-
公开(公告)号:US07855383B2
公开(公告)日:2010-12-21
申请号:US11979667
申请日:2007-11-07
申请人: Ching-Yeh Kuo , Tsung-Chi Cheng , Yu-Chou Lee , Yea-Chung Shih , Wen-Kuang Tsao , Hsiang-Hsien Chung , Hung-Yi Hsu , Jui-Chung Chang
发明人: Ching-Yeh Kuo , Tsung-Chi Cheng , Yu-Chou Lee , Yea-Chung Shih , Wen-Kuang Tsao , Hsiang-Hsien Chung , Hung-Yi Hsu , Jui-Chung Chang
IPC分类号: H01L29/786
CPC分类号: H01L29/66742 , H01L29/458 , H01L29/4908 , H01L29/786
摘要: A semiconductor device and its manufacturing method are disclosed. The nitrogen flow is gradually changed to form a semiconductor device with a gate or a source/drain having a nitrified gradient layer structure. Different extents of nitrification inside the nitrified gradient layer structure provide protection and buffering to prevent the undercut after etching due to different materials in the multilayer structure or the interface effect.
摘要翻译: 公开了一种半导体器件及其制造方法。 氮气流逐渐变化以形成具有硝化梯度层结构的栅极或源极/漏极的半导体器件。 硝化梯度层结构内的不同硝化程度提供保护和缓冲,以防止由于多层结构中的不同材料或界面效应而导致的蚀刻后的底切。
-
公开(公告)号:US20080061327A1
公开(公告)日:2008-03-13
申请号:US11979667
申请日:2007-11-07
申请人: Ching-Yeh Kuo , Tsung-Chi Cheng , Yu-Chou Lee , Yea-Chung Shih , Wen-Kuang Tsao , Hsiang-Hsien Chung , Hung-Yi Hsu , Jui-Chung Chang
发明人: Ching-Yeh Kuo , Tsung-Chi Cheng , Yu-Chou Lee , Yea-Chung Shih , Wen-Kuang Tsao , Hsiang-Hsien Chung , Hung-Yi Hsu , Jui-Chung Chang
IPC分类号: H01L29/94
CPC分类号: H01L29/66742 , H01L29/458 , H01L29/4908 , H01L29/786
摘要: A semiconductor device and its manufacturing method are disclosed. The nitrogen flow is gradually changed to form a semiconductor device with a gate or a source/drain having a nitrified gradient layer structure. Different extents of nitrification inside the nitrified gradient layer structure provide protection and buffering to prevent the undercut after etching due to different materials in the multilayer structure or the interface effect.
摘要翻译: 公开了一种半导体器件及其制造方法。 氮气流逐渐变化以形成具有硝化梯度层结构的栅极或源极/漏极的半导体器件。 硝化梯度层结构内的不同硝化程度提供保护和缓冲,以防止由于多层结构中的不同材料或界面效应而导致的蚀刻后的底切。
-
公开(公告)号:US20060197089A1
公开(公告)日:2006-09-07
申请号:US11070216
申请日:2005-03-03
申请人: Ching-Yeh Kuo , Tsung-Chi Cheng , Yu-Chou Lee , Yea-Chung Shih , Wen-Kuang Tsao , Hsiang-Hsien Chung , Hung-Yi Hsu , Jui-Chung Chang
发明人: Ching-Yeh Kuo , Tsung-Chi Cheng , Yu-Chou Lee , Yea-Chung Shih , Wen-Kuang Tsao , Hsiang-Hsien Chung , Hung-Yi Hsu , Jui-Chung Chang
IPC分类号: H01L29/786 , H01L21/84
CPC分类号: H01L29/66742 , H01L29/458 , H01L29/4908 , H01L29/786
摘要: A semiconductor device and its manufacturing method are disclosed. The nitrogen flow is gradually changed to form a semiconductor device with a gate or a source/drain having a nitrified gradient layer structure. Different extents of nitrification inside the nitrified gradient layer structure provide protection and buffering to prevent the undercut after etching due to different materials in the multilayer structure or the interface effect.
摘要翻译: 公开了一种半导体器件及其制造方法。 氮气流逐渐变化以形成具有硝化梯度层结构的栅极或源极/漏极的半导体器件。 硝化梯度层结构内的不同硝化程度提供保护和缓冲,以防止由于多层结构中的不同材料或界面效应而导致的蚀刻后的底切。
-
公开(公告)号:US20070155180A1
公开(公告)日:2007-07-05
申请号:US11325323
申请日:2006-01-05
IPC分类号: H01L21/311
CPC分类号: H01L21/32139 , H01L21/32134 , H01L29/4908
摘要: A thin film etching method is provided, which is used for manufacturing semiconductor device or thin film transistor (TFT) array and through which no undercut may be presented or a good after-etching shape may be achieved with respect to a thin film thus etched. The thin film etching method is performed in a two-stage manner by an etchant and between the two stages a photoresist removing process is inserted where another etchant is used. With execution of the photoresist removing process, the thin film may have an increased contact area with the etchant. As such, any undercut or undesired after-etching shape existed in the thin film etched by the prior art may be eliminated or improved.
摘要翻译: 提供了一种薄膜蚀刻方法,其用于制造半导体器件或薄膜晶体管(TFT)阵列,并且通过该薄膜蚀刻方法可能不会产生底切,或者相对于如此蚀刻的薄膜可以实现良好的蚀刻后形状。 通过蚀刻剂以两级方式进行薄膜蚀刻方法,并且在两个阶段之间插入使用另一蚀刻剂的光致抗蚀剂去除工艺。 通过执行光致抗蚀剂去除工艺,薄膜可以具有与蚀刻剂的增加的接触面积。 因此,可以消除或改进由现有技术蚀刻的薄膜中存在的任何底切或不期望的后蚀刻形状。
-
公开(公告)号:US07432564B2
公开(公告)日:2008-10-07
申请号:US11960737
申请日:2007-12-20
申请人: Ta-Jung Su , Yea-Chung Shih , Cheng-Fang Su
发明人: Ta-Jung Su , Yea-Chung Shih , Cheng-Fang Su
IPC分类号: H01L29/78
CPC分类号: G02F1/1362 , G02F1/13458
摘要: A method for fabricating a pixel structure is provided. First, a gate, a scan line, and a first terminal are formed on a substrate. A gate insulating layer is formed over the substrate to cover the gate, the scan line, and the first terminal. After defining the semiconductor layer, the gate insulating layer is patterned to exposure the first terminal. A transparent conductive layer is formed over the substrate and a patterned photoresist layer is formed on the transparent conductive layer. The transparent conductive layer is patterned using the patterned photoresist layer as a mask, so as to define a source, a drain, a data line, a pixel electrode, a second terminal, and a contact pad. Because only four photomasks are used to implement the above method for fabricating the pixel structure, the cost of manufacturing can be reduced.
摘要翻译: 提供了一种用于制造像素结构的方法。 首先,在基板上形成栅极,扫描线和第一端子。 栅极绝缘层形成在衬底上以覆盖栅极,扫描线和第一端子。 在限定半导体层之后,栅极绝缘层被图案化以暴露第一端子。 在衬底上形成透明导电层,并且在透明导电层上形成图案化的光致抗蚀剂层。 使用图案化的光致抗蚀剂层作为掩模来图案化透明导电层,以便限定源极,漏极,数据线,像素电极,第二端子和接触焊盘。 由于仅使用四个光掩模来实现用于制造像素结构的上述方法,所以可以降低制造成本。
-
公开(公告)号:US20080128700A1
公开(公告)日:2008-06-05
申请号:US11960737
申请日:2007-12-20
申请人: Ta-Jung Su , Yea-Chung Shih , Cheng-Fang Su
发明人: Ta-Jung Su , Yea-Chung Shih , Cheng-Fang Su
IPC分类号: H01L29/04
CPC分类号: G02F1/1362 , G02F1/13458
摘要: A method for fabricating a pixel structure is provided. First, a gate, a scan line, and a first terminal are formed on a substrate. A gate insulating layer is formed over the substrate to cover the gate, the scan line, and the first terminal. After defining the semiconductor layer, the gate insulating layer is patterned to exposure the first terminal. A transparent conductive layer is formed over the substrate and a patterned photoresist layer is formed on the transparent conductive layer. The transparent conductive layer is patterned using the patterned photoresist layer as a mask, so as to define a source, a drain, a data line, a pixel electrode, a second terminal, and a contact pad. Because only four photomasks are used to implement the above method for fabricating the pixel structure, the cost of manufacturing can be reduced.
摘要翻译: 提供了一种用于制造像素结构的方法。 首先,在基板上形成栅极,扫描线和第一端子。 栅极绝缘层形成在衬底上以覆盖栅极,扫描线和第一端子。 在限定半导体层之后,栅极绝缘层被图案化以暴露第一端子。 在衬底上形成透明导电层,并且在透明导电层上形成图案化的光致抗蚀剂层。 使用图案化的光致抗蚀剂层作为掩模来图案化透明导电层,以便限定源极,漏极,数据线,像素电极,第二端子和接触焊盘。 由于仅使用四个光掩模来实现用于制造像素结构的上述方法,所以可以降低制造成本。
-
公开(公告)号:US07338846B2
公开(公告)日:2008-03-04
申请号:US11306814
申请日:2006-01-12
申请人: Ta-Jung Su , Yea-Chung Shih , Cheng-Fang Su
发明人: Ta-Jung Su , Yea-Chung Shih , Cheng-Fang Su
IPC分类号: H01L21/84
CPC分类号: G02F1/1362 , G02F1/13458
摘要: A method for fabricating a pixel structure is provided. First, a gate, a scan line, and a first terminal are formed on a substrate. A gate insulating layer is formed over the substrate to cover the gate, the scan line, and the first terminal. After defining the semiconductor layer, the gate insulating layer is patterned to exposure the first terminal. A transparent conductive layer is formed over the substrate and a patterned photoresist layer is formed on the transparent conductive layer. The transparent conductive layer is patterned using the patterned photoresist layer as a mask, so as to define a source, a drain, a data line, a pixel electrode, a second terminal, and a contact pad. Because only four photomasks are used to implement the above method for fabricating the pixel structure, the cost of manufacturing can be reduced.
摘要翻译: 提供了一种用于制造像素结构的方法。 首先,在基板上形成栅极,扫描线和第一端子。 栅极绝缘层形成在衬底上以覆盖栅极,扫描线和第一端子。 在限定半导体层之后,栅极绝缘层被图案化以暴露第一端子。 在衬底上形成透明导电层,并且在透明导电层上形成图案化的光致抗蚀剂层。 使用图案化的光致抗蚀剂层作为掩模来图案化透明导电层,以便限定源极,漏极,数据线,像素电极,第二端子和接触焊盘。 由于仅使用四个光掩模来实现用于制造像素结构的上述方法,所以可以降低制造成本。
-
公开(公告)号:US20070161136A1
公开(公告)日:2007-07-12
申请号:US11306814
申请日:2006-01-12
申请人: Ta-Jung Su , Yea-Chung Shih , Cheng-Fang Su
发明人: Ta-Jung Su , Yea-Chung Shih , Cheng-Fang Su
IPC分类号: H01L21/00
CPC分类号: G02F1/1362 , G02F1/13458
摘要: A method for fabricating a pixel structure is provided. First, a gate, a scan line, and a first terminal are formed on a substrate. A gate insulating layer is formed over the substrate to cover the gate, the scan line, and the first terminal. After defining the semiconductor layer, the gate insulating layer is patterned to exposure the first terminal. A transparent conductive layer is formed over the substrate and a patterned photoresist layer is formed on the transparent conductive layer. The transparent conductive layer is patterned using the patterned photoresist layer as a mask, so as to define a source, a drain, a data line, a pixel electrode, a second terminal, and a contact pad. Because only four photomasks are used to implement the above method for fabricating the pixel structure, the cost of manufacturing can be reduced.
摘要翻译: 提供了一种用于制造像素结构的方法。 首先,在基板上形成栅极,扫描线和第一端子。 栅极绝缘层形成在衬底上以覆盖栅极,扫描线和第一端子。 在限定半导体层之后,栅极绝缘层被图案化以暴露第一端子。 在衬底上形成透明导电层,并且在透明导电层上形成图案化的光致抗蚀剂层。 使用图案化的光致抗蚀剂层作为掩模来图案化透明导电层,以便限定源极,漏极,数据线,像素电极,第二端子和接触焊盘。 由于仅使用四个光掩模来实现用于制造像素结构的上述方法,所以可以降低制造成本。
-
-
-
-
-
-
-