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公开(公告)号：US09843337B1
公开(公告)日：2017-12-12
申请号：US15460433
申请日：2017-03-16
Applicant: Analog Devices Global
Inventor： Zhao Li , Trevor Clifford Caldwell , David Nelson Alldred , Yunzhi Dong , Prawal Man Shrestha , Jialin Zhao , Hajime Shibata , Victor Kozlov , Richard E. Schreier , Wenhua W. Yang
CPC classification number: H03M1/1023 , H03M1/0673 , H03M1/1009 , H03M1/12 , H03M1/361 , H03M3/384 , H03M3/414
Abstract: Analog-to-digital converters (ADCs) can be used inside ADC architectures, such as delta-sigma ADCs. The error in such internal ADCs can degrade performance. To calibrate the errors in an internal ADC, comparator offsets of the internal ADC can be estimated by computing a mean of each comparator of the internal ADC. Relative differences in the computed means serves as estimates for comparator offsets. If signal paths in the internal ADC are shuffled, the estimation of comparator offsets can be performed in the background without interrupting normal operation. Shuffling of signal paths may introduce systematic measurement errors, which can be measured and reversed to improve the estimation of comparator offsets.
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公开(公告)号：US10056914B2
公开(公告)日：2018-08-21
申请号：US15282586
申请日：2016-09-30
Applicant: ANALOG DEVICES GLOBAL
Inventor： Zhao Li , Hajime Shibata , Trevor Clifford Caldwell , Richard E. Schreier , Victor Kozlov , David Nelson Alldred , Prawal Man Shrestha
CPC classification number: H03M1/1023 , H03M1/1004 , H03M1/1038 , H03M1/1085 , H03M1/361 , H03M3/378 , H03M3/384
Abstract: A flash analog-to-digital converter (ADC) includes comparators that convert an analog input signal to a digital output signal. Offsets of these comparators introduce noise and can hurt the performance of the ADC. Thus, these comparators are calibrated using calibration codes. Conventional calibration methods determine these calibration codes by removing the ADC from an input signal. Otherwise, it is difficult to distinguish the noise from the signal in the calibration measurement. In contrast, an embodiment can determine the calibration codes while the ADC converts the input signal to a digital signal. Such an embodiment can be achieved by a frequency-domain technique. In an embodiment employing a frequency-domain power meter, an input signal can be removed from the power measurement. This removal enables accurate measurement of in-band noise without having the measurement be corrupted by input signal power.
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公开(公告)号：US09912342B2
公开(公告)日：2018-03-06
申请号：US15369175
申请日：2016-12-05
Applicant: Analog Devices Global
Inventor： Zhao Li , Hajime Shibata , Trevor Clifford Caldwell , Yunzhi Dong , Jialin Zhao , Richard E. Schreier , Victor Kozlov , David Nelson Alldred , Prawal Man Shrestha
CPC classification number: H03M1/1009 , H03M1/0626 , H03M1/066 , H03M1/1245 , H03M1/34 , H03M3/388 , H03M3/422
Abstract: An analog-to-digital converter (ADC) is a device that can include a reference shuffler and a loop filter. An ADC can achieve better performance with incremental adjustment of a pointer of the reference shuffler, changing coefficients of the loop filter, and storing calibration codes of the ADC in a non-volatile memory. By incrementally adjusting a pointer of the reference shuffler, a calibration can be performed more efficiently than with a random adjustment of the pointer. By temporarily changing the loop filter coefficients, a greater amount of activity can be introduced into the loop filter. This activity can allow the calibration to proceed more efficiently. By storing the calibration codes in a non-volatile memory, a search space for calibration codes can be reduced. Thus, a calibration can occur more quickly, and the calibration itself can be improved.
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