METHODS FOR FORMING LOW RESISTIVITY INTERCONNECTS
    1.
    发明申请
    METHODS FOR FORMING LOW RESISTIVITY INTERCONNECTS 有权
    形成低电阻互连的方法

    公开(公告)号:US20160372371A1

    公开(公告)日:2016-12-22

    申请号:US15189768

    申请日:2016-06-22

    CPC classification number: H01L21/28518 H01L23/485 H01L23/53209 H01L23/53219

    Abstract: Embodiments described herein generally relate to methods for forming silicide materials. Silicide materials formed according to the embodiments described herein may be utilized as contact and/or interconnect structures and may provide advantages over conventional silicide formation methods. In one embodiment, a one or more transition metal and aluminum layers may be deposited on a silicon containing substrate and a transition metal layer may be deposited on the one or more transition metal and aluminum layers. An annealing process may be performed to form a metal silicide material.

    Abstract translation: 本文所述的实施方案一般涉及形成硅化物材料的方法。 根据本文所述的实施方案形成的硅化物材料可以用作接触和/或互连结构,并且可以提供优于常规硅化物形成方法的优点。 在一个实施例中,一个或多个过渡金属和铝层可以沉积在含硅衬底上,并且过渡金属层可以沉积在一个或多个过渡金属和铝层上。 可以进行退火工艺以形成金属硅化物材料。

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