Abstract:
Various implementations described herein refer to a method for providing single port memory with a bitcell array arranged in columns and rows. The method may include coupling a wordline to the single port memory including coupling the wordline to the columns of the bitcell array. The method may include performing multiple memory access operations concurrently in the single port memory including performing a read operation in one column of the bitcell array using the wordline while performing a write operation in another column of the bitcell array using the wordline, or performing a write operation in one column of the bitcell array using the wordline while performing a read operation in another column of the bitcell array using the same wordline.
Abstract:
Various implementations described herein refer to a method for providing single port memory with multiple different banks having a first bank and a second bank that is different than the first bank. The method may include coupling multiple wordlines to the single port memory including coupling a first wordline to the first bank and coupling a second wordline to the second bank. The method may include performing multiple memory access operations concurrently in the single port memory.
Abstract:
Within a memory 2 comprising an array 4 of bit cells 6 write driver circuitry 14 uses a boosted write signal which is boosted to a lower than normal level during a write operation. Column select transistors 16 are driven by column select circuitry 12. The column select signal is boosted to a lower than normal level when a column is unselected and to higher than a normal level when a column is selected. Voltage boost circuitry, such as charge pumps 20, 22 are employed within the column select circuitry 12 to achieve these boosted levels for the columns select signal.
Abstract:
A memory device includes an array of memory cells arranged as a plurality of rows and columns, each row being coupled to an associated read word line, and each column forming at least one column group, where the memory cells of each column group are coupled to an associated read bit line. Each column has an active mode of operation where a read operation may be performed on an activated memory cell within that column group, and a non-active mode of operation where the read operation is not performable. Precharge circuitry is used, for each column group, to precharge the associated read bit line to a first voltage level prior to the read operation. Each memory cell includes coupling circuitry connected between the associated read bit line and a reference line associated with the column group containing that memory cell.
Abstract:
Various implementations described herein are directed to a device having memory circuitry with a core array of bitcells. The device may include write assist circuitry having passgates coupled to the bitcells via bitlines. The passgates may include a first passgate coupled to the bitcells via a first bitline and a second passgate coupled to the bitcells via a second bitline, and a gate of the second passgate may be coupled to the first bitline.
Abstract:
Various implementations described herein are directed to a device having memory circuitry with a core array of bitcells. The device may include write assist circuitry having passgates coupled to the bitcells via bitlines. The passgates may include a first passgate coupled to the bitcells via a first bitline and a second passgate coupled to the bitcells via a second bitline, and a gate of the second passgate may be coupled to the first bitline.
Abstract:
Within a memory 2 comprising an array 4 of bit cells 6 write driver circuitry 14 uses a boosted write signal which is boosted to a lower than normal level during a write operation. Column select transistors 16 are driven by column select circuitry 12. The column select signal is boosted to a lower than normal level when a column is unselected and to higher than a normal level when a column is selected. Voltage boost circuitry, such as charge pumps 20, 22 are employed within the column select circuitry 12 to achieve these boosted levels for the columns select signal.
Abstract:
Within a memory 2 comprising an array 4 of bit cells 6 write driver circuitry 14 uses a boosted write signal which is boosted to a lower than normal level during a write operation. Column select transistors 16 are driven by column select circuitry 12. The column select signal is boosted to a lower than normal level when a column is unselected and to higher than a normal level when a column is selected. Voltage boost circuitry, such as charge pumps 20, 22 are employed within the column select circuitry 12 to achieve these boosted levels for the columns select signal.
Abstract:
Within a memory 2 comprising an array 4 of bit cells 6 write driver circuitry 14 uses a boosted write signal which is boosted to a lower than normal level during a write operation. Column select transistors 16 are driven by column select circuitry 12. The column select signal is boosted to a lower than normal level when a column is unselected and to higher than a normal level when a column is selected. Voltage boost circuitry, such as charge pumps 20, 22 are employed within the column select circuitry 12 to achieve these boosted levels for the columns select signal.
Abstract:
Memory circuitry is provided with write assist circuitry for generating a lower power supply voltage during write operations. The write assist circuitry includes a plurality of series connected switches including a header switch and a footer switch. Header bias circuitry generates a header bias voltage and footer bias circuitry generates a footer bias voltage. The header bias voltage is an analog signal with a voltage level intermediate between the power supply voltage level and the ground voltage level. The footer bias voltage is an analog signal with a voltage level intermediate between the power supply voltage level and the ground voltage level. During write operation target bit cells to be written are supplied with the power via a current path through the header switch while these are respectively controlled by the header bias voltage and the footer bias voltage.