Conductive oxide overhang structures for OLED devices

    公开(公告)号:US11751438B2

    公开(公告)日:2023-09-05

    申请号:US17935770

    申请日:2022-09-27

    CPC classification number: H10K59/122 H10K50/84 H10K71/16 H10K2102/103

    Abstract: Sub-pixel circuits and methods of forming sub-pixel circuits that may be utilized in an organic light-emitting diode (OLED) display are described herein. The overhang structures are permanent to the sub-pixel circuit. The overhang structures include a conductive oxide. A first configuration of the overhang structures includes a base portion and a top portion with the top portion disposed on the base portion. In a first sub-configuration, the base portion includes the conductive oxide of at least one of a TCO material or a TMO material. In a second sub-configuration, the base portion includes a metal alloy material and the conductive oxide of a metal oxide surface. A second configuration of the overhang structures includes the base portion and the top portion with a body portion disposed between the base portion and the top portion. The body portion includes the metal alloy body and the metal oxide surface.

    Low melting temperature metal purification and deposition

    公开(公告)号:US10916761B2

    公开(公告)日:2021-02-09

    申请号:US16309211

    申请日:2017-06-08

    Abstract: Implementations described herein generally relate to low melting temperature metal or alloy metal deposition and processing. More particularly, the implementations described herein relate to methods and systems for low melting temperature metal or alloy metal deposition and processing for printed electronics and electrochemical devices. In yet another implementation, a method is provided. The method comprises exposing a molten metal source to a purification process to remove unwanted quantities of contaminants, delivering the filtered molten metal to a three dimensional printing device, and forming a metal film on a substrate by printing the filtered molten metal on the substrate. The purification process comprises delivering the molten metal to a filter assembly, wherein the filter assembly includes at least one of: a skimmer device, a metal mesh filter, and a foam filter, and filtering the molten metal through the filter assembly.

    Thin film encapsulation-thin ultra high barrier layer for OLED application
    8.
    发明授权
    Thin film encapsulation-thin ultra high barrier layer for OLED application 有权
    薄膜封装 - 用于OLED应用的薄超高阻隔层

    公开(公告)号:US09252392B2

    公开(公告)日:2016-02-02

    申请号:US14203426

    申请日:2014-03-10

    CPC classification number: H01L51/5253

    Abstract: A method and apparatus for depositing a multilayer barrier structure is disclosed herein. In one embodiment, a thin barrier layer formed over an organic semiconductor includes a non-conformal organic layer, an inorganic layer formed over the non-conformal organic layer, a metallic layer formed over the inorganic layer and a second organic layer formed over the metallic layer. In another embodiment, a method of depositing a barrier layer includes forming an organic semiconductor device over the exposed surface of a substrate, depositing an inorganic layer using CVD, depositing a metallic layer comprising one or more metal oxide or metal nitride layers over the inorganic layer by ALD, each of the metal oxide or metal nitride layers comprising a metal, wherein the metal is selected from the group consisting of aluminum, hafnium, titanium, zirconium, silicon or combinations thereof and depositing an organic layer over the metallic layer.

    Abstract translation: 本文公开了一种用于沉积多层阻挡结构的方法和装置。 在一个实施例中,形成在有机半导体上的薄势垒层包括非共形有机层,在非保形有机层上形成的无机层,形成在无机层上的金属层和形成在金属上的第二有机层 层。 在另一个实施例中,沉积阻挡层的方法包括在衬底的暴露表面上形成有机半导体器件,使用CVD沉积无机层,在无机层上沉积包含一个或多个金属氧化物或金属氮化物层的金属层 通过ALD,每个金属氧化物或金属氮化物层包含金属,其中金属选自铝,铪,钛,锆,硅或其组合,并在金属层上沉积有机层。

    SUBSTRATE SUPPORT, SUBSTRATE PROCESSING DEVICE AND METHOD OF PLACING A SUBSTRATE
    9.
    发明申请
    SUBSTRATE SUPPORT, SUBSTRATE PROCESSING DEVICE AND METHOD OF PLACING A SUBSTRATE 审中-公开
    基板支撑,基板处理装置和放置基板的方法

    公开(公告)号:US20130055953A1

    公开(公告)日:2013-03-07

    申请号:US13664246

    申请日:2012-10-30

    CPC classification number: H01L21/68714 H01L21/68 Y10T29/49998

    Abstract: A substrate support for supporting a substrate in a processing chamber comprises a frame for carrying the substrate, at least a first fastening means fixedly attached to the frame for aligning the substrate relative to the frame, and at least a second fastening means movably attached to the frame, the second fastening means being movable relative to the frame and/or the substrate. Furthermore, a processing device comprises an edge exclusion projecting over a portion of the surface of the substrate in order to prevent processing of the portion of the surface of the substrate. A part of the edge exclusion may be moved into a gap between the edge(s) of the substrate and the frame element of the substrate support to form a labyrinth seal between the frame element and the edge of the substrate. A method of placing the substrate on the substrate support is also disclosed.

    Abstract translation: 用于在处理室中支撑衬底的衬底支撑件包括用于承载衬底的框架,至少一个固定地连接到框架上用于使衬底相对于框架对准的第一紧固装置,以及至少一个第二紧固装置, 第二紧固装置可相对于框架和/或基板移动。 此外,处理装置包括在衬底表面的一部分上突出的边缘排除,以防止衬底的表面部分的处理。 边缘排除的一部分可以移动到基板的边缘和基板支撑件的框架元件之间的间隙中,以在框架元件和基板的边缘之间形成迷宫式密封。 还公开了将衬底放置在衬底支撑件上的方法。

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