公开(公告)号：US08400190B2

公开(公告)日：2013-03-19

申请号：US12565624

申请日：2009-09-23

申请人： Chun-Hsiung Hung ,  Kuen-Long Chang ,  Nai-Ping Kuo ,  Hsieh-Ming Chih

发明人： Chun-Hsiung Hung ,  Kuen-Long Chang ,  Nai-Ping Kuo ,  Hsieh-Ming Chih

IPC分类号： H03K3/00

CPC分类号： H03K3/00 ,  H03K19/0002 ,  H03K19/09425

摘要： An integrated circuit device includes a pad adapted to receive a signal from an internal or external driver, and an input buffer circuit including an input terminal coupled to the pad. The input buffer circuit includes a pass transistor having a control terminal, a first conduction terminal connected to the pad, and a second conduction terminal connected to a first voltage. The input buffer circuit also includes a latch having a terminal electrically coupled to the control terminal of the pass transistor. The input buffer circuit further includes circuitry coupled to the latch, the circuitry including a feedback transistor having a control terminal electrically coupled to the pad, a first conduction terminal electrically coupled to a second voltage, and a second conduction terminal coupled to the latch.

摘要翻译： 集成电路装置包括适于从内部或外部驱动器接收信号的焊盘以及包括耦合到焊盘的输入端的输入缓冲电路。 输入缓冲器电路包括具有控制端子的传输晶体管，连接到焊盘的第一导电端子和连接到第一电压的第二导电端子。 输入缓冲电路还包括具有电耦合到传输晶体管的控制端的端子的锁存器。 所述输入缓冲器电路还包括耦合到所述锁存器的电路，所述电路包括反馈晶体管，所述反馈晶体管具有电耦合到所述焊盘的控制端子，电耦合到第二电压的第一导电端子以及耦合到所述锁存器的第二导电端子。

公开(公告)号：US08797802B2

公开(公告)日：2014-08-05

申请号：US13536555

申请日：2012-06-28

申请人： Chun-Hsiung Hung ,  Kuen-Long Chang ,  Ken-Hui Chen ,  Nai-Ping Kuo ,  Chin-Hung Chang ,  Chang-Ting Chen

发明人： Chun-Hsiung Hung ,  Kuen-Long Chang ,  Ken-Hui Chen ,  Nai-Ping Kuo ,  Chin-Hung Chang ,  Chang-Ting Chen

IPC分类号： G11C11/34

CPC分类号： G11C16/16 ,  G11C16/0483 ,  G11C16/14 ,  G11C29/34 ,  G11C2029/2602

摘要： A nonvolatile memory array has a multiple erase procedures of different durations. A block of memory cells of the array can be erased by one of the different erase procedures.

摘要翻译： 非易失性存储器阵列具有不同持续时间的多个擦除过程。 可以通过不同的擦除过程之一来擦除阵列的存储器单元的块。

公开(公告)号：US20130326184A1

公开(公告)日：2013-12-05

申请号：US13584393

申请日：2012-08-13

申请人： Yu-Meng Chaung ,  Chun-Hsiung Hung ,  Kuen-Long Chang ,  Ken-Hui Chen ,  Nai-Ping Kuo

发明人： Yu-Meng Chaung ,  Chun-Hsiung Hung ,  Kuen-Long Chang ,  Ken-Hui Chen ,  Nai-Ping Kuo

IPC分类号： G06F12/00

CPC分类号： G11C7/1072 ,  G11C7/1066 ,  G11C7/222 ,  G11C2207/104

摘要： A memory apparatus includes a host device and a slave device. The host device stores verification data. The slave device includes a memory unit, a control unit, and a logic unit. The control unit drives the memory unit to provide storage data in a data transmission sub-period, and further provides a control signal, indicating the first verification data, in a dummy sub-period. The logic unit provides first preamble data, indicating substantially a same data value as the verification data, in the dummy sub-period in response to the first control signal. The preamble data and the storage data are transmitted according to an internal clock signal. The host device samples the first preamble data according to an external clock signal, and determines whether the external and the internal clock signals are synchronized by comparing the first preamble data and the first verification data.

摘要翻译： 存储装置包括主机装置和从装置。 主机设备存储验证数据。 从设备包括存储器单元，控制单元和逻辑单元。 控制单元驱动存储单元以在数据传输子时段中提供存储数据，并且还在虚拟子周期中提供指示第一验证数据的控制信号。 逻辑单元响应于第一控制信号，在虚拟子周期中提供与验证数据基本上相同的数据值的第一前同步码数据。 前导码数据和存储数据根据内部时钟信号发送。 主机设备根据外部时钟信号对第一前同步码数据进行采样，并且通过比较第一前导码数据和第一验证数据来确定外部和内部时钟信号是否被同步。

公开(公告)号：US20120262987A1

公开(公告)日：2012-10-18

申请号：US13308266

申请日：2011-11-30

申请人： Nai-Ping Kuo ,  Su-Chueh Lo ,  Kuen-Long Chang ,  Chun-Hsiung Hung ,  Chia-Feng Cheng ,  Ken-Hui Chen ,  Yu-Chen Wang

发明人： Nai-Ping Kuo ,  Su-Chueh Lo ,  Kuen-Long Chang ,  Chun-Hsiung Hung ,  Chia-Feng Cheng ,  Ken-Hui Chen ,  Yu-Chen Wang

IPC分类号： G11C16/10

CPC分类号： G11C16/3409 ,  G11C11/5635 ,  G11C16/0483 ,  G11C16/14

摘要： Techniques are described herein for detecting and recovering over-erased memory cells in a flash memory device. In one embodiment, a flash memory device includes a memory array including a plurality of blocks of memory cells. The device also includes a command interface to receive a command from a source external to the memory device. The device also includes a controller including logic to perform a leakage-suppression process in response to the command. The leakage-suppression process includes performing a soft program operation to increase a threshold voltage of one or more over-erased memory cells in a given block of memory cells and establish an erased state.

摘要翻译： 本文描述了用于检测和恢复闪存设备中的过擦除存储器单元的技术。 在一个实施例中，闪存器件包括包括多个存储单元块的存储器阵列。 该设备还包括用于从存储设备外部的源接收命令的命令接口。 该装置还包括控制器，其包括响应于该命令执行泄漏抑制处理的逻辑。 泄漏抑制处理包括执行软程序操作以增加给定的存储单元块中的一个或多个过擦除存储器单元的阈值电压并建立擦除状态。

公开(公告)号：US07355903B2

公开(公告)日：2008-04-08

申请号：US11181983

申请日：2005-07-15

申请人： Chun-Hsiung Hung ,  Chuan-Ying Yu ,  Han-Sung Chen ,  Nai-Ping Kuo ,  Ching-Chung Lin ,  Kuen-Long Chang

发明人： Chun-Hsiung Hung ,  Chuan-Ying Yu ,  Han-Sung Chen ,  Nai-Ping Kuo ,  Ching-Chung Lin ,  Kuen-Long Chang

IPC分类号： G11C7/10

CPC分类号： G11C16/24

摘要： A semiconductor device, including a memory cell having a control gate, a source and drain; and a current limiting circuit coupled to the source. The current limiting circuit may be configured to limit a current between the drain and source to not exceed a predetermined value; the current being generated in response to application of first and second voltages to the control gate and drain, respectively. The current limiting circuit may include a transistor comprising a first terminal, a second terminal, and a third terminal, wherein the first terminal may include a source of the transistor, the third terminal may include a drain of the transistor, and the second terminal may include a gate of the transistor, and wherein a stable bias may be applied to the second terminal of the transistor.

摘要翻译： 一种半导体器件，包括具有控制栅极，源极和漏极的存储单元; 以及耦合到源极的限流电路。 电流限制电路可以被配置为将漏极和源极之间的电流限制为不超过预定值; 响应于分别向控制栅极和漏极施加第一和第二电压而产生电流。 电流限制电路可以包括包括第一端子，第二端子和第三端子的晶体管，其中第一端子可以包括晶体管的源极，第三端子可以包括晶体管的漏极，并且第二端子可以 包括晶体管的栅极，并且其中可以将稳定的偏压施加到晶体管的第二端子。

公开(公告)号：US08717813B2

公开(公告)日：2014-05-06

申请号：US13308266

申请日：2011-11-30

申请人： Nai-Ping Kuo ,  Su-Chueh Lo ,  Kuen-Long Chang ,  Chun-Hsiung Hung ,  Chia-Feng Cheng ,  Ken-Hui Chen ,  Yu-Chen Wang

发明人： Nai-Ping Kuo ,  Su-Chueh Lo ,  Kuen-Long Chang ,  Chun-Hsiung Hung ,  Chia-Feng Cheng ,  Ken-Hui Chen ,  Yu-Chen Wang

IPC分类号： G11C11/34

CPC分类号： G11C16/3409 ,  G11C11/5635 ,  G11C16/0483 ,  G11C16/14

摘要： Techniques are described herein for detecting and recovering over-erased memory cells in a flash memory device. In one embodiment, a flash memory device includes a memory array including a plurality of blocks of memory cells. The device also includes a command interface to receive a command from a source external to the memory device. The device also includes a controller including logic to perform a leakage-suppression process in response to the command. The leakage-suppression process includes performing a soft program operation to increase a threshold voltage of one or more over-erased memory cells in a given block of memory cells and establish an erased state.

摘要翻译： 本文描述了用于检测和恢复闪存设备中的过擦除存储器单元的技术。 在一个实施例中，闪存器件包括包括多个存储单元块的存储器阵列。 该设备还包括用于从存储设备外部的源接收命令的命令接口。 该装置还包括控制器，其包括响应于该命令执行泄漏抑制处理的逻辑。 泄漏抑制处理包括执行软程序操作以增加给定的存储单元块中的一个或多个过擦除存储器单元的阈值电压并建立擦除状态。

公开(公告)号：US20130242665A1

公开(公告)日：2013-09-19

申请号：US13536555

申请日：2012-06-28

申请人： Chun-Hsiung Hung ,  Kuen-Long Chang ,  Ken-Hui Chen ,  Nai-Ping Kuo ,  Chin-Hung Chang ,  Chang-Ting Chen

发明人： Chun-Hsiung Hung ,  Kuen-Long Chang ,  Ken-Hui Chen ,  Nai-Ping Kuo ,  Chin-Hung Chang ,  Chang-Ting Chen

IPC分类号： G11C16/16

CPC分类号： G11C16/16 ,  G11C16/0483 ,  G11C16/14 ,  G11C29/34 ,  G11C2029/2602

摘要： A nonvolatile memory array has a multiple erase procedures of different durations. A block of memory cells of the array can be erased by one of the different erase procedures.

摘要翻译： 非易失性存储器阵列具有不同持续时间的多个擦除过程。 可以通过不同的擦除过程之一来擦除阵列的存储器单元的块。

公开(公告)号：US20120262988A1

公开(公告)日：2012-10-18

申请号：US13308301

申请日：2011-11-30

申请人： Nai-Ping Kuo ,  Su-Chueh Lo ,  Kuen-Long Chang ,  Chun-Hsiung Hung ,  Chia-Feng Cheng ,  Ken-Hui Chen ,  Yu-Chen Wang

发明人： Nai-Ping Kuo ,  Su-Chueh Lo ,  Kuen-Long Chang ,  Chun-Hsiung Hung ,  Chia-Feng Cheng ,  Ken-Hui Chen ,  Yu-Chen Wang

IPC分类号： G11C16/10

CPC分类号： G11C16/3409 ,  G11C11/5635 ,  G11C16/0483 ,  G11C16/14

摘要： Techniques are described herein for detecting and recovering over-erased memory cells in a flash memory device. In one embodiment, a flash memory device is described including a memory array including a plurality of blocks of memory cells. The device also includes a controller to perform a leakage-suppression process. The leakage-suppression process includes determining that a given block of memory cells includes one or more over-erased memory cells. Upon the determination, the leakage-suppression process also includes performing a soft program operation to increase the threshold voltage of the over-erased memory cells in the given block.

摘要翻译： 本文描述了用于检测和恢复闪存设备中的过擦除存储器单元的技术。 在一个实施例中，描述了一种闪存器件，其包括包括多个存储器单元块的存储器阵列。 该装置还包括执行泄漏抑制处理的控制器。 泄漏抑制过程包括确定给定的存储单元块包括一个或多个过擦除存储器单元。 在确定时，泄漏抑制处理还包括执行软程序操作以增加给定块中的被擦除的存储器单元的阈值电压。

公开(公告)号：US08929139B2

公开(公告)日：2015-01-06

申请号：US13308301

申请日：2011-11-30

申请人： Nai-Ping Kuo ,  Su-Chueh Lo ,  Kuen-Long Chang ,  Chun-Hsiung Hung ,  Chia-Feng Cheng ,  Ken-Hui Chen ,  Yu-Chen Wang

发明人： Nai-Ping Kuo ,  Su-Chueh Lo ,  Kuen-Long Chang ,  Chun-Hsiung Hung ,  Chia-Feng Cheng ,  Ken-Hui Chen ,  Yu-Chen Wang

IPC分类号： G11C11/34 ,  G11C16/04 ,  G11C16/34 ,  G11C11/56 ,  G11C16/14

CPC分类号： G11C16/3409 ,  G11C11/5635 ,  G11C16/0483 ,  G11C16/14

摘要： Techniques are described herein for detecting and recovering over-erased memory cells in a flash memory device. In one embodiment, a flash memory device is described including a memory array including a plurality of blocks of memory cells. The device also includes a controller to perform a leakage-suppression process. The leakage-suppression process includes determining that a given block of memory cells includes one or more over-erased memory cells. Upon the determination, the leakage-suppression process also includes performing a soft program operation to increase the threshold voltage of the over-erased memory cells in the given block.

摘要翻译： 本文描述了用于检测和恢复闪存设备中的过擦除存储器单元的技术。 在一个实施例中，描述了一种闪存器件，其包括包括多个存储器单元块的存储器阵列。 该装置还包括执行泄漏抑制处理的控制器。 泄漏抑制过程包括确定给定的存储单元块包括一个或多个过擦除存储器单元。 在确定时，泄漏抑制处理还包括执行软程序操作以增加给定块中的被擦除的存储器单元的阈值电压。

公开(公告)号：US20130214820A1

公开(公告)日：2013-08-22

申请号：US13845576

申请日：2013-03-18

申请人： Chun-Hsiung Hung ,  Kuen-Long Chang ,  Nai-Ping Kuo ,  Ming-Chih Hsieh

发明人： Chun-Hsiung Hung ,  Kuen-Long Chang ,  Nai-Ping Kuo ,  Ming-Chih Hsieh

IPC分类号： H03K3/00

CPC分类号： H03K3/00 ,  H03K19/0002 ,  H03K19/09425

摘要： An integrated circuit device includes a pad adapted to receive a signal from an internal or external driver, and an input buffer circuit including an input terminal coupled to the pad. The input buffer circuit includes a pass transistor having a control terminal, a first conduction terminal connected to the pad, and a second conduction terminal connected to a first voltage. The input buffer circuit also includes a latch having a terminal electrically coupled to the control terminal of the pass transistor. The input buffer circuit further includes circuitry coupled to the latch, the circuitry including a feedback transistor having a control terminal electrically coupled to the pad, a first conduction terminal electrically coupled to a second voltage, and a second conduction terminal coupled to the latch.

摘要翻译： 集成电路装置包括适于从内部或外部驱动器接收信号的焊盘以及包括耦合到焊盘的输入端的输入缓冲电路。 输入缓冲器电路包括具有控制端子的传输晶体管，连接到焊盘的第一导电端子和连接到第一电压的第二导电端子。 输入缓冲电路还包括具有电耦合到传输晶体管的控制端的端子的锁存器。 所述输入缓冲器电路还包括耦合到所述锁存器的电路，所述电路包括反馈晶体管，所述反馈晶体管具有电耦合到所述焊盘的控制端子，电耦合到第二电压的第一导电端子以及耦合到所述锁存器的第二导电端子。