摘要:
Circuits, structures and techniques for independently connecting a surrounding material in a part of a semiconductor device to a contact of its respective device. To achieve this, a combination of one or more conductive wells that are electrically isolated in at least one bias polarity are provided.
摘要:
Circuits, structures and techniques for independently connecting a surrounding material in a part of a semiconductor device to a contact of its respective device. To achieve this, a combination of one or more conductive wells that are electrically isolated in at least one bias polarity are provided.
摘要:
A current mode power conversion system and method are described that provide a stable output voltage and a maximum-limited output current to a load. The system comprises: a feedback control linearly operable so as to control the output voltage across the load during constant load conditions, and non-linearly operable so as to control the output voltage across the load during certain detected changes in load conditions above a predetermined threshold so as to speed up the transient response of the power conversion system.
摘要:
A testing apparatus and method for testing a semiconductor device, and more particularly a test arrangement for measuring a guaranteed power loss of a semiconductor module, not requiring the module to have on-board decoupling capacitors for the power loss test. The conventional pogo-pin array and test socket are replaced by a novel low cost anisotropic conductive elastomer and a low cost socket, the conductive polymer providing electrical communication between the socket and the module under test.
摘要:
A current mode power conversion system and method are described that provide a stable output voltage and a maximum-limited output current to a load. The system comprises: a feedback control linearly operable so as to control the output voltage across the load during constant load conditions, and non-linearly operable so as to control the output voltage across the load during certain detected changes in load conditions above a predetermined threshold so as to speed up the transient response of the power conversion system.
摘要:
A testing apparatus and method for testing a semiconductor device, and more particularly a test arrangement for measuring a guaranteed power loss of a semiconductor module, not requiring the module to have on-board decoupling capacitors for the power loss test. The conventional pogo-pin array and test socket are replaced by a novel low cost anisotropic conductive elastomer and a low cost socket, the conductive polymer providing electrical communication between the socket and the module under test.
摘要:
Parallel transistor circuits with reduced effects from common source induction. The parallel transistors include physical gate connections that are located electrically close to one another. The parallel circuits are arranged such that the voltage at the common gate connection resulting from transient currents across common source inductance is substantially balanced. The circuits include switching circuits, converters, and RF amplifiers.
摘要:
Parallel transistor circuits with reduced effects from common source induction. The parallel transistors include physical gate connections that are located electrically close to one another. The parallel circuits are arranged such that the voltage at the common gate connection resulting from transient currents across common source inductance is substantially balanced. The circuits include switching circuits, converters, and RF amplifiers.