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1.
公开(公告)号:US10920313B2
公开(公告)日:2021-02-16
申请号:US16326973
申请日:2017-07-05
申请人: ADEKA CORPORATION
IPC分类号: C23C16/18 , C07C251/08 , C07F13/00 , C07F15/04 , C23C16/455
摘要: A diazadienyl compound represented by General Formula (I) below: wherein R1 represents a C1-6 linear or branched alkyl group, and M represents nickel atom or manganese atom. In particular, since a compound in which R1 in General Formula (I) is a methyl group has a high vapor pressure and a high thermal decomposition starting temperature, the compound is useful as a raw material for forming a thin film by a CVD method or ALD method.
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公开(公告)号:US10253408B2
公开(公告)日:2019-04-09
申请号:US15559127
申请日:2016-05-17
申请人: ADEKA CORPORATION
发明人: Tomoharu Yoshino , Masaki Enzu , Akihiro Nishida , Nana Sugiura
IPC分类号: C07F13/00 , C07F15/04 , C07F15/06 , C23C16/18 , H01L21/285
摘要: A novel compound represented by the general formula (I) or (II) below: [in the formula, each of R1 and R2 independently represent a C1˜12 hydrocarbon group, and Si(R3)3 is optionally substituted for a hydrogen atom in the hydrocarbon group; however, R1 and R2 are different groups; R3 represents a methyl or ethyl group; M represents a metal atom or silicon atom; and n is an integer from 1 to 4].
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公开(公告)号:US12104245B2
公开(公告)日:2024-10-01
申请号:US17771181
申请日:2020-10-19
申请人: ADEKA CORPORATION
发明人: Atsushi Sakurai , Masako Hatase , Masaki Enzu , Keisuke Takeda , Ryota Fukushima , Atsushi Yamashita
IPC分类号: C23C16/18 , C07D487/10 , C07F1/00 , C07F3/00 , C07F7/22 , C07F13/00 , C07F15/04 , C07F15/06 , C23C16/455
CPC分类号: C23C16/18 , C07D487/10 , C07F1/005 , C07F3/003 , C07F7/2284 , C07F13/005 , C07F15/045 , C07F15/065 , C23C16/45553
摘要: Provided is a thin-film forming raw material containing a compound represented by the following formula (1):
in the formula (1), R1 to R5 each independently represent a hydrogen atom, an alkyl group having 1 to 5 carbon atoms, or a group containing a fluorine atom, M represents a metal atom, and “n” represents a valence of the metal atom represented by M, provided that at least one of R2, R3, and R4 represents the group containing a fluorine atom.-
公开(公告)号:US11408069B2
公开(公告)日:2022-08-09
申请号:US17291446
申请日:2019-10-28
申请人: ADEKA CORPORATION
发明人: Akihiro Nishida , Masaki Enzu
IPC分类号: C23C16/455 , C23C16/18
摘要: A method of the present invention for producing a metallic ruthenium thin film on a substrate by atomic layer deposition includes: (A) a step of introducing a feedstock gas containing a specific ruthenium compound into a treatment atmosphere, and allowing the ruthenium compound to deposit on the substrate; and a step of introducing a reactive gas containing a specific compound into the treatment atmosphere, and allowing the reactive gas to react with the specific ruthenium compound deposited on the substrate.
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公开(公告)号:US10011623B2
公开(公告)日:2018-07-03
申请号:US15318755
申请日:2015-07-16
申请人: ADEKA CORPORATION
发明人: Atsushi Sakurai , Masako Hatase , Tomoharu Yoshino , Masaki Enzu
IPC分类号: C07F15/06 , C07F15/04 , C07C251/08 , C07F7/08 , C07C251/76 , C07F7/10 , C23C16/18
CPC分类号: C07F15/065 , C07C251/08 , C07C251/76 , C07F7/081 , C07F7/10 , C07F15/04 , C07F15/045 , C07F15/06 , C23C16/18 , C23C16/45525
摘要: The alkoxide compound of the present invention is characteristically represented by the following general formula (I):
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6.
公开(公告)号:US09994593B2
公开(公告)日:2018-06-12
申请号:US15306812
申请日:2015-04-08
申请人: ADEKA CORPORATION
IPC分类号: C07F1/08 , C07C215/08 , C23C16/18 , H01L21/28 , H01L21/285 , C09D1/00 , C09D5/24 , C23C16/06 , C23C16/455
CPC分类号: C07F1/08 , C07C215/08 , C09D1/00 , C09D5/24 , C23C16/06 , C23C16/18 , C23C16/45525 , C23C16/45542 , C23C16/45553 , H01L21/28 , H01L21/285
摘要: This invention provides a copper compound represented by General Formula (I) below. In General Formula (I), R1 to R3 independently represent a linear or branched alkyl group with a carbon number of 1 to 5; provided that R1 and R2 are a methyl group, R3 represents a linear or branched alkyl group with a carbon number of 2 to 5; and provided that R1 is a methyl group and R2 is an ethyl group, R3 represents a methyl group or a linear or branched alkyl group with a carbon number of 3 to 5. A starting material for forming a thin film of the present invention includes the copper compound represented by General Formula (I). The present invention can provide a copper compound which has a low melting point, can be conveyed in a liquid state, has a high vapor pressure, and is easily vaporizable, and also a starting material for forming a thin film which uses such a copper compound.
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7.
公开(公告)号:US11760771B2
公开(公告)日:2023-09-19
申请号:US16760171
申请日:2018-07-27
申请人: ADEKA CORPORATION
发明人: Tomoharu Yoshino , Masaki Enzu , Nana Okada , Masako Hatase
IPC分类号: C07F15/00 , C23C16/18 , C23C16/455 , H01L21/285
CPC分类号: C07F15/0046 , C23C16/18 , C23C16/45525 , C23C16/45553 , H01L21/28556 , H01L21/28568
摘要: A ruthenium compound represented by a general formula described in the specification, a raw material which is for forming a thin film and which contains the ruthenium compound, and a method of producing a thin film using the raw material for forming a thin film are provided.
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公开(公告)号:US10351584B2
公开(公告)日:2019-07-16
申请号:US15303845
申请日:2015-03-30
申请人: ADEKA CORPORATION
发明人: Atsushi Sakurai , Masako Hatase , Tomoharu Yoshino , Masaki Enzu
IPC分类号: C07F15/06 , C07C251/08 , C23C16/18 , H01L21/28 , H01L21/285 , C23C16/455
摘要: An alkoxide compound is represented by General Formula (I) below: wherein R1 to R3 each independently represent hydrogen, a C1-12 hydrocarbon group, etc.; R4 represents a C1-12 hydrocarbon group, etc.; L represents hydrogen, halogen, a hydroxyl group, an amino group, an azi group, a phosphido group, a nitrile group, a carbonyl group, a C1-12 hydrocarbon group, etc.; and M represents a metal atom or a silicon atom, n represents an integer of 1 or more, m represents an integer of 0 or more, and n+m represents the valence of the metal atom or silicon atom.
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9.
公开(公告)号:US10167304B2
公开(公告)日:2019-01-01
申请号:US15032230
申请日:2014-11-07
申请人: ADEKA CORPORATION
发明人: Masako Hatase , Masaki Enzu , Atsushi Sakurai , Tomoharu Yoshino
IPC分类号: C07F15/00 , C07C225/14 , C23C16/16 , C23C16/455
摘要: Disclosed is a ruthenium compound useful as a precursor in chemical vapor growth, particularly ALD. The compound has good reactivity with a reactive gas, a high vapor pressure, and a low melting point. The compound is represented by general formula (I), wherein R1, R2, and R3 each independently represent a straight or branched chain alkyl group having 1 to 5 carbon atoms, provided that the total number of the carbon atoms of R1 and R2 is 3 to 10. In formula (I), R1 and R2 are each preferably ethyl or isopropyl.
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