有相反峰值形状的期望光强度最小分布的第二元件,以及图像 形成光学系统,其设置在光调制光学系统和具有多晶半导体膜或非晶半导体膜的基板之间,其中形成有光强度梯度分布和光强度最小分布的入射光束被施加到 多晶半导体膜或通过图像形成光学系统的非晶半导体膜,从而使非晶半导体膜结晶。 第一元件的图案与第二元件的图案相反。