SEMICONDUCTOR DEVICE
    1.
    发明申请
    SEMICONDUCTOR DEVICE 有权
    半导体器件

    公开(公告)号:US20130032878A1

    公开(公告)日:2013-02-07

    申请号:US13560022

    申请日:2012-07-27

    IPC分类号: H01L29/78 H01L29/02

    摘要: According to example embodiments, a semiconductor device includes horizontal patterns stacked on a substrate. The horizontal patterns define an opening through the horizontal patterns. A first core pattern is in the opening. A second core pattern is in the opening on the first core pattern. A first active pattern is between the first core pattern and the horizontal patterns. A second active pattern containing a first element is between the second core pattern and the horizontal patterns. The second active pattern contains the first element at a higher concentration than a concentration of the first element in the second core pattern.

    摘要翻译: 根据示例性实施例,半导体器件包括堆叠在衬底上的水平图案。 水平图案通过水平图案定义开口。 第一个核心模式是在开幕。 第一个核心模式是第一个核心模式的开放。 第一活动模式在第一芯图案和水平图案之间。 包含第一元件的第二活动图案位于第二芯图案和水平图案之间。 第二活性图案含有比第二芯图案中的第一元素的浓度高的浓度的第一元素。

    Semiconductor device including a first core pattern under a second core pattern
    2.
    发明授权
    Semiconductor device including a first core pattern under a second core pattern 有权
    半导体器件包括在第二芯图案下的第一芯图案

    公开(公告)号:US09129857B2

    公开(公告)日:2015-09-08

    申请号:US13560022

    申请日:2012-07-27

    摘要: According to example embodiments, a semiconductor device includes horizontal patterns stacked on a substrate. The horizontal patterns define an opening through the horizontal patterns. A first core pattern is in the opening. A second core pattern is in the opening on the first core pattern. A first active pattern is between the first core pattern and the horizontal patterns. A second active pattern containing a first element is between the second core pattern and the horizontal patterns. The second active pattern contains the first element at a higher concentration than a concentration of the first element in the second core pattern.

    摘要翻译: 根据示例性实施例,半导体器件包括堆叠在衬底上的水平图案。 水平图案通过水平图案定义开口。 第一个核心模式是在开幕。 第一个核心模式是第一个核心模式的开放。 第一活动模式在第一芯图案和水平图案之间。 包含第一元件的第二活动图案位于第二芯图案和水平图案之间。 第二活性图案含有比第二芯图案中的第一元素的浓度高的浓度的第一元素。

    VERTICAL MEMORY DEVICES AND METHODS OF MANUFACTURING THE SAME
    4.
    发明申请
    VERTICAL MEMORY DEVICES AND METHODS OF MANUFACTURING THE SAME 审中-公开
    垂直存储器件及其制造方法

    公开(公告)号:US20120267702A1

    公开(公告)日:2012-10-25

    申请号:US13442482

    申请日:2012-04-09

    IPC分类号: H01L29/792 H01L21/336

    CPC分类号: H01L27/11582 H01L27/1157

    摘要: A device includes a first GSL, a plurality of first word lines, a first SSL, a plurality of first insulation layer patterns, and a first channel. The first GSL, the first word lines, and the first SSL are spaced apart from each other on a substrate in a first direction perpendicular to a top surface of a substrate. The first insulation layer patterns are between the first GSL, the first word lines and the first SSL. The first channel on the top surface of the substrate extends in the first direction through the first GSL, the first word lines, the first SSL, and the first insulation layer patterns, and has a thickness thinner at a portion thereof adjacent to the first SSL than at portions thereof adjacent to the first insulation layer patterns.

    摘要翻译: 一种装置包括第一GSL,多个第一字线,第一SSL,多个第一绝缘层图案和第一通道。 第一GSL,第一字线和第一SSL在垂直于衬底顶表面的第一方向上在衬底上彼此间隔开。 第一绝缘层图案位于第一GSL,第一字线和第一SSL之间。 衬底顶表面上的第一通道沿着第一方向延伸穿过第一GSL,第一字线,第一SSL和第一绝缘层图案,并且在与第一SSL相邻的部分处具有较薄的厚度 而不是靠近第一绝缘层图案的部分。

    Memory devices and methods of manufacturing the same
    7.
    发明授权
    Memory devices and methods of manufacturing the same 有权
    存储器件及其制造方法

    公开(公告)号:US09368646B2

    公开(公告)日:2016-06-14

    申请号:US14182325

    申请日:2014-02-18

    摘要: A vertical memory device includes a channel array, a charge storage layer structure, multiple gate electrodes and a dummy pattern array. The channel array includes multiple channels, each of which is formed on a first region of a substrate and is formed to extend in a first direction substantially perpendicular to a top surface of the substrate. The charge storage layer structure includes a tunnel insulation layer pattern, a charge storage layer pattern and a blocking layer pattern, which are sequentially formed on a sidewall of each channel in the second direction substantially parallel to the top surface of the substrate. The gate electrodes arranged on a sidewall of the charge storage layer structure and spaced apart from each other in the first direction. The dummy pattern array includes multiple dummy patterns, each of which is formed on a second region adjacent the first region of the substrate and is formed to extend in the first direction.

    摘要翻译: 垂直存储器件包括沟道阵列,电荷存储层结构,多个栅电极和虚拟图案阵列。 通道阵列包括多个通道,每个通道形成在基板的第一区域上,并且形成为在基本上垂直于基板的顶表面的第一方向上延伸。 电荷存储层结构包括隧道绝缘层图案,电荷存储层图案和阻挡层图案,它们在基本上平行于基板的顶表面的第二方向上顺序地形成在每个沟道的侧壁上。 所述栅极布置在所述电荷存储层结构的侧壁上并且在所述第一方向上彼此间隔开。 虚拟图案阵列包括多个虚设图案,每个虚设图案形成在与基板的第一区域相邻的第二区域上,并且形成为沿第一方向延伸。

    Vertical memory devices and methods of manufacturing the same
    8.
    发明授权
    Vertical memory devices and methods of manufacturing the same 有权
    垂直存储器件及其制造方法

    公开(公告)号:US09461061B2

    公开(公告)日:2016-10-04

    申请号:US14546172

    申请日:2014-11-18

    摘要: A method of manufacturing a vertical memory device includes forming alternating and repeating insulating interlayers and sacrificial layers on a substrate, the sacrificial layers including polysilicon or amorphous silicon, forming channel holes through the insulating interlayers and the sacrificial layers, forming channels in the channel holes, etching portions of the insulating interlayers and the sacrificial layers between adjacent channels to form openings, removing the sacrificial layers to form gaps between the insulating interlayers, and forming gate lines in the gaps.

    摘要翻译: 制造垂直存储器件的方法包括在衬底上形成交替和重复的绝缘夹层和牺牲层,牺牲层包括多晶硅或非晶硅,通过绝缘夹层和牺牲层形成通道孔,在通道孔中形成通道, 蚀刻绝缘夹层的部分和相邻通道之间的牺牲层以形成开口,去除牺牲层以在绝缘夹层之间形成间隙,并在间隙中形成栅极线。

    Oxidation Treatment Apparatus and Method
    9.
    发明申请
    Oxidation Treatment Apparatus and Method 审中-公开
    氧化处理装置及方法

    公开(公告)号:US20070134415A1

    公开(公告)日:2007-06-14

    申请号:US11563980

    申请日:2006-11-28

    CPC分类号: H01L21/02233 H01L21/31654

    摘要: An oxidation treatment apparatus for oxidizing a surface of a substrate includes a process chamber for performing a process, a boat supporting the substrate and disposed in the process chamber during the process and a first ozone supply unit supplying ozone to the process chamber. The first ozone supply unit includes an ozone generator disposed at an exterior of the process chamber and an ozone spray nozzle disposed in the process chamber to spray the ozone supplied from the ozone generator into the process chamber.

    摘要翻译: 用于氧化基板表面的氧化处理装置包括处理过程的处理室,支撑基板的船,并且在处理过程中设置在处理室中,以及向处理室供应臭氧的第一臭氧供给单元。 第一臭氧供应单元包括设置在处理室外部的臭氧发生器和设置在处理室中的臭氧喷嘴,以将从臭氧发生器供应的臭氧喷射到处理室中。