公开(公告)号：US20050062490A1

公开(公告)日：2005-03-24

申请号：US10669305

申请日：2003-09-24

申请人： Stanislav Polonsky ,  Alan Weger ,  Moyra Mc Manus

发明人： Stanislav Polonsky ,  Alan Weger ,  Moyra Mc Manus

IPC分类号： G01R31/02 ,  G01R31/26

CPC分类号： G01R31/025 ,  G01R31/2621

摘要： Disclosed are a method and system for analyzing leakage current luminescence in CMOS circuits. The method comprises the steps of collecting light emission data from each of a plurality of CMOS circuits, and separating the CMOS circuits into first and second groups. For the first group of CMOS circuits, the emission data from the CMOS circuits are analyzed, based on the presence or absence of leakage light from the CMOS circuits, to identify logic states for the CMOS circuits. For the second group of CMOS circuits, the emission data from the CMOS circuits are analyzed, based on modulation of the intensity of the light from the CMOS circuits, to determine values for given parameters of the circuits. These parameters may be, for example, temperature, cross-talk or power distribution noise.

公开(公告)号：US20070098037A1

公开(公告)日：2007-05-03

申请号：US11264968

申请日：2005-11-02

申请人： Hendrik Hamann ,  James Lacey ,  Jamil Wakil ,  Alan Weger

发明人： Hendrik Hamann ,  James Lacey ,  Jamil Wakil ,  Alan Weger

IPC分类号： G01K3/00

CPC分类号： G01K7/42 ,  G01K7/425 ,  G01K2215/00

摘要： Techniques for enhancing thermal design of a system having a number of boundary values are provided. A method for such enhancement includes representing thermal response of the system to the boundary values, obtaining at least one constraining parameter, and determining spatial and/or temporal distribution of the boundary values. The thermal response is represented as a superposition of temperature fields associated with given boundary values. The spatial and/or temporal distribution of the boundary values is determined based on the thermal response represented in the representing step, so as to satisfy the constraining parameter. The boundary values can be, for example, power sources, and the at least one constraining parameter can be, for example, a spatial or temporal location of one of the power sources.

摘要翻译： 提供了一种用于增强具有多个边界值的系统的热设计的技术。 用于这种增强的方法包括表示系统对边界值的热响应，获得至少一个约束参数，以及确定边界值的空间和/或时间分布。 热响应表示为与给定边界值相关联的温度场的叠加。 基于代表步骤中表示的热响应来确定边界值的空间和/或时间分布，以满足约束参数。 边界值可以是例如电源，并且至少一个约束参数可以是例如电源之一的空间或时间位置。

公开(公告)号：US20050168228A1

公开(公告)日：2005-08-04

申请号：US10771218

申请日：2004-02-03

申请人： Peilin Song ,  Tian Xia ,  Alan Weger ,  Franco Stellari ,  Stanislav Polonsky

发明人： Peilin Song ,  Tian Xia ,  Alan Weger ,  Franco Stellari ,  Stanislav Polonsky

IPC分类号： G01R31/00 ,  G01R31/311 ,  G01R31/3185

CPC分类号： G01R31/318538 ,  G01R31/311

摘要： A mechanism for diagnosing broken scan chains based on leakage light emission is provided. An image capture mechanism detects light emission from leakage current in complementary metal oxide semiconductor (CMOS) devices. The diagnosis mechanism identifies devices with unexpected light emission. An unexpected amount of light emission may indicate that a transistor is turned off when it should be turned on or vice versa. All possible inputs may be tested to determine whether a problem exists with transistors in latches or with transistors in clock buffers. Broken points in the scan chain may then be determined based on the locations of unexpected light emission.

摘要翻译： 提供了一种基于泄漏光发射来诊断断层扫描链的机构。 图像捕获机构检测互补金属氧化物半导体（CMOS）器件中的泄漏电流的发光。 诊断机制识别具有意外发光的设备。 意外的发光量可能表明当它应该被打开时晶体管被关闭，反之亦然。 可以测试所有可能的输入以确定锁存器中的晶体管或时钟缓冲器中的晶体管是否存在问题。 然后可以基于意外光发射的位置来确定扫描链中的断点。

公开(公告)号：US20080079448A1

公开(公告)日：2008-04-03

申请号：US11949325

申请日：2007-12-03

申请人： Chandler McDowell ,  Stanislav Polonsky ,  Peilin Song ,  Franco Stellari ,  Alan Weger

发明人： Chandler McDowell ,  Stanislav Polonsky ,  Peilin Song ,  Franco Stellari ,  Alan Weger

IPC分类号： G01R31/303

CPC分类号： G01R31/311

摘要： Methods and arrangements to enhance photon emissions responsive to a signal within an integrated circuit (IC) for observability of signal states utilizing, e.g., picosecond imaging circuit analysis (PICA), are disclosed. Embodiments attach a beacon to the signal of interest and apply a voltage across the beacon to enhance photon emissions responsive to the signal of interest. The voltage is greater than the operable circuit voltage, Vd, the enhance photon emissions with respect to intensity and energy. Thus, the photon emissions are more distinguishable from noise. In many embodiments, the beacon includes a transistor and, in several embodiments, the beacon includes an enablement device to enable and disable photon emissions from the beacon. Further, a PICA detector may capture photon emissions from the beacon and process the photons to generate time traces.

摘要翻译： 公开了利用例如皮秒成像电路分析（PICA）来增强响应于集成电路（IC）内的信号的信号状态的可观察性的光子发射的方法和装置。 实施例将信标连接到感兴趣的信号，并在信标之间施加电压以增强响应于感兴趣的信号的光子发射。 电压大于可操作电路电压Vd，相对于强度和能量增强光子发射。 因此，光子发射与噪声更为区别。 在许多实施例中，信标包括晶体管，并且在几个实施例中，信标包括启用和禁用来自信标的光子发射的启用装置。 此外，PICA检测器可以捕获来自信标的光子发射并处理光子以产生时间迹线。

公开(公告)号：US20050218921A1

公开(公告)日：2005-10-06

申请号：US10814962

申请日：2004-03-31

申请人： Naoko Sanda ,  Steven Voldman ,  Alan Weger

发明人： Naoko Sanda ,  Steven Voldman ,  Alan Weger

IPC分类号： G01R31/00 ,  G01R31/28 ,  G01R31/308 ,  G01R31/311 ,  G06F17/50 ,  H01L21/66 ,  G01R31/26

CPC分类号： G01R31/308

摘要： A method, system and apparatus are provided for operating a Picosecond Imaging Circuit Analysis (PICA)/high current source system include applying pulses from a high current pulse source to a Device Under Test (DUT). A photosensor detects photon emissions from the DUT. Signals from the photosensor are used to map photon emissions from the DUT. Data processing means relate the photon emissions to specific features of the DUT.

摘要翻译： 提供了一种用于操作Picosecond成像电路分析（PICA）/高电流源系统的方法，系统和装置，包括将来自高电流脉冲源的脉冲施加到被测设备（DUT）。 光电传感器检测来自DUT的光子发射。 来自光电传感器的信号用于映射DUT的光子发射。 数据处理手段将光子发射与DUT的特定特征相关联。

公开(公告)号：US20070265722A1

公开(公告)日：2007-11-15

申请号：US11382963

申请日：2006-05-12

申请人： Thomas Barnett ,  Jeanne Bickford ,  William Chang ,  Rashmi Chatty ,  Sebnem Jaji ,  Kerry Kravec ,  Wing Lai ,  Gie Lee ,  Brian Trapp ,  Alan Weger

发明人： Thomas Barnett ,  Jeanne Bickford ,  William Chang ,  Rashmi Chatty ,  Sebnem Jaji ,  Kerry Kravec ,  Wing Lai ,  Gie Lee ,  Brian Trapp ,  Alan Weger

IPC分类号： G06F19/00

CPC分类号： G06F17/5081 ,  G06F2217/10

摘要： A method of modeling yield for semiconductor products includes determining expected faults for each of a plurality of library elements by running a critical area analysis on each of the library elements, and assessing, from the critical area analysis, an expected number of faults per unit area, and comparing the same to actual observed faults on previously manufactured semiconductor products. Thereafter, the expected number of faults for each library element is updated in response to observed yield. A database is established, which includes the die size and expected faults for each of the library elements. Integrated circuit product die size is estimated, and library elements to be used to create the integrated circuit die are selected. Fault and size data for each of the selected library elements are obtained, the adjusted estimated faults for each of the library elements are summed, and estimated yield is calculated.

摘要翻译： 一种用于半导体产品的产量建模的方法包括通过对每个库元件运行关键区域分析来确定多个库元件中的每一个元素的预期故障，以及从关键区域分析来估计每单位面积的预期故障数量 并将其与先前制造的半导体产品的实际观察到的故障进行比较。 此后，响应于观察到的产量，更新每个库元素的预期数量的故障。 建立了一个数据库，其中包括每个库元素的管芯大小和预期的故障。 集成电路产品芯片尺寸被估计，并且选择用于创建集成电路管芯的库元件。 获得每个所选库元素的故障和大小数据，对每个库元素的调整后的估计故障相加，并计算估计的收益率。

公开(公告)号：US20060039114A1

公开(公告)日：2006-02-23

申请号：US10919692

申请日：2004-08-17

申请人： Hendrik Hamann ,  James Lacey ,  Martin O'Boyle ,  Robert von Gutfeld ,  Jamil Wakil ,  Alan Weger

发明人： Hendrik Hamann ,  James Lacey ,  Martin O'Boyle ,  Robert von Gutfeld ,  Jamil Wakil ,  Alan Weger

IPC分类号： H05K7/20

CPC分类号： H01L22/34 ,  H01L23/34 ,  H01L2924/0002 ,  H01L2924/00

摘要： A present invention provides real-time temperature and power mapping of fully operating electronic devices. The method utilizes infrared (IR) temperature imaging, while an IR-transparent coolant flows through a specially designed cell directly over the electronic device. In order to determine the chip power distributions the individual temperature fields for each heat source of a given power and size on the chip (as realized by a scanning focused laser beam) are measured under the same cooling conditions. Then the measured chip temperature distribution is represented as a superposition of the temperature fields of these individual heat sources and the corresponding power distribution is calculated with a set of linear equations.

摘要翻译： 本发明提供了完全操作的电子设备的实时温度和功率映射。 该方法利用红外（IR）温度成像，而IR透明冷却剂直接通过电子设备流经专门设计的单元。 为了确定芯片功率分布，在相同的冷却条件下测量芯片上给定功率和尺寸（通过扫描聚焦激光束实现）的每个热源的各个温度场。 然后，测量的芯片温度分布被表示为这些单个热源的温度场的叠加，并且用一组线性方程计算相应的功率分布。

公开(公告)号：US20060028219A1

公开(公告)日：2006-02-09

申请号：US10912493

申请日：2004-08-05

申请人： Chandler McDowell ,  Stanislav Polonsky ,  Peilin Song ,  Franco Stellari ,  Alan Weger

发明人： Chandler McDowell ,  Stanislav Polonsky ,  Peilin Song ,  Franco Stellari ,  Alan Weger

IPC分类号： G01R31/28 ,  G06K9/00

CPC分类号： G01R31/311

摘要： Methods and arrangements to enhance photon emissions responsive to a signal within an integrated circuit (IC) for observability of signal states utilizing, e.g., picosecond imaging circuit analysis (PICA), are disclosed. Embodiments attach a beacon to the signal of interest and apply a voltage across the beacon to enhance photon emissions responsive to the signal of interest. The voltage is greater than the operable circuit voltage, Vdd, to enhance photon emissions with respect to intensity and energy. Thus, the photon emissions are more distinguishable from noise. In many embodiments, the beacon includes a transistor and, in several embodiments, the beacon includes an enablement device to enable and disable photon emissions from the beacon. Further, a PICA detector may capture photon emissions from the beacon and process the photons to generate time traces.

摘要翻译： 公开了利用例如皮秒成像电路分析（PICA）来增强响应于集成电路（IC）内的信号的信号状态的可观察性的光子发射的方法和装置。 实施例将信标连接到感兴趣的信号，并在信标之间施加电压以增强响应于感兴趣的信号的光子发射。 电压大于可操作电路电压Vdd，以增强相对于强度和能量的光子发射。 因此，光子发射与噪声更为区别。 在许多实施例中，信标包括晶体管，并且在几个实施例中，信标包括启用和禁用来自信标的光子发射的启用装置。 此外，PICA检测器可以捕获来自信标的光子发射并处理光子以产生时间迹线。

公开(公告)号：US20050071100A1

公开(公告)日：2005-03-31

申请号：US10671037

申请日：2003-09-25

申请人： Alan Weger

发明人： Alan Weger

IPC分类号： G01R19/25 ,  G01R31/28 ,  G01R31/311 ,  G01R13/00

CPC分类号： G01R31/2882 ,  G01R19/2509 ,  G01R31/311

摘要： Disclosed are a method and system for processing timing information with respect to an electronic device. The method comprises the steps of generating a first set of responses from the device at a first frequency in response to a first timing signal, and generating a second set of responses from the device at a second frequency in response to a second timing signal. The method comprises the further steps of receiving the first and second sets of responses from the device, and processing the received responses to identify responses that are in synchronization with the first timing signal and responses that are in synchronization with the second timing signal. These timing signals may be related to clock signals applied to the electrical device, to clock signals internally generated by the device, or to extraneous noise that affects the electrical device in some fashion.

摘要翻译： 公开了一种用于处理关于电子设备的定时信息的方法和系统。 该方法包括以下步骤：响应于第一定时信号以第一频率从设备产生第一组响应，以及响应于第二定时信号，以第二频率从设备生成第二组响应。 该方法还包括以下步骤：从设备接收第一和第二组响应，以及处理所接收的响应以识别与第一定时信号同步的响应以及与第二定时信号同步的响应。 这些定时信号可能与施加到电气设备的时钟信号，由设备内部产生的时钟信号或以某种方式影响电气设备的外部噪声有关。