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    INFORMATION PROCESSING APPARATUS, SAMENESS DETERMINATION SYSTEM, SAMENESS DETERMINATION METHOD, AND COMPUTER PROGRAM
    1.
    发明申请
    INFORMATION PROCESSING APPARATUS, SAMENESS DETERMINATION SYSTEM, SAMENESS DETERMINATION METHOD, AND COMPUTER PROGRAM 有权
    信息处理设备，SAMENESS确定系统，SAMENESS确定方法和计算机程序

    公开(公告)号：US20110305432A1

    公开(公告)日：2011-12-15

    申请号：US13155596

    申请日：2011-06-08

    申请人： Yoshihiro MANABE ,  Yuichi Abe ,  Hideki Noma ,  Tsugutomo Enami ,  Akifumi Kashiwagi ,  Itaru Kawakami

    发明人： Yoshihiro MANABE ,  Yuichi Abe ,  Hideki Noma ,  Tsugutomo Enami ,  Akifumi Kashiwagi ,  Itaru Kawakami

    IPC分类号： H04N5/92

    CPC分类号： H04N21/8133 ,  H04N21/44008 ,  H04N21/4884

    摘要： There is provided an information processing apparatus which includes a subtitle processing unit for extracting a subtitle feature quantity representing a feature of a content from subtitle information included in the content, a subtitle feature quantity accumulation unit for associating and storing identification information capable of identifying the content and the subtitle feature quantity extracted from the content by the subtitle processing unit, a subtitle feature quantity collation unit for collating the subtitle feature quantity stored in the subtitle feature quantity accumulation unit and a subtitle feature quantity to be determined, thereby determining sameness between the content corresponding to the subtitle feature quantity stored in the subtitle feature quantity accumulation unit and a content corresponding to the subtitle feature quantity to be determined, and a collation result output unit for outputting a collation result of the subtitle feature quantity collation unit.

    摘要翻译： 提供了一种信息处理装置，其包括字幕处理单元，用于从包括在内容中的字幕信息中提取表示内容的特征的字幕特征量;字幕特征量累积单元，用于关联并存储能够识别内容的标识信息 以及由字幕处理单元从内容提取的字幕特征量，用于对存储在字幕特征量累积单元中的字幕特征量与要确定的字幕特征量进行对照的字幕特征量对照单元，从而确定内容之间的相同性 对应于存储在字幕特征量累积单元中的字幕特征量和与要确定的字幕特征量相对应的内容;以及核对结果输出单元，用于输出字幕特征量对照单元 。

    Information processing apparatus, sameness determination system, sameness determination method, and computer program
    2.
    发明授权
    Information processing apparatus, sameness determination system, sameness determination method, and computer program 有权
    信息处理装置，同一性确定系统，同一性确定方法和计算机程序

    公开(公告)号：US08913874B2

    公开(公告)日：2014-12-16

    申请号：US13155596

    申请日：2011-06-08

    申请人： Yoshihiro Manabe ,  Yuichi Abe ,  Hideki Noma ,  Tsugutomo Enami ,  Akifumi Kashiwagi ,  Itaru Kawakami

    发明人： Yoshihiro Manabe ,  Yuichi Abe ,  Hideki Noma ,  Tsugutomo Enami ,  Akifumi Kashiwagi ,  Itaru Kawakami

    IPC分类号： H04N5/92 ,  H04N21/488 ,  H04N21/44 ,  H04N21/81

    CPC分类号： H04N21/8133 ,  H04N21/44008 ,  H04N21/4884

    摘要： There is provided an information processing apparatus which includes a subtitle processing unit for extracting a subtitle feature quantity representing a feature of a content from subtitle information included in the content, a subtitle feature quantity accumulation unit for associating and storing identification information capable of identifying the content and the subtitle feature quantity extracted from the content by the subtitle processing unit, a subtitle feature quantity collation unit for collating the subtitle feature quantity stored in the subtitle feature quantity accumulation unit and a subtitle feature quantity to be determined, thereby determining sameness between the content corresponding to the subtitle feature quantity stored in the subtitle feature quantity accumulation unit and a content corresponding to the subtitle feature quantity to be determined, and a collation result output unit for outputting a collation result of the subtitle feature quantity collation unit.

    摘要翻译： 提供了一种信息处理装置，其包括字幕处理单元，用于从包括在内容中的字幕信息中提取表示内容的特征的字幕特征量;字幕特征量累积单元，用于关联并存储能够识别内容的标识信息 以及由字幕处理单元从内容提取的字幕特征量，用于对存储在字幕特征量累积单元中的字幕特征量与要确定的字幕特征量进行对照的字幕特征量对照单元，从而确定内容之间的相同性 对应于存储在字幕特征量累积单元中的字幕特征量和与要确定的字幕特征量相对应的内容;以及核对结果输出单元，用于输出字幕特征量对照单元 。

    TOPIC IDENTIFICATION SYSTEM, TOPIC IDENTIFICATION DEVICE, CLIENT TERMINAL, PROGRAM, TOPIC IDENTIFICATION METHOD, AND INFORMATION PROCESSING METHOD
    3.
    发明申请
    TOPIC IDENTIFICATION SYSTEM, TOPIC IDENTIFICATION DEVICE, CLIENT TERMINAL, PROGRAM, TOPIC IDENTIFICATION METHOD, AND INFORMATION PROCESSING METHOD 审中-公开
    主题识别系统，主题识别设备，客户终端，程序，主题识别方法和信息处理方法

    公开(公告)号：US20110119248A1

    公开(公告)日：2011-05-19

    申请号：US12943331

    申请日：2010-11-10

    申请人： Yuichi Abe ,  Akifumi Kashiwagi

    发明人： Yuichi Abe ,  Akifumi Kashiwagi

    IPC分类号： G06F17/30

    CPC分类号： G06F16/9535 ,  H04L67/10

    摘要： There is provided a network device including a topic identification device including a collecting unit for collecting location information of Web data related to a target topic arranged on a network, a storage unit for storing identical topic identifying information in association with one or more than two pieces of location information related to an identical target topic, which have been collected by the collecting unit, and an topic identification unit for obtaining link information contained in certain Web data, for searching location information from the storage unit using the link information, and for identifying topic identifying information associated with the searched location information.

    摘要翻译： 提供了一种网络设备，其包括：主题识别设备，包括：收集单元，用于收集与布置在网络上的目标主题相关的Web数据的位置信息;存储单元，用于存储与一个或多于两个的相关的主题识别信息 与由所述收集单元收集的相同目标主题相关的位置信息以及用于获取包含在某些Web数据中的链接信息的主题识别单元，用于使用所述链接信息搜索来自所述存储单元的位置信息，以及用于识别 主题识别与所搜索的位置信息相关联的信息。

    APPARATUS, METHOD, AND PROGRAM FOR IMAGE PROCESSING
    5.
    发明申请
    APPARATUS, METHOD, AND PROGRAM FOR IMAGE PROCESSING 审中-公开
    用于图像处理的装置，方法和程序

    公开(公告)号：US20110150339A1

    公开(公告)日：2011-06-23

    申请号：US12906376

    申请日：2010-10-18

    申请人： Akifumi Kashiwagi ,  Yuichi Abe

    发明人： Akifumi Kashiwagi ,  Yuichi Abe

    IPC分类号： G06K9/46

    CPC分类号： G06K9/00234 ,  G06K9/3275

    摘要： An image processing apparatus includes a face image detector detecting a face image from an image, a reference mask generator generating a reference mask based on the arrangement of parts included in the face image detected by the face image detector, a face color area detector detecting a face color area from the image, and a face image searcher searching for the face image using the reference mask in the face area detected by the face color area detector.

    摘要翻译： 一种图像处理装置，包括：面部图像检测器，检测来自图像的面部图像;基准面板生成器，基于由面部图像检测器检测到的面部图像中包含的部位的配置生成参考面罩;面部颜色区域检测器， 面部颜色区域，以及面部图像搜索器，其使用由面部颜色区域检测器检测到的面部区域中的参考掩模来搜索面部图像。

    SEMICONDUCTOR INSPECTION SYSTEM
    7.
    发明申请
    SEMICONDUCTOR INSPECTION SYSTEM 有权
    半导体检测系统

    公开(公告)号：US20140219545A1

    公开(公告)日：2014-08-07

    申请号：US14234977

    申请日：2012-07-20

    申请人： Akiyuki Sugiyama ,  Yuichi Abe

    发明人： Akiyuki Sugiyama ,  Yuichi Abe

    IPC分类号： G06T7/00

    CPC分类号： G06T7/001 ,  G01B15/08 ,  H01L22/12 ,  H01L2924/0002 ,  H01L2924/00

    摘要： When the lengths of FEM wafers are automatically measured, not only the sizes of targets, the lengths of which are to be measured, are often varied from those in registration, but also the patterns of the targets are often deformed. Therefore, it is difficult to automatically determine whether the length measurement is possible or not. Therefore, the following are executed with a semiconductor inspection system: (1) a process of identifying the position of the contour line of an inspected image using a distance image calculated from a reference image, (2) a process of calculating a defect size image based on the position of the contour line with respect to the identified distance image, and detecting a defect candidate from the defect size image, and (3-1) a process of, upon detection of the defect candidate, calculating the size of the detected defect candidate, or (3-2) a process of detecting a portion different between the first and second contour lines as the defect candidate.

    摘要翻译： 当自动测量有限元晶片的长度时，不仅要测量其长度的目标的尺寸通常与注册的尺寸不同，而且目标的图案也经常变形。 因此，难以自动确定长度测量是否可行。 因此，使用半导体检查系统执行以下操作：（1）使用从参考图像计算的距离图像来识别被检查图像的轮廓线的位置的处理，（2）计算缺陷尺寸图像的处理 基于所述轮廓线相对于所识别的距离图像的位置，以及从所述缺陷尺寸图像检测缺陷候选，以及（3-1）在检测到所述缺陷候选时，计算所检测到的所述缺陷候选的大小的处理 缺陷候选者，或（3-2）检测第一和第二轮廓线之间的部分的缺陷候选的处理。

    PATTERN MATCHING APPARATUS AND COMPUTER PROGRAM
    8.
    发明申请
    PATTERN MATCHING APPARATUS AND COMPUTER PROGRAM 审中-公开
    图案匹配装置和计算机程序

    公开(公告)号：US20140023265A1

    公开(公告)日：2014-01-23

    申请号：US13981963

    申请日：2011-12-07

    申请人： Masahiro Kitazawa ,  Mitsuji Ikeda ,  Yuichi Abe ,  Junichi Taguchi ,  Wataru Nagatomo

    发明人： Masahiro Kitazawa ,  Mitsuji Ikeda ,  Yuichi Abe ,  Junichi Taguchi ,  Wataru Nagatomo

    IPC分类号： G06T7/00

    CPC分类号： G06T7/0004 ,  G06T7/001 ,  G06T2207/10061 ,  G06T2207/30148 ,  H01L22/12

    摘要： It is an object of the present invention to provide a semiconductor inspection apparatus capable of well carrying out position alignment and correctly determining whether the position alignment has been carried out successfully or has ended in a failure without operator interventions even if an inspected image is an image having few characteristics as is the case with a repetitive pattern or the inspected image is an image having a complicated shape.The semiconductor inspection apparatus includes means for imaging a shape on a wafer or on an exposure mask; means for storing an image inspected by the imaging means; means for storing design data of the semiconductor circuit corresponding to a position on the wafer or on the exposure mask which are to be imaged by the imaging means; means for storing a design-data image obtained as a result of converting the design data into an image; means for generating a design-data ROI image by converting an interest drawing region found from a relative crude-density relation of a shape included in the design-data image into an image; and a position alignment section configured to carry out position alignment on the inspected image and the design-data image. The semiconductor inspection apparatus makes use of the design-data ROI image in order to identify a position at which the inspected image and the design-data image match each other or compute the degree of coincidence.

    摘要翻译： 本发明的目的是提供一种半导体检查装置，即使被检查的图像是图像，也能够良好地执行位置对准并且正确地确定位置对准是否已经成功地执行或者在没有操作者干预的情况下已经结束 具有与重复图案的情况相同的特性，或被检查图像是具有复杂形状的图像。 半导体检查装置包括用于对晶片或曝光掩模上的形状进行成像的装置; 用于存储由成像装置检查的图像的装置; 用于存储对应于要由成像装置成像的晶片或曝光掩模上的位置的半导体电路的设计数据的装置; 用于存储作为将设计数据转换为图像而获得的设计数据图像的装置; 用于通过将从所述设计数据图像中包含的形状的相对粗密度关系中找到的兴趣绘制区域转换为图像来生成设计数据ROI图像的装置; 以及位置对准部，被配置为在被检查图像和设计数据图像上执行位置对准。 半导体检查装置利用设计数据ROI图像来识别被检查图像和设计数据图像彼此匹配的位置或计算符合度。

    DEVICE AND METHOD FOR DETECTING ANGLE OF ROTATION FROM NORMAL POSITION OF IMAGE
    9.
    发明申请
    DEVICE AND METHOD FOR DETECTING ANGLE OF ROTATION FROM NORMAL POSITION OF IMAGE 有权
    用于检测图像正常位置的旋转角的装置和方法

    公开(公告)号：US20140016824A1

    公开(公告)日：2014-01-16

    申请号：US14005913

    申请日：2011-11-09

    申请人： Jun'ichi Taguchi ,  Mitsuji Ikeda ,  Yuichi Abe ,  Masahiro Kitazawa

    发明人： Jun'ichi Taguchi ,  Mitsuji Ikeda ,  Yuichi Abe ,  Masahiro Kitazawa

    IPC分类号： G06T7/00

    CPC分类号： G06T7/0004 ,  G06K9/3275

    摘要： An evaluation value indicative of the extent of lines in each direction is calculated for a pre-processed image in which 0s are filled in and extended in the lateral direction of the inputted image and which has been reduced ⅛th in the longitudinal direction. To obtain the angle of rotation of an image from the change in the evaluation value obtained while the angle relative to the lateral direction of the pre-processed image is modified in small steps, a parallel line is drawn for each direction, a projection is taken, and the sum of squares serves as the evaluation value of the direction. The direction having the highest evaluation value serves as the obtained direction of rotation from the normal position. The projection of each direction references the point of intersection between the parallel line drawn for each direction and the coordinate line of the horizontal axis.

    摘要翻译： 对于其中0被填充并在输入图像的横向方向上延伸并且在纵向方向上减少1/8的预处理图像来计算指示每个方向的行程度的评估值。 为了在以小步骤修改相对于预处理图像的横向方向的角度获得的评估值的变化中获得图像的旋转角度，对于每个方向绘制平行线，进行投影 ，并且平方和作为方向的评价值。 具有最高评估值的方向用作从正常位置获得的旋转方向。 每个方向的投影参考在每个方向绘制的平行线与水平轴的坐标线之间的交点。

    Pattern Matching Method and Pattern Matching Apparatus
    10.
    发明申请
    Pattern Matching Method and Pattern Matching Apparatus 有权
    模式匹配方法和模式匹配装置

    公开(公告)号：US20120207397A1

    公开(公告)日：2012-08-16

    申请号：US13502823

    申请日：2010-10-06

    申请人： Wataru Nagatomo ,  Yuichi Abe ,  Mitsuji Ikeda

    发明人： Wataru Nagatomo ,  Yuichi Abe ,  Mitsuji Ikeda

    IPC分类号： G06K9/68

    CPC分类号： G06K9/6203 ,  G06K9/6253 ,  G06K9/6255 ,  G06K9/6857 ,  G06T7/74 ,  G06T2207/10061 ,  G06T2207/20016 ,  G06T2207/30148 ,  H01J2237/221 ,  H01J2237/226

    摘要： Provided is a template matching method and a template matching apparatus, where the degree of matching between a template and the actual image upon template matching is maintained at a high level, without depending on a partial appearance of a lower layer. Proposed as one embodiment, is a method and an apparatus for template matching, where either an area is set in which comparison of the template and the image is not conducted, or a second area is set inside the template where comparison different from comparison conducted in a first comparison area is to be conducted, and the template matching is conducted on the basis either of comparison excluding the non-comparison area, or of comparison using the first and second areas.

    摘要翻译： 提供了一种模板匹配方法和模板匹配装置，其中模板匹配之间的模板和实际图像之间的匹配程度保持在高水平，而不依赖于较低层的部分外观。 作为一个实施例，提出了一种用于模板匹配的方法和装置，其中设置了不进行模板和图像的比较的区域，或者在模板内部设置第二区域，其中比较不同于进行比较 将进行第一比较区域，并且基于除非比较区域之外的比较或使用第一和第二区域的比较进行模板匹配。