Substrate processing apparatus having gas side flow via gas inlet
    1.
    发明授权
    Substrate processing apparatus having gas side flow via gas inlet 有权
    具有通过气体入口的气体侧流动的基板处理装置

    公开(公告)号:US07700054B2

    公开(公告)日:2010-04-20

    申请号:US11987493

    申请日:2007-11-30

    IPC分类号: H01L21/00 B01J19/00 F27B5/14

    CPC分类号: H01L21/67109 F27B17/0025

    摘要: An object of the present invention is to improve substrate processing efficiency. A substrate processing apparatus has a reaction tube that processes a substrate inside, and a heating apparatus disposed so as to surround an external periphery of the reaction tube, so that at least a gas inlet tube is disposed on a side surface in an area in which the substrate is processed inside the reaction tube, and the heating apparatus has a heat insulator that surrounds the reaction tube, an inlet opening formed in the shape of a groove in the heat insulator from the lower end of the heating apparatus so as to avoid the gas inlet tube, and a heating element disposed between the heat insulator and the reaction tube.

    摘要翻译: 本发明的目的是提高基板处理效率。 基板处理装置具有处理内部的基板的反应管和设置成围绕反应管的外周的加热装置,使得至少一个气体入口管设置在其中的 在反应管内加工基板,加热装置具有围绕反应管的绝热体,从加热装置的下端形成为绝热体的槽状的入口开口,以避免 气体入口管和设置在隔热件和反应管之间的加热元件。

    Substrate processing apparatus, method for manufacturing semiconductor device, and process tube
    5.
    发明授权
    Substrate processing apparatus, method for manufacturing semiconductor device, and process tube 有权
    基板处理装置,半导体装置的制造方法以及处理管

    公开(公告)号:US08303712B2

    公开(公告)日:2012-11-06

    申请号:US12363045

    申请日:2009-01-30

    摘要: In a substrate processing apparatus, a process vessel is configured to accommodate and process a substrate held at a horizontal position. A gas introduction port is installed at a periphery of a first side of the process vessel and configured to introduce gas into the process vessel from a lateral direction of the substrate. A gas exhaust port is installed at a second side of the process vessel which is opposite to the first side, and is configured to exhaust gas inside the process vessel from a lateral direction of the substrate. A slope part is installed between the gas introduction port and the gas exhaust port inside the process vessel, and is configured to guide a flow path of the gas introduced into the process vessel.

    摘要翻译: 在基板处理装置中,处理容器构造成容纳并处理保持在水平位置的基板。 气体导入口安装在处理容器的第一侧的周边,并被构造成从衬底的横向方向将气体引入处理容器。 排气口安装在与第一侧相对的处理容器的第二侧,并且构造成从衬底的横向方向排出处理容器内的气体。 倾斜部分安装在处理容器内的气体导入口和排气口之间,构成为引导导入处理容器的气体的流路。

    SUBSTRATE PROCESSING APPARATUS, METHOD FOR MANUFACTURING SEMICONDUCTOR DEVICE, AND PROCESS TUBE
    6.
    发明申请
    SUBSTRATE PROCESSING APPARATUS, METHOD FOR MANUFACTURING SEMICONDUCTOR DEVICE, AND PROCESS TUBE 有权
    基板加工装置,制造半导体装置的方法和工艺管

    公开(公告)号:US20090197402A1

    公开(公告)日:2009-08-06

    申请号:US12363045

    申请日:2009-01-30

    IPC分类号: H01L21/02 C23C16/54

    摘要: In a substrate processing apparatus, a process vessel is configured to accommodate and process a substrate held at a horizontal position. A gas introduction port is installed at a periphery of a first side of the process vessel and configured to introduce gas into the process vessel from a lateral direction of the substrate. A gas exhaust port is installed at a second side of the process vessel which is opposite to the first side, and is configured to exhaust gas inside the process vessel from a lateral direction of the substrate. A slope part is installed between the gas introduction port and the gas exhaust port inside the process vessel, and is configured to guide a flow path of the gas introduced into the process vessel.

    摘要翻译: 在基板处理装置中,处理容器构造成容纳并处理保持在水平位置的基板。 气体导入口安装在处理容器的第一侧的周边,并被构造成从衬底的横向方向将气体引入处理容器。 排气口安装在与第一侧相对的处理容器的第二侧,并且构造成从衬底的横向方向排出处理容器内的气体。 倾斜部分安装在处理容器内的气体导入口和排气口之间,构成为引导导入处理容器的气体的流路。

    Substrate processing apparatus and substrate processing method
    9.
    发明授权
    Substrate processing apparatus and substrate processing method 有权
    基板加工装置及基板处理方法

    公开(公告)号:US08112183B2

    公开(公告)日:2012-02-07

    申请号:US12260211

    申请日:2008-10-29

    申请人: Tomoyuki Yamada

    发明人: Tomoyuki Yamada

    IPC分类号: G06F19/00

    CPC分类号: H01L21/67109 H01L21/67253

    摘要: A substrate processing apparatus detects malfunction of mechanisms in MFC. An inert gas supply line, a first shut-off valve shutting off the inert gas supply, a process gas supply line, and a second shut-off valve shutting off the process gas supply are installed upstream of the MFC. A gas supply pipe connected to a process chamber, a third shut-off valve shutting off gas supply to the gas supply pipe, an exhaust vent line which is exhaustible, and a fourth shut-off valve shutting off gas supply to the exhaust vent line are installed downstream of the MFC. A main control unit determines that the MFC is abnormal if a transition time exceeds a previously set time when the MFC transitions from a closed state to an opened state while the shut-off valves are in a closed state.

    摘要翻译: 基板处理装置检测MFC中的机构的故障。 惰性气体供给管线,关闭惰性气体源的第一截止阀,处理气体供应管线和关闭工艺气体供应的第二截止阀安装在MFC的上游。 连接到处理室的气体供给管,关闭气体供给管的气体供给的第三截止阀,可排出的排气管,以及关闭排气管线的气体供给的第四截止阀 安装在MFC的下游。 如果在关闭阀处于关闭状态时,当MFC从关闭状态转换到打开状态时,如果转换时间超过预先设定的时间,则主控制单元确定MFC异常。