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公开(公告)号：US08969794B2
公开(公告)日：2015-03-03
申请号：US14206524
申请日：2014-03-12
Applicant: 1st Detect Corporation
Inventor： James Wylde , David Rafferty , Michael Spencer
CPC classification number: H01J49/067 , H01J49/06 , H01J49/26 , H01J49/4265
Abstract: Systems and methods for automatic gain control in mass spectrometers are disclosed. An exemplary system may include a mass spectrometer, comprising a lens configured to receive a supply of ions, and a mass analyzer. The mass analyzer may include an ion trap for trapping the supplied ions. The mass analyzer may also include an ion detector for detecting ions that exit the ion trap. The lens may focus the ions non-uniformly based on mass of the ions to compensate for space charge effects reflected in a measurement output of the mass spectrometer. An exemplary method may include focusing an ion beam into a mass analyzer. The method may also include obtaining a mass spectrum and identifying a space charge characteristic based on the mass spectrum. The method may further include defocusing the lens based on the identified space charge characteristic, wherein defocusing the lens is configured to divert lighter ions away from the entrance aperture. The method may include obtaining a mass spectrum of a defocused ion beam generated from the sample.
Abstract translation: 公开了用于质谱仪中自动增益控制的系统和方法。 示例性系统可以包括质谱仪，其包括被配置为接收离子供应的透镜和质量分析器。 质量分析器可以包括用于捕获所提供的离子的离子阱。 质量分析器还可以包括用于检测离子离子的离子的离子检测器。 透镜可以基于离子质量不均匀地聚焦离子，以补偿在质谱仪的测量输出中反映的空间电荷效应。 示例性方法可以包括将离子束聚焦到质量分析器中。 该方法还可以包括获得质谱并基于质谱识别空间电荷特性。 该方法还可以包括基于所识别的空间电荷特性使透镜散焦，其中散焦透镜被配置为将较轻离子转移离开入口孔。 该方法可以包括获得从样品产生的散焦离子束的质谱。
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公开(公告)号：US20140299760A1
公开(公告)日：2014-10-09
申请号：US14206524
申请日：2014-03-12
Applicant: 1ST DETECT CORPORATION
Inventor： James Wylde , David Rafferty , Michael Spencer
CPC classification number: H01J49/067 , H01J49/06 , H01J49/26 , H01J49/4265
Abstract: Systems and methods for automatic gain control in mass spectrometers are disclosed. An exemplary system may include a mass spectrometer, comprising a lens configured to receive a supply of ions, and a mass analyzer. The mass analyzer may include an ion trap for trapping the supplied ions. The mass analyzer may also include an ion detector for detecting ions that exit the ion trap. The lens may focus the ions non-uniformly based on mass of the ions to compensate for space charge effects reflected in a measurement output of the mass spectrometer. An exemplary method may include focusing an ion beam into a mass analyzer. The method may also include obtaining a mass spectrum and identifying a space charge characteristic based on the mass spectrum. The method may further include defocusing the lens based on the identified space charge characteristic, wherein defocusing the lens is configured to divert lighter ions away from the entrance aperture. The method may include obtaining a mass spectrum of a defocused ion beam generated from the sample.
Abstract translation: 公开了用于质谱仪中自动增益控制的系统和方法。 示例性系统可以包括质谱仪，其包括被配置为接收离子供应的透镜和质量分析器。 质量分析器可以包括用于捕获所提供的离子的离子阱。 质量分析器还可以包括用于检测离子离子的离子的离子检测器。 透镜可以基于离子质量不均匀地聚焦离子，以补偿在质谱仪的测量输出中反映的空间电荷效应。 示例性方法可以包括将离子束聚焦到质量分析器中。 该方法还可以包括获得质谱并基于质谱识别空间电荷特性。 该方法还可以包括基于所识别的空间电荷特性使透镜散焦，其中散焦透镜被配置为将较轻离子转移离开入口孔。 该方法可以包括获得从样品产生的散焦离子束的质谱。
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公开(公告)号：US09599547B2
公开(公告)日：2017-03-21
申请号：US14270322
申请日：2014-05-05
Applicant: 1st Detect Corporation
Inventor： David Rafferty , Michael Spencer , James Wylde , Pedro Ojeda , Thomas Bowden
CPC classification number: G01N1/405 , G01N1/2214 , G01N7/04 , G01N30/08 , G01N30/6069 , G01N2030/085
Abstract: A chemical pre-concentrator includes a conduit defining a flow path between two ends and having a heating element disposed within the conduit, such that the heating element has at least one sorbent material deposited directly on at least a portion of a conductive surface of the heating element. Some such heating elements are in the form of electrically conductive strips defining both a plurality of apertures through the strip and a series of undulations spaced along the flow path.
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4.发明授权公开(公告)号：US09570282B2
公开(公告)日：2017-02-14
申请号：US14205905
申请日：2014-03-12
Applicant: 1ST DETECT CORPORATION
Inventor： Abrar Riaz , David Rafferty , James Wylde
CPC classification number: H01J49/107 , H01J49/147 , H01J49/162 , H01J49/42 , H01J49/4215
Abstract: A mass spectrometer is disclosed. The mass spectrometer may include an ion trap configured to trap and analyze an ionized sample. A first aperture may be provided having a first diameter, and a second aperture may be provided having a second diameter. The first aperture may be configured to receive electrons for the purpose of ionizing sample ions within the ion trap. The second aperture may be configured to receive photons for the purpose of ionizing sample ions within the ion trap.
Abstract translation: 公开了一种质谱仪。 质谱仪可以包括被配置为捕获和分析电离样品的离子阱。 可以提供具有第一直径的第一孔，并且可以设置具有第二直径的第二孔。 第一孔可以被配置为接收电子以便离子阱内的样品离子离子化。 第二孔可以被配置为接收光子以便离子阱内的样品离子离子化。
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公开(公告)号：US09035244B2
公开(公告)日：2015-05-19
申请号：US14202531
申请日：2014-03-10
Applicant: 1st Detect Corporation
Inventor： David Rafferty , Michael Spencer , James Wylde , David Lorenz Gardner , Warren Mino
CPC classification number: H01J49/147 , H01J49/0013 , H01J49/0031 , H01J49/067 , H01J49/424 , H01J49/4265
Abstract: A method and apparatus for performing mass spectrometry using an electron source, an ion trap, and a voltage-controlled lens located between the electron source and the ion trap. A controller applies a voltage to the lens. Features of the resulting output spectrum can be analyzed to determine whether to adjust the lens voltage.
Abstract translation: 使用位于电子源和离子阱之间的电子源，离子阱和电压控制透镜进行质谱分析的方法和装置。 控制器向镜头施加电压。 可以分析产生的输出光谱的特征，以确定是否调整透镜电压。
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Patent Agency Ranking
公开(公告)号：US20140252215A1
公开(公告)日：2014-09-11
申请号：US13794779
申请日：2013-03-11
Applicant: 1st Detect Corporation
Inventor： David Rafferty , James Wylde , Michael Spencer , Warren Mino
IPC: H01J49/00
CPC classification number: H01J49/0009
Abstract: Systems and methods are disclosed for calibrating mass spectrometers. In accordance with one implementation, a system comprises a calibrant chamber within a housing of a mass spectrometer. The system also comprises a permeation tube enclosed within the calibrant chamber, wherein the tube contains a calibrant chemical that continuously outgasses the calibrant chemical. The outgassed calibrant chemical may be introduced to the mass spectrometer for analysis. The system may also comprise a heating block to control the temperature of the calibrant chemical. The system may further comprise a valve that introduces a known amount of the calibrant chemical into the calibrant chamber. In accordance with the present disclosure, systems and methods are provided for calibrating a mass spectrometer abundance scale.
Abstract translation: 公开了用于校准质谱仪的系统和方法。 根据一个实施方案，系统包括在质谱仪的壳体内的校准室。 该系统还包括封闭在校准物室内的渗透管，其中管含有连续排出校准物质的校准物质。 可以将去气的校准物质引入质谱仪进行分析。 该系统还可以包括加热块以控制校准物质的温度。 该系统还可以包括将已知量的校准物质引入校准物室的阀。 根据本公开，提供了用于校准质谱仪丰度标度的系统和方法。
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公开(公告)号：US09804141B2
公开(公告)日：2017-10-31
申请号：US14280175
申请日：2014-05-16
Applicant: 1ST DETECT CORPORATION
Inventor： Guido Fridolin Verbeck, IV , David Rafferty , James Wylde , Michael Spencer
CPC classification number: G01N33/227 , G01N1/28 , G01N1/4022 , G01N1/4044 , G01N1/44 , G01N33/0057 , G01N2001/022 , G01N2001/383 , Y10T436/147777 , Y10T436/173076 , Y10T436/173845 , Y10T436/25375
Abstract: Methods, devices, and systems are disclosed for releasing a sample from a carrier medium. A method of releasing a sample from a carrier medium comprises treating a sample on a carrier medium with a first organic reagent, wherein when the sample contains at least one inorganic salt, the first organic reagent binds to a cation of the inorganic salt to produce both a first volatile compound and an isolated anion of the inorganic salt; treating the sample on the carrier medium with a second organic reagent, wherein the second organic reagent reacts with the isolated anion to produce a second volatile compound; and releasing the treated sample from the carrier medium, wherein when the first and the second volatile compounds are produced, the releasing step releases at least one of the first and second volatile compounds from the carrier medium.
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公开(公告)号：US20150228468A1
公开(公告)日：2015-08-13
申请号：US14600851
申请日：2015-01-20
Applicant: 1st Detect Corporation
Inventor： James Wylde , David Rafferty , Michael Spencer
CPC classification number: H01J49/067 , H01J49/06 , H01J49/26 , H01J49/4265
Abstract: Systems and methods for automatic gain control in mass spectrometers are disclosed. An exemplary system may include a mass spectrometer, comprising a lens configured to receive a supply of ions, and a mass analyzer. The mass analyzer may include an ion trap for trapping the supplied ions. The mass analyzer may also include an ion detector for detecting ions that exit the ion trap. The lens may focus the ions non-uniformly based on mass of the ions to compensate for space charge effects reflected in a measurement output of the mass spectrometer.
Abstract translation: 公开了用于质谱仪中自动增益控制的系统和方法。 示例性系统可以包括质谱仪，其包括被配置为接收离子供应的透镜和质量分析器。 质量分析器可以包括用于捕获所提供的离子的离子阱。 质量分析器还可以包括用于检测离子离子的离子的离子检测器。 透镜可以基于离子质量不均匀地聚焦离子，以补偿在质谱仪的测量输出中反映的空间电荷效应。
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公开(公告)号：US08975573B2
公开(公告)日：2015-03-10
申请号：US13794779
申请日：2013-03-11
Applicant: 1st Detect Corporation
Inventor： David Rafferty , James Wylde , Michael Spencer , Warren Mino
IPC: H01J49/00
CPC classification number: H01J49/0009
Abstract: Systems and methods are disclosed for calibrating mass spectrometers. In accordance with one implementation, a system comprises a calibrant chamber within a housing of a mass spectrometer. The system also comprises a permeation tube enclosed within the calibrant chamber, wherein the tube contains a calibrant chemical that continuously outgasses the calibrant chemical. The outgassed calibrant chemical may be introduced to the mass spectrometer for analysis. The system may also comprise a heating block to control the temperature of the calibrant chemical. The system may further comprise a valve that introduces a known amount of the calibrant chemical into the calibrant chamber. In accordance with the present disclosure, systems and methods are provided for calibrating a mass spectrometer abundance scale.
Abstract translation: 公开了用于校准质谱仪的系统和方法。 根据一个实施方案，系统包括在质谱仪的壳体内的校准室。 该系统还包括封闭在校准物室内的渗透管，其中管含有连续排出校准物质的校准物质。 可以将去气的校准物质引入质谱仪进行分析。 该系统还可以包括加热块以控制校准物质的温度。 该系统还可以包括将已知量的校准物质引入校准物室的阀。 根据本公开，提供了用于校准质谱仪丰度标度的系统和方法。
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公开(公告)号：US09472388B2
公开(公告)日：2016-10-18
申请号：US14600851
申请日：2015-01-20
Applicant: 1st Detect Corporation
Inventor： James Wylde , David Rafferty , Michael Spencer
CPC classification number: H01J49/067 , H01J49/06 , H01J49/26 , H01J49/4265
Abstract: Systems and methods for automatic gain control in mass spectrometers are disclosed. An exemplary system may include a mass spectrometer, comprising a lens configured to receive a supply of ions, and a mass analyzer. The mass analyzer may include an ion trap for trapping the supplied ions. The mass analyzer may also include an ion detector for detecting ions that exit the ion trap. The lens may focus the ions non-uniformly based on mass of the ions to compensate for space charge effects reflected in a measurement output of the mass spectrometer.
Abstract translation: 公开了用于质谱仪中自动增益控制的系统和方法。 示例性系统可以包括质谱仪，其包括被配置为接收离子供应的透镜和质量分析器。 质量分析器可以包括用于捕获所提供的离子的离子阱。 质量分析器还可以包括用于检测离子离子的离子的离子检测器。 透镜可以基于离子质量不均匀地聚焦离子，以补偿在质谱仪的测量输出中反映的空间电荷效应。
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