利索-全球专利检索

  1. 登录
  2. 注册

搜索结果

10 条记录 (耗时 0.029 秒)

    Defect analysis methods for semiconductor integrated circuit devices and defect analysis systems
    2.
    发明授权
    Defect analysis methods for semiconductor integrated circuit devices and defect analysis systems 失效
    半导体集成电路器件和缺陷分析系统的缺陷分析方法

    公开(公告)号：US07822561B2

    公开(公告)日：2010-10-26

    申请号：US12007706

    申请日：2008-01-15

    申请人： Jong-hyun Lee

    发明人： Jong-hyun Lee

    IPC分类号： G01B5/28

    CPC分类号： G01R31/318511 ,  G01R31/3004 ,  G11C11/41 ,  G11C29/006 ,  G11C29/50 ,  G11C2029/0403

    摘要： A defect analysis method includes storing, in a database, data indicative of defects and analog characteristics of corresponding defective bits in a database. A first defective area in a first wafer is found, and analog characteristics of defective bits in the first defective area are measured. The measured analog characteristics and the analog characteristics stored in the database are compared to locate a defect causing the first defective area.

    摘要翻译： 缺陷分析方法包括在数据库中存储表示数据库中相应缺陷比特的缺陷和模拟特征的数据。 找到第一晶片中的第一缺陷区域，并且测量第一缺陷区域中的有缺陷位的模拟特性。 比较存储在数据库中的测量模拟特性和模拟特性以定位导致第一缺陷区的缺陷。

    Method and system of analyzing failure in semiconductor integrated circuit device
    4.
    发明授权
    Method and system of analyzing failure in semiconductor integrated circuit device 失效
    分析半导体集成电路器件故障的方法和系统

    公开(公告)号：US07733719B2

    公开(公告)日：2010-06-08

    申请号：US11902413

    申请日：2007-09-21

    申请人： Jong-hyun Lee

    发明人： Jong-hyun Lee

    IPC分类号： G11C29/00

    CPC分类号： G01R31/2894 ,  G11C29/006 ,  G11C29/50 ,  G11C29/56 ,  G11C29/56008 ,  G11C2029/0403 ,  G11C2029/4002 ,  G11C2029/5002 ,  G11C2029/5606

    摘要： A method of analyzing a failure in a semiconductor integrated circuit device may including storing defects and analog characteristics correlated with the defects in a database, detecting a fail bit in a first wafer, measuring analog characteristics of the fail bit in the first wafer, and identifying which defect has caused the fail bit by comparing the measured analog characteristics with the stored analog characteristics.

    摘要翻译： 分析半导体集成电路器件的故障的方法可以包括存储与数据库中的缺陷相关的缺陷和模拟特性，检测第一晶片中的故障位，测量第一晶片中的故障位的模拟特性，以及识别 通过将测量的模拟特性与存储的模拟特性进行比较，该缺陷导致了故障位。

    Test structure for detecting defect size in a semiconductor device and test method using same
    5.
    发明授权
    Test structure for detecting defect size in a semiconductor device and test method using same 失效
    用于检测半导体器件中的缺陷尺寸的测试结构及使用其的测试方法

    公开(公告)号：US07132684B2

    公开(公告)日：2006-11-07

    申请号：US10834071

    申请日：2004-04-29

    申请人： Jong-hyun Lee

    发明人： Jong-hyun Lee

    IPC分类号： H01L23/58 ,  H01L29/10

    CPC分类号： H01L22/34

    摘要： A test structure and method for testing a semiconductor device are provided. The test structure including a first test pattern having a plurality of electrically separated metal patterns, a plurality of metal vias formed in opposite end portions of the respective metal patterns, and a second test pattern connected to the first test pattern through the metal vias. By using this structure, the presence, nature, and size of a metal failure can be detected by analyzing a resistance arising from the application of a test voltage to the first test pattern.

    摘要翻译： 提供了一种用于测试半导体器件的测试结构和方法。 测试结构包括具有多个电分离的金属图案的第一测试图案，形成在相应金属图案的相对端部的多个金属通孔，以及通过金属通孔连接到第一测试图案的第二测试图案。 通过使用该结构，可以通过分析从对第一测试图案施加测试电压而产生的电阻来检测金属故障的存在，性质和尺寸。

    Method and system of analyzing failure in semiconductor integrated circuit device
    6.
    发明申请
    Method and system of analyzing failure in semiconductor integrated circuit device 失效
    分析半导体集成电路器件故障的方法和系统

    公开(公告)号：US20080080277A1

    公开(公告)日：2008-04-03

    申请号：US11902413

    申请日：2007-09-21

    申请人： Jong-hyun Lee

    发明人： Jong-hyun Lee

    IPC分类号： G01R31/26 ,  G11C29/04

    CPC分类号： G01R31/2894 ,  G11C29/006 ,  G11C29/50 ,  G11C29/56 ,  G11C29/56008 ,  G11C2029/0403 ,  G11C2029/4002 ,  G11C2029/5002 ,  G11C2029/5606

    摘要： A method of analyzing a failure in a semiconductor integrated circuit device may include storing defects and analog characteristics correlated with the defects in a database, detecting a fail bit in a first wafer, measuring analog characteristics of the fail bit in the first wafer, and identifying which defect has caused the fail bit by comparing the measured analog characteristics with the stored analog characteristics.

    摘要翻译： 分析半导体集成电路器件的故障的方法可以包括存储与数据库中的缺陷相关的缺陷和模拟特性，检测第一晶片中的故障位，测量第一晶片中的故障位的模拟特性，以及识别 通过将测量的模拟特性与存储的模拟特性进行比较，该缺陷导致了故障位。

    Button shift transfer system for a four-wheel drive vehicle
    7.
    发明授权
    Button shift transfer system for a four-wheel drive vehicle 失效
    四轮驱动车辆按钮换挡系统

    公开(公告)号：US5884721A

    公开(公告)日：1999-03-23

    申请号：US768082

    申请日：1996-12-16

    申请人： Jong-hyun Lee

    发明人： Jong-hyun Lee

    IPC分类号： B60K23/08

    CPC分类号： B60K23/08 ,  B60W2520/10

    摘要： A transfer system for a four-wheel drive vehicle comprising: a transfer case for transferring driving modes; a transfer-operating part for activating and controlling said transfer; a button shifting assembly for selecting driving mode; a speed sensor for detecting a vehicle speed; a neutral switch which switches on when a transmission mode is neutral; and an electronic control unit which controls the transfer-operating part regarding the vehicle speed, the transmission mode sensor and the button shifting assembly.

    摘要翻译： 一种用于四轮驱动车辆的传送系统，包括：用于传送驾驶模式的传送箱; 用于激活和控制所述转移的转移操作部分; 用于选择驾驶模式的按钮换档组件; 用于检测车速的速度传感器; 一个中性开关，当传动模式为中性时接通; 以及电子控制单元，其控制关于车速的传送操作部分，传输模式传感器和按钮移动组件。

    METHOD OF SETTING PASSWORD AND METHOD OF AUTHENTICATING PASSWORD IN PORTABLE DEVICE HAVING SMALL NUMBER OF OPERATION BUTTONS
    8.
    发明申请
    METHOD OF SETTING PASSWORD AND METHOD OF AUTHENTICATING PASSWORD IN PORTABLE DEVICE HAVING SMALL NUMBER OF OPERATION BUTTONS 审中-公开
    在具有小数量操作按钮的便携式设备中设置密码和认证密码的方法

    公开(公告)号：US20080195976A1

    公开(公告)日：2008-08-14

    申请号：US11942972

    申请日：2007-11-20

    申请人： Kyung-suk Cho ,  Jong-hyun Lee ,  Fung-chan Kim

    发明人： Kyung-suk Cho ,  Jong-hyun Lee ,  Fung-chan Kim

    IPC分类号： G06F3/048 ,  G06F7/04

    CPC分类号： G06F3/0233 ,  G06F21/31 ,  G06F21/83

    摘要： A method of setting a password and a method of authenticating a password in a portable device having a small number of operation buttons. The method of setting a password includes: determining whether there is an input through the operating of an operation button within a predetermined time; displaying a symbol of the operated operation button, when there is an input through the operating of an operation button within the predetermined time; and setting displayed symbols as a password required for using the portable device, when there is an input through the operating of an operation button for representing an end of an input of symbols. Accordingly, the password can be set by operating operation buttons in the portable device having no text or number buttons. Authentication of a password can be performed by using the set password.

    摘要翻译： 在具有少量操作按钮的便携式设备中设置口令的方法和认证密码的方法。 设置密码的方法包括：通过在预定时间内操作操作按钮来确定是否存在输入; 当在预定时间内通过操作按钮的操作存在输入时，显示操作操作按钮的符号; 并且当通过操作用于表示符号输入结束的操作按钮的输入时，将所显示的符号设置为使用便携式设备所需的密码。 因此，可以通过在没有文本或数字按钮的便携式设备中操作操作按钮来设置密码。 可以使用设置的密码来验证密码。

    Defect analysis methods for semiconductor integrated circuit devices and defect analysis systems
    9.
    发明申请
    Defect analysis methods for semiconductor integrated circuit devices and defect analysis systems 失效
    半导体集成电路器件和缺陷分析系统的缺陷分析方法

    公开(公告)号：US20080172190A1

    公开(公告)日：2008-07-17

    申请号：US12007706

    申请日：2008-01-15

    申请人： Jong-hyun Lee

    发明人： Jong-hyun Lee

    IPC分类号： G01R31/28

    CPC分类号： G01R31/318511 ,  G01R31/3004 ,  G11C11/41 ,  G11C29/006 ,  G11C29/50 ,  G11C2029/0403

    摘要： A defect analysis method includes storing, in a database, data indicative of defects and analog characteristics of corresponding defective bits in a database. A first defective area in a first wafer is found, and analog characteristics of defective bits in the first defective area are measured. The measured analog characteristics and the analog characteristics stored in the database are compared to locate a defect causing the first defective area.

    摘要翻译： 缺陷分析方法包括在数据库中存储表示数据库中相应缺陷比特的缺陷和模拟特征的数据。 找到第一晶片中的第一缺陷区域，并且测量第一缺陷区域中的有缺陷位的模拟特性。 比较存储在数据库中的测量模拟特性和模拟特性以定位导致第一缺陷区的缺陷。

    Multi-channel optical switch
    10.
    发明申请
    Multi-channel optical switch 审中-公开
    多通道光开关

    公开(公告)号：US20050008285A1

    公开(公告)日：2005-01-13

    申请号：US10843062

    申请日：2004-05-11

    申请人： Seon-ju Kim ,  Ho-nam Kwon ,  Jong-hyun Lee ,  Won-hyo Kim ,  Jong-sam Park

    发明人： Seon-ju Kim ,  Ho-nam Kwon ,  Jong-hyun Lee ,  Won-hyo Kim ,  Jong-sam Park

    IPC分类号： G02B26/08 ,  G02B6/35 ,  G02B6/26

    CPC分类号： G02B6/3514 ,  G02B6/3546 ,  G02B6/355

    摘要： An optical switch enabling optical communications between an input port and an output port of an optical waveguide by minimizing loss error of an optical signal without using a collimator comprised of a separate mediate optical waveguide, lens or the like is provided. The multi-channel optical switch, which changes optical paths, includes four pairs of input optical waveguides and output optical waveguide arranged in parallel to each other, the first pair of input optical waveguide and output optical waveguide facing the second pair of input optical waveguide and output optical waveguide at an angle of 90 degrees, the first input optical waveguide being installed to correspond to the second output optical waveguide, four mirrors installed to enter in optical path directions between the four pairs of input optical waveguides and output optical waveguides, thereby changing the optical paths, and a mirror actuator for selectively operating the entering of the mirror.

    摘要翻译： 提供了一种通过使光信号的损耗误差最小化而不使用由单独的中介光波导，透镜等构成的准直器来实现光波导的输入端口和输出端口之间的光通信的光开关。 改变光路的多通道光开关包括彼此并联布置的四对输入光波导和输出光波导，第一对输入光波导和输出光波导面对第二对输入光波导和 输出光波导以90度的角度，第一输入光波导被安装成对应于第二输出光波导，四个反射镜安装成进入四对输入光波导和输出光波导之间的光路方向，从而改变 光路和用于选择性地操作反射镜进入的反光镜致动器。