摘要:
The present invention is intended to enable a efficient water-sealing treatment for an on-vehicle electric cable 10, i.e., an electric cable to be mounted on a vehicle, the cable having a conductor and a sheath disposed on the outside of the conductor, regardless of a length of the electric cable. The present invention provides a method comprising the step of establishing a state where a water-sealing agent 18 with fluidity covers a gap between the conductor and the sheath in an end of the on-vehicle electric cable 10, for example, through an operation of dropping the water-sealing agent 18 onto the end of the on-vehicle electric cable 10, and the step of pressurizing an ambient air around the water-sealing agent 18 to cause the water-sealing agent 18 to penetrate into the inside of the sheath of the on-vehicle electric cable 10.
摘要:
According to one embodiment, a memory system includes: a memory area; a transfer processing unit that stores write data received from a host apparatus in the memory area; a delete notification buffer that accumulates a delete notification; and a delete notification processing unit. The delete notification processing unit collectively reads out a plurality of delete notifications from the delete notification buffer and classifies the read-out delete notifications for each unit area. The delete notification processing unit sequentially executes, for each unit area, processing for collectively invalidating write data related to one or more delete notifications classified in a same unit area and, in executing processing for one unit area in the processing sequentially executed for the each unit area, invalidates all write data stored in the one unit area after copying write data excluding write data to be invalidated stored in the one unit area to another unit area.
摘要:
According to one embodiment, a semiconductor storage device includes a nonvolatile semiconductor memory and a controller. The nonvolatile semiconductor memory includes a firmware area capable of storing firmware used to execute either a normal mode or an autorun test mode and a user area capable of storing user data. The controller reads the firmware from the nonvolatile semiconductor memory and determines whether the firmware has been set in either the normal mode or the autorun test mode. The controller repeats erasing, writing, and reading in each block in the user area using a cell applied voltage higher than a voltage used in a normal mode, and enters a block where an error has occurred as a bad block.
摘要:
A ferroelectric random access memory device has a first bit line, a first ferroelectric capacitor, a second bit line, a second ferroelectric capacitor and a first to fourth MOS transistor. The first bit line is changed to a first data potential according to first data stored in the first ferroelectric capacitor, the second bit line is changed to a second data potential according to second data obtained by inverting a logic of the first data, and then the second MOS transistor and the fourth MOS transistor are turned on.
摘要:
A ferro-electric random access memory apparatus has a memory cell array in which a plurality of memory cells each formed of a ferro-electric capacitor and a transistor are arranged, word lines are disposed to select a memory cell, plate lines are disposed to apply a voltage to a first end of the ferro-electric capacitor in a memory cell, and bit lines are disposed to read cell data from a second end of the ferro-electric capacitor in the memory cell. The ferro-electric random access memory apparatus has a sense amplifier which senses and amplifies a signal read from the ferro-electric capacitor onto the bit line. The ferro-electric random access memory apparatus has a bit line potential control circuit which exercises control to pull down a voltage on an adjacent bit line adjacent to the selected bit line onto which the signal is read, before operation of the sense amplifier at time of data readout.
摘要:
A ferroelectric memory according to an embodiment of the present invention includes a memory cell array including plural memory cells, and provided with plural word lines, plural bit lines, and plural plate lines, each of the plate lines corresponding to at least two of the word lines, an access control circuit configured to perform an access operation to a selected cell which is selected from the memory cells, and a refresh control circuit configured to perform a refresh operation, in a background of the access operation, on a refresh cell which is selected from the memory cells, the refresh control circuit performing the refresh operation when a plate line connected to the selected cell and a bit line connected to the selected cell are at the same potential after the access operation.
摘要:
The present invention relates to a Cu—Ni—Sn—P-based copper alloy sheet having a specific composition, where (1) the copper alloy sheet is set to have an electrical conductivity of 32% IACS or more, a stress relaxation ratio in the direction parallel to the rolling direction of 15% or less, a 0.2%-proof stress of 500 MPa or more and an elongation of 10% or more; (2) the X-ray diffraction intensity ratio I(200)/I(220) in the sheet surface is set to be a given value or less and at the same time, anisotropy in the stress relaxation resistance characteristic is reduced by fining the grain size; (3) the texture of the copper alloy sheet is set to a texture such that the distribution density of B orientation and the sum of distribution densities of B orientation, S orientation and Cu orientation each is set to fall in a specific range and bendability is thereby enhanced; or (4) the dislocation density measured using the value obtained by dividing the half-value breadth of the X-ray diffraction intensity peak from {200} plane in the copper alloy sheet surface by the peak height is set to a given value or more and press punchability is thereby enhanced. The Cu—Ni—Sn—P-based copper alloy sheet of the present invention is excellent in the properties required for a terminal or connector and further (1) has excellent strength-ductility balance, (2) satisfies the stress relaxation resistance characteristic in the direction orthogonal to the rolling direction, (3) has excellent bendability, or (4) has excellent press punchability.
摘要:
Disclosed is an electroless nickel plating bath not containing harmful metal species. In the electroless nickel plating bath, there are contained at least an iron ion source and an iodide ion source. With the use of the electroless nickel plating bath containing at least the iron ion source and the iodide ion source, it is possible to suppress decomposition of the plating bath without using harmful metal species to stabilize the plating bath.
摘要:
An electromagnetic wave shielding sheet includes a transparent substrate 11 and a metal layer 15 provided on one surface of the transparent substrate 11 through an adhesive layer 13. The metal layer 15 includes a mesh part 103 and a frame part 101 surrounding the mesh part 103. The frame part 101 includes at least one transparent part 105 that is a metal-layer-free area. Preferably, the transparent part 105 includes a metallic portion 105a in a geometric pattern. Light transmitted by or reflected from the transparent part 105 is detected, thereby the transparent part 105 can be used as a register mark for detecting the position of the mesh part 103.
摘要:
A memory system of a embodiments includes a first storing area having physical blocks and a second storing area recording a logical to physical translation table and an erasure count table keeping data erasure count in physical blocks. The memory system of the embodiments includes a controller which, when a logical address for deletion is notified, obtains data erasure count of a deletion physical block including a deletion area specified by the physical address corresponding to the logical address, and when a physical block having a small erasure count not more than a predetermined rate of the data erasure count exists in the erasure count table, reads out valid data for the memory system in the physical block having a small erasure count onto the second storing area, writes the above data into the deletion area, and invalidates the valid data in the physical block having a small erasure count.