摘要:
A latch circuit includes first and second inverters connected in a cross-coupling manner at a first node and a second node. A voltage application circuit applies a hot carrier generation voltage for generating hot carrier at a transistor included in the first inverter or the second inverter. An inverting circuit generates an inversion signal as an inverted signal of an amplified signal provided from the latch circuit to the bit line pair to provide the inversion signal to the first node and the second node.
摘要:
A latch circuit includes first and second inverters connected in a cross-coupling manner at a first node and a second node. A voltage application circuit applies a hot carrier generation voltage for generating hot carrier at a transistor included in the first inverter or the second inverter. An inverting circuit generates an inversion signal as an inverted signal of an amplified signal provided from the latch circuit to the bit line pair to provide the inversion signal to the first node and the second node.
摘要:
The first power supply terminal is connected to source electrodes of the first and third transistors. The second power supply terminal is connected to source electrodes of the second and fourth transistors. When offset information of the memory cell is to be read, a voltage applied to the first power supply terminal and a voltage applied to the second power supply terminal are made equal. Then the voltage applied to the first power supply terminal is returned to the first potential, and the voltage applied to the second power supply terminal is returned to the second potential. When stress is generated in the first to fourth transistor included in the first or second inverter, the potential difference between the first power supply terminal and the second power supply terminal is made larger than a difference between the first potential and the second potential.
摘要:
A semiconductor device has a semiconductor substrate, and a semiconductor element having an FET on the semiconductor substrate and comprises a different threshold voltage depending on an OFF state and an ON state. The semiconductor element has an insulating film disposed above a part where a channel of the semiconductor substrate is formed, a gate electrode disposed above the insulating film, and a charge trap film disposed between the insulating film and the gate electrode, and to exchange more electrons with the gate electrode than with the channel.
摘要:
A remaining capacity calculating section is provided that acquires a discharged capacity of a rechargeable battery based on a discharging current and a discharging time of the rechargeable battery, and calculates a relative remaining capacity of the rechargeable battery based on the discharged capacity and the fully-charged capacity of the rechargeable battery. The remaining capacity calculating section employs the rating capacity of the rechargeable battery or a learned fully-charged capacity as the fully-charged capacity when a high capacity mode is selected, and employs a capacity obtained by multiplying the rating capacity or learned fully-charged capacity by a predetermined factor not more than 1 as the fully-charged capacity when a long life mode is selected.
摘要:
According to an embodiment, a semiconductor storage device includes a memory cell array, a plurality of sense amplifiers and a timing generation circuit. The memory cell array includes a plurality of word lines, a plurality of bit lines crossing the plurality of word lines, and a plurality of memory cells provided in intersection portions of the plurality of word lines and the plurality of bit lines. The plurality of sense amplifiers is configured to detect a signal level of the corresponding bit lines. The timing generation circuit includes a timing selection circuit configured to select a timing in a preset order from among timings in which each bit line signal in the plurality of bit lines changes. The timing generation circuit is configured to generate activation timing to activate the plurality of sense amplifiers based on the selected timing.
摘要:
A charging method includes first and second charging steps to charge a lithium-ion battery. In the first charging step, a temperature rise gradient of the battery is detected. A battery temperature when the battery is charged to a first predetermined capacity is predicted based on the detected gradient. A charging current is controlled based on the predicted temperature. The battery is charged, at a current that results in a battery temperature that is lower than a predetermined temperature, to the first predetermined capacity. In the second charging step, a temperature rise gradient of the battery is detected. A battery temperature when the battery is charged to a second predetermined capacity is predicted based on the gradient. A charging current is controlled based on the predicted temperature. The battery is charged, at a current that results in a temperature of the battery that is lower than the predetermined temperature, to the second predetermined capacity.
摘要:
A memory cell is provided at an intersection of a word line and a bit line. A sense amplifier circuit senses and amplifies a signal on the bit line. Replica circuits include a replica cell configured to retain certain data fixedly. A signal detection circuit detects an output signal that rises up at the latest timing among output signals output from the plurality of replica circuits respectively and outputs a detection signal. A delay circuit delays the detection signal. The sense amplifier circuit is activated based on the delayed signal.
摘要:
SRAM cells are arranged in matrix along a first and a second bit line and a word line for single-ended reading of data from the second bit line. A first NMOS transistor and a first transfer transistor contained in the SRAM cell are formed in a first well with respective identical gate lengths and gate widths. A second NMOS transistor and a second transfer transistor contained in the SRAM cell are formed in a second well with respective identical gate lengths and gate widths. These gate widths are made wider than the gate widths of the first NMOS transistor and the first transfer transistor.
摘要:
A semiconductor integrated circuit device includes a first semiconductor circuit, a second semiconductor circuit, a first control circuit and a second control circuit. The first and second semiconductor circuits are formed on a semiconductor substrate and operate using a voltage provided by an external power supply circuit as a power supply voltage. The first control circuit is formed on the semiconductor substrate and holds control information used to control the voltage generated by the external power supply circuit in accordance with operating performance of the first and second semiconductor circuits. The second control circuit controls a property of the first semiconductor circuit in accordance with the control information held by the first control circuit.