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公开(公告)号:US20210391147A1
公开(公告)日:2021-12-16
申请号:US16898650
申请日:2020-06-11
Applicant: Applied Materials, Inc.
Inventor: Gaosheng FU , Tuan Anh NGUYEN , Amit Kumar BANSAL
Abstract: The present disclosure provides an apparatus including a chamber body and a lid defining a volume therein. The apparatus includes a substrate support disposed in the volume opposite the lid. The substrate support includes a support body disposed on a stem, and a ground plate disposed between the support body and the stem. A top flange is coupled to a lower peripheral surface the ground plate and a bottom flange is coupled to a bottom of the chamber body. The bottom flange and the top flange is coupled to one another with a plurality of straps, each of the straps having a first end coupled to the bottom flange and a second end coupled to the top flange.
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公开(公告)号:US20190100839A1
公开(公告)日:2019-04-04
申请号:US16192228
申请日:2018-11-15
Applicant: Applied Materials, Inc.
Inventor: Amit Kumar BANSAL , Juan Carlos ROCHA-ALVAREZ , Sanjeev BALUJA , Sam H. KIM , Tuan Anh NGUYEN
IPC: C23C16/455
Abstract: The present disclosure relates to a semiconductor processing apparatus. The processing chamber includes a chamber body and lid defining an interior volume, a substrate support disposed in the interior volume and a showerhead assembly disposed between the lid and the substrate support. The showerhead assembly includes a faceplate configured to deliver a process gas to a processing region defined between the showerhead assembly and the substrate support and an underplate positioned above the faceplate, defining a first plenum between the lid and the underplate, the having multiple zones, wherein each zone has a plurality of openings that are configured to pass an amount of inert gas from the first plenum into a second plenum defined between the faceplate and the underplate, in fluid communication with the plurality of openings of each zone such that the inert gas mixes with the process gas before exiting the showerhead assembly.
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公开(公告)号:US20180096874A1
公开(公告)日:2018-04-05
申请号:US15705031
申请日:2017-09-14
Applicant: Applied Materials, Inc.
Inventor: Jason M. SCHALLER , Michael Paul ROHRER , Tuan Anh NGUYEN , William Tyler WEAVER , Gregory John FREEMAN , Robert Brent VOPAT
IPC: H01L21/68 , H01L21/02 , H01L21/687 , C23C16/458 , C23C16/455 , C23C16/52 , G05B19/418
CPC classification number: H01L21/68 , C23C16/45565 , C23C16/458 , C23C16/4584 , C23C16/52 , G05B19/418 , G05B2219/45031 , H01L21/022 , H01L21/02271 , H01L21/68785
Abstract: A method and apparatus for of improving processing results in a processing chamber by orienting a substrate support relative to a surface within the processing chamber. The method comprising orienting a supporting surface of a substrate support in a first orientation relative to an output surface of a showerhead, where the first orientation of the supporting surface relative to the output surface is not coplanar, and depositing a first layer of material on a substrate disposed on the supporting surface that is oriented in the first orientation
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公开(公告)号:US20230047451A1
公开(公告)日:2023-02-16
申请号:US17974408
申请日:2022-10-26
Applicant: Applied Materials, Inc.
Inventor: Nitin PATHAK , Amit Kumar BANSAL , Tuan Anh NGUYEN , Thomas RUBIO , Badri N. RAMAMURTHI , Juan Carlos ROCHA-ALVAREZ
IPC: C23C16/458 , C23C16/455 , C23C16/44
Abstract: Aspects of the present disclosure relate generally to isolator devices, components thereof, and methods associated therewith for substrate processing chambers. In one implementation, a substrate processing chamber includes an isolator ring disposed between a pedestal and a pumping liner. The isolator ring includes a first surface that faces the pedestal, the first surface being disposed at a gap from an outer circumferential surface of the pedestal. The isolator ring also includes a second surface that faces the pumping liner and a protrusion that protrudes from the first surface of the isolator ring and towards the outer circumferential surface of the pedestal. The protrusion defines a necked portion of the gap between the pedestal and the isolator ring.
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公开(公告)号:US20200263301A1
公开(公告)日:2020-08-20
申请号:US16867307
申请日:2020-05-05
Applicant: Applied Materials, Inc.
Inventor: Amit Kumar BANSAL , Juan Carlos ROCHA-ALVAREZ , Sanjeev BALUJA , Sam H. KIM , Tuan Anh NGUYEN
IPC: C23C16/455
Abstract: The present disclosure relates to a semiconductor processing apparatus. The processing chamber includes a chamber body and lid defining an interior volume, a substrate support disposed in the interior volume and a showerhead assembly disposed between the lid and the substrate support. The showerhead assembly includes a faceplate configured to deliver a process gas to a processing region defined between the showerhead assembly and the substrate support and an underplate positioned above the faceplate, defining a first plenum between the lid and the underplate, the having multiple zones, wherein each zone has a plurality of openings that are configured to pass an amount of inert gas from the first plenum into a second plenum defined between the faceplate and the underplate, in fluid communication with the plurality of openings of each zone such that the inert gas mixes with the process gas before exiting the showerhead assembly.
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公开(公告)号:US20200035522A1
公开(公告)日:2020-01-30
申请号:US16588959
申请日:2019-09-30
Applicant: Applied Materials, Inc.
Inventor: Tuan Anh NGUYEN , Amit Kumar BANSAL , Juan Carlos ROCHA-ALVAREZ
IPC: H01L21/67 , H01L21/687 , H01L21/02
Abstract: A method and apparatus for processing a semiconductor is disclosed herein. In one embodiment, a processing system for semiconductor processing is disclosed. The processing chamber includes two transfer chambers, a processing chamber, and a rotation module. The processing chamber is coupled to the transfer chamber. The rotation module is positioned between the transfer chambers. The rotation module is configured to rotate the substrate. The transfer chambers are configured to transfer the substrate between the processing chamber and the transfer chamber. In another embodiment, a method for processing a substrate on the apparatus is disclosed herein.
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公开(公告)号:US20210395881A1
公开(公告)日:2021-12-23
申请号:US16904169
申请日:2020-06-17
Applicant: Applied Materials, Inc.
Inventor: Amit Kumar BANSAL , Saket RATHI , Tuan Anh NGUYEN
IPC: C23C16/04
Abstract: Embodiments of the disclosure relate to faceplates for a processing chamber. In one example, a faceplate includes a body having a plurality of apertures formed therethrough. A heating element is disposed within the body, and the heating element circumscribes the plurality of apertures. A support ring is disposed in the body. The support ring circumscribes the heating element. The support ring includes a main body and a cantilever extending radially inward from the main body. The cantilever contacts the body of the faceplate.
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公开(公告)号:US20210032748A1
公开(公告)日:2021-02-04
申请号:US16941994
申请日:2020-07-29
Applicant: Applied Materials, Inc.
Inventor: Luke BONECUTTER , David BLAHNIK , Tuan Anh NGUYEN , Amit Kumar BANSAL
IPC: C23C16/458 , H01J37/32 , C23C16/505
Abstract: Embodiments presented herein are directed to radio frequency (RF) grounding in process chambers. In one embodiment, a dielectric plate is disposed between a chamber body and a lid of a process chamber. The dielectric plate extends laterally into a volume defined by the chamber body and the lid. A substrate support is disposed in the volume opposite the lid. The substrate support includes a support body disposed on a stem. The support body includes a central region and a peripheral region. The peripheral region is radially outward of the central region. The central region has a thickness less than a thickness of the peripheral region. A flange is disposed adjacent to a bottom surface of the peripheral region. The flange extends radially outward from an outer edge of the peripheral region. A bellows is disposed on the flange and configured to sealingly couple to the dielectric plate.
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公开(公告)号:US20170101712A1
公开(公告)日:2017-04-13
申请号:US14965061
申请日:2015-12-10
Applicant: Applied Materials, Inc.
Inventor: Amit Kumar BANSAL , Juan Carlos ROCHA-ALVAREZ , Sanjeev BALUJA , Sam H. KIM , Tuan Anh NGUYEN
IPC: C23C16/455
CPC classification number: C23C16/45565 , C23C16/45574
Abstract: The present disclosure relates to a semiconductor processing apparatus. The processing chamber includes a chamber body and lid defining an interior volume, a substrate support disposed in the interior volume and a showerhead assembly disposed between the lid and the substrate support. The showerhead assembly includes a faceplate configured to deliver a process gas to a processing region defined between the showerhead assembly and the substrate support and a underplate positioned above the faceplate, defining a first plenum between the lid and the underplate, the having multiple zones, wherein each zone has a plurality of openings that are configured to pass an amount of inert gas from the first plenum into a second plenum defined between the faceplate and the underplate, in fluid communication with the plurality of openings of each zone such that the inert gas mixes with the process gas before exiting the showerhead assembly.
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公开(公告)号:US20150262859A1
公开(公告)日:2015-09-17
申请号:US14632648
申请日:2015-02-26
Applicant: APPLIED MATERIALS, INC.
Inventor: Ganesh BALASUBRAMANIAN , Juan Carlos ROCHA-ALVAREZ , Ramprakash SANKARAKRISHNAN , Robert KIM , Dale R. DU BOIS , Kirby Hane FLOYD , Amit Kumar BANSAL , Tuan Anh NGUYEN
IPC: H01L21/687 , H01L21/02 , C23C16/458
CPC classification number: H01L21/02274 , C23C16/4584 , C23C16/4585 , C23C16/505 , C23C16/5096 , H01J37/32082 , H01J37/32568 , H01J37/32623 , H01J37/32715 , H01J37/32724 , H01J37/32743 , H01J2237/3321 , H01L21/67103 , H01L21/68735 , H01L21/68742 , H01L21/68764 , H01L21/68792
Abstract: A method and apparatus for processing a substrate are provided. The apparatus includes a pedestal and rotation member, both of which are moveably disposed within a processing chamber. The rotation member is adapted to rotate a substrate disposed in the chamber. The substrate may be supported by an edge ring during processing. The edge ring may selectively engage either the pedestal or the rotation member. In one embodiment, the edge ring engages the pedestal during a deposition process and the edge ring engages the rotation member during rotation of the substrate. The rotation of the substrate during processing may be discrete or continuous.
Abstract translation: 提供了一种用于处理衬底的方法和设备。 该装置包括基座和旋转构件,两者都可移动地设置在处理室内。 旋转构件适于旋转设置在腔室中的衬底。 衬底可以在加工过程中被边缘环支撑。 边缘环可以选择性地接合基座或旋转构件。 在一个实施例中,边缘环在沉积工艺期间接合基座,并且边缘环在基底旋转期间接合旋转构件。 处理过程中衬底的旋转可以是离散的或连续的。
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