摘要:
Systems and methods for determining one or more characteristics of a specimen using radiation in the terahertz range are provided. One system includes an illumination subsystem configured to illuminate the specimen with radiation. The system also includes a detection subsystem configured to detect radiation propagating from the specimen in response to illumination of the specimen and to generate output responsive to the detected radiation. The detected radiation includes radiation in the terahertz range. In addition, the system includes a processor configured to determine the one or more characteristics of the specimen using the output.
摘要:
Systems and methods for determining one or more characteristics of a specimen using radiation in the terahertz range are provided. One system includes an illumination subsystem configured to illuminate the specimen with radiation. The system also includes a detection subsystem configured to detect radiation propagating from the specimen in response to illumination of the specimen and to generate output responsive to the detected radiation. The detected radiation includes radiation in the terahertz range. In addition, the system includes a processor configured to determine the one or more characteristics of the specimen using the output.
摘要:
An interferometer system and method may be used to measure substrate thickness or shape. The system may include two spaced apart reference flats having that form an optical cavity between two parallel reference surfaces. A substrate holder may be configured to place the substrate in the cavity with first and second substrate surfaces substantially parallel with corresponding first and second reference surfaces such that a space between the first or second substrate surface is three millimeters or less from a corresponding one of the reference surfaces or a damping surface. Interferometer devices may be located on diametrically opposite sides of the cavity and optically coupled thereto. The interferometers can map variations in spacing between the substrate surfaces and the reference surfaces, respectively, through interference of light optically coupled to and from to the cavity via the interferometer devices.
摘要:
A system for inspecting specimens such as semiconductor wafers is provided. The system provides scanning of dual-sided specimens using a diffraction grating that widens and passes nth order (n>0) wave fronts to the specimen surface and a reflective surface for each channel of the light beam. Two channels and two reflective surfaces are preferably employed, and the wavefronts are combined using a second diffraction grating and passed to a camera system having a desired aspect ratio. The system preferably comprises a damping arrangement which filters unwanted acoustic and seismic vibration, including an optics arrangement which scans a first portion of the specimen and a translation or rotation arrangement for translating or rotating the specimen to a position where the optics arrangement can scan the remaining portion(s) of the specimen. The system further includes means for stitching scans together, providing for smaller and less expensive optical elements.
摘要:
What is disclosed is a rigid, one-piece, shaped body, made of a biaxially stretched synthetic resin in the form of a sheet at least 1 mm thick, the edge of which does not lie in a single plane, and the surface of which is smaller than a flat initial surface enclosed by the edge and preferably approximates the mathematically minimum surface enclosed by the edge, is suitable according to the invention as a lightweight building element having high resistance to buckling. The new shaped bodies are made by shaping a flat sheet of biaxially stretched synthetic resin at least 1 mm thick, while in the thermoelastic state, so that the edge of the sheet is brought into a configuration which does not lie in one plane, and the surface enclosed by the edge is allowed to shrink back partially while in the thermoelastic state, whereby a shrinkage of the edge of the sheet is prevented by clamping the edge, and the resulting shaped body is cooled below the softening temperature before the edge clamping is loosened.
摘要:
A system and method for in-line inspection of specimens such as semiconductor wafers is provided. The system provides scanning of sections of specimens having predetermined standardized characteristics using a diffraction grating that widens and passes nth order (n>0) wave fronts to the specimen surface and a reflective surface for the transmitted light beam. Light energy is transmitted in a narrow swath across the portion of the surface having the standardized features. The wavefronts are combined using a second diffraction grating and passed to a camera system having a desired aspect ratio.
摘要:
The present invention relates to a phospholipid dreivative having a substituted or unsubstituted polyhydroxylated aliphatic carbocycle attached to the sn-1 or sn-2 position of the glycerol backbone, a pharmaceutical composition comprising said phospholipid, a method for preparing said phospholipid and a medicament comprising said phospholipid.
摘要:
A system for inspecting specimens such as semiconductor wafers is provided. The system provides scanning of dual-sided specimens using a diffraction grating that widens and passes nth order (n>0) wave fronts to the specimen surface and a reflective surface for each channel of the light beam. Two channels and two reflective surfaces are preferably employed, and the wavefronts are combined using a second diffraction grating and passed to a camera system having a desired aspect ratio. The system preferably comprises a damping arrangement which filters unwanted acoustic and seismic vibration, including an optics arrangement which scans a first portion of the specimen and a translation or rotation arrangement for translating or rotating the specimen to a position where the optics arrangement can scan the remaining portion(s) of the specimen. The system further includes means for stitching scans together, providing for smaller and less expensive optical elements.
摘要:
A steam blower box unit having a steam blower box for applying steam to a passing material web, especially a paper or board web, and having a withdrawal device at least partly integrated in the steam blower box. The steam blower box, located opposite the material web in an operating position, can be moved out of its operating position laterally via the withdrawal device, that is to say generally transversely with respect to the web running direction, and can be moved into this operating position again from its lateral position. In this case, preferably the entire steam blower box can be moved appropriately via the withdrawal device.
摘要:
A motor housing for an electric motor has a generally cylindrical housing shell (10), which, at one end (26), accommodates a first bearing and a housing cover module (12) such that the housing cover module (12) closes an opposing, open end of the housing shell (10), and serves as a second bearing. The cover module (12) is preferably of metal material and is integrally formed with a plurality of projecting tab and/or arm portions (14, 16, 18). Around the housing shell (10), several recesses or slots (20) are formed, flanked by deformable elements (30,32). By axially applying a tool (60), the deformable elements are deformed to secure the tabs (14, 16, 18) within the slots (20) and to thereby connect the shell (10) and the cover module (12) axially together. The resulting structure is highly resistant to vibrational decoupling, and can readily be obtained by high-speed automated production steps.