Magnetic barrier for plasma in chamber exhaust
    1.
    发明申请
    Magnetic barrier for plasma in chamber exhaust 审中-公开
    室内排气等离子体的磁屏障

    公开(公告)号:US20010032591A1

    公开(公告)日:2001-10-25

    申请号:US09775295

    申请日:2001-01-31

    IPC分类号: H01L021/3065

    摘要: The invention is a plasma reactor employing a chamber having a process gas inlet and enclosing a plasma process region. The reactor includes a workpiece support pedestal within the chamber capable of supporting a workpiece at a processing location interfacing with the plasma process region, the support pedestal and the chamber defining an annulus therebetween to permit gas to be evacuated therethrough from the plasma process region. One aspect of the invention includes a ring horseshoe magnet adjacent and about one side of the annulus, the magnet being spaced from the plasma processing location by a spacing substantially greater than the smallest distance across the annulus. The invention further includes the magnet defining opposite poles which are substantially closer together than the spacing of the magnet from the processing location, the magnet being oriented to provide its maximum magnetic flux across the annulus and a minimum of the flux at the plasma processing location.

    摘要翻译: 本发明是采用具有工艺气体入口并包围等离子体处理区域的室的等离子体反应器。 反应器包括在腔室内的工件支撑基座,其能够在与等离子体处理区域相接合的处理位置处支撑工件,支撑基座和腔室在其间限定环形空间,以允许气体从等离子体处理区域排出。 本发明的一个方面包括环形马蹄形磁体,其邻近和围绕环的一侧,磁体与等离子体处理位置间隔开一个明显大于穿过环形空间的最小距离的间隔。 本发明还包括磁体,其限定相对于磁体与处理位置的间隔大致更靠近在一起的磁体,磁体被定向成提供跨越环的最大磁通量和等离子体处理位置处的最小磁通量。

    Method and apparatus for controlling the magnetic field intensity in a plasma enhanced semiconductor wafer processing chamber
    3.
    发明申请
    Method and apparatus for controlling the magnetic field intensity in a plasma enhanced semiconductor wafer processing chamber 失效
    用于控制等离子体增强半导体晶片处理室中的磁场强度的方法和装置

    公开(公告)号:US20030085000A1

    公开(公告)日:2003-05-08

    申请号:US10146443

    申请日:2002-05-14

    IPC分类号: C23F001/00 C23C016/00

    CPC分类号: H01J37/32623 H01J37/3266

    摘要: A magnetic field generator for producing a magnetic field that accelerates plasma formation is placed proximate a reaction chamber of semiconductor substrate processing system. The magnetic field generator has four main magnetic coil sections for producing a magnetic field nearly parallel to the top surface of a support pedestal in the reaction chamber and four sub-magnetic coil sections placed generally coaxially with the main magnetic coil sections to produce a magnetic field of the direction opposite of that of the magnetic field produced with the main magnetic coil sections. In the magnetic field generator, magnetic fields of opposite polarities are superimposed on each other when electric currents of opposite directions are applied to the main and sub-magnetic coil sections.

    摘要翻译: 用于产生加速等离子体形成的磁场的磁场发生器放置在半导体衬底处理系统的反应室附近。 磁场发生器具有四个主要的磁线圈部分,用于产生几乎平行于反应室中的支撑基座的顶表面的磁场和与主电磁线圈部分大致同轴放置的四个子磁线圈段,以产生磁场 的方向与由主电磁线圈段产生的磁场的方向相反。 在磁场发生器中,相反极性的磁场在施加到主磁亚极部分和次磁线圈部分的相反方向的电流时彼此叠加。

    Adjusting DC bias voltage in plasma chamber
    4.
    发明申请
    Adjusting DC bias voltage in plasma chamber 失效
    调整等离子体室内的直流偏置电压

    公开(公告)号:US20010014540A1

    公开(公告)日:2001-08-16

    申请号:US09841804

    申请日:2001-04-24

    IPC分类号: H01L021/302 H01L021/461

    摘要: A method of adjusting the cathode DC bias in a plasma chamber for fabricating semiconductor devices. A dielectric shield is positioned between the plasma and a selected portion of the electrically grounded components of the chamber, such as the electrically grounded chamber wall. The cathode DC bias is adjusted by controlling one or more of the following parameters: (1) the surface area of the chamber wall or other grounded components which is blocked by the dielectric shield; (2) the thickness of the dielectric; (3) the gap between the shield and the chamber wall; and (4) the dielectric constant of the dielectric material. In an apparatus aspect, the invention is a plasma chamber for fabricating semiconductor devices having an exhaust baffle with a number of sinuous passages. Each passage is sufficiently long and sinuous that no portion of the plasma within the chamber can extend beyond the outlet of the passage. By blocking the plasma from reaching the exhaust pump, the exhaust baffle reduces the deposition of unwanted particles on exhaust pump components. The exhaust baffle also reduces the cathode DC bias by reducing the effective surface area of the electrically grounded chamber wall which couples RF power to the plasma.

    摘要翻译: 一种调整用于制造半导体器件的等离子体室中的阴极直流偏压的方法。 电介质屏蔽件位于等离子体和室的电接地部件的选定部分之间,例如电接地室壁。 通过控制一个或多个以下参数来调节阴极直流偏压:(1)腔室壁的表面积或由介电屏蔽件阻挡的其它接地部件; (2)电介质的厚度; (3)屏蔽和室壁之间的间隙; 和(4)介电材料的介电常数。 在装置方面,本发明是用于制造半导体器件的等离子体室,其具有带有多个弯曲通道的排气挡板。 每个通道足够长和弯曲,使得室内的等离子体的任何部分不能延伸超过通道的出口。 通过阻止等离子体到达排气泵,排气挡板减少排气泵部件上不想要的颗粒的沉积。 排气挡板还通过减少将RF功率耦合到等离子体的电接地室壁的有效表面积来减小阴极DC偏压。

    Magnetic barrier for plasma in chamber exhaust
    7.
    发明申请
    Magnetic barrier for plasma in chamber exhaust 有权
    室内排气等离子体的磁屏障

    公开(公告)号:US20010032590A1

    公开(公告)日:2001-10-25

    申请号:US09775173

    申请日:2001-01-31

    IPC分类号: H01L021/3065 C23C016/00

    摘要: The invention concerns a plasma reactor employing a chamber enclosure including a process gas inlet and defining a plasma processing region. A workpiece support pedestal capable of supporting a workpiece at processing location faces the plasma processing region, the pedestal and enclosure being spaced from one another to define a pumping annulus therebetween having facing walls in order to permit the process of gas to be evacuated therethrough from the process region. A pair of opposing plasma confinement magnetic poles within one of the facing walls of the annulus, the opposing magnetic poles being axially displaced from one another. The magnetic poles are axially displaced below the processing location by a distance which exceeds a substantial fraction of a spacing between the facing walls of the annulus.

    摘要翻译: 本发明涉及一种使用包括工艺气体入口并限定等离子体处理区域的室外壳的等离子体反应器。 能够在加工位置处支撑工件的工件支撑基座面对等离子体处理区域,基座和外壳彼此间隔开,以在它们之间限定其间具有面向壁的泵送环形空间,以便允许气体从其中排出 过程区域。 一对相对的等离子体限制磁极在环形空间的相对的壁之一内,相对的磁极彼此轴向移位。 磁极在加工位置下方轴向移动一定距离,该距离超过环形面的相对壁之间的间隔的相当大的一部分。