Probe contact system having planarity adjustment mechanism
    5.
    发明授权
    Probe contact system having planarity adjustment mechanism 失效
    具有平面度调节机构的探头接触系统

    公开(公告)号:US06677771B2

    公开(公告)日:2004-01-13

    申请号:US10233963

    申请日:2002-09-03

    IPC分类号: G01R2700

    摘要: A probe contact system is capable of adjusting distances between tips of the contactors and contact targets with simple and low cost mechanism. The probe contact system includes a contact substrate having a large number of contactors, a probe card for fixedly mounting the contact substrate for establishing electrical communication between the contactors and a test system, a probe card ring attached to a frame of the probe contact system for mechanically coupling the probe card to the frame, and a plurality of adjustment members for up/down moving the probe card relative to the probe card ring at three or more locations on the probe card. Each of the adjustment members is housed within a through hole formed on the probe card.

    摘要翻译: 探头接触系统能够以简单且低成本的机制调节接触器的尖端和接触目标之间的距离。 探针接触系统包括具有大量接触器的接触基板,用于固定地安装用于建立接触器和测试系统之间的电气连通的接触基板的探针卡,附接到探针接触系统的框架的探针卡环, 将探针卡机械耦合到框架,以及多个调节构件,用于在探针卡上的三个或更多个位置处相对于探针卡环上下移动探针卡。 每个调节构件容纳在形成在探针卡上的通孔内。

    Probe contact system having planarity adjustment mechanism
    9.
    发明授权
    Probe contact system having planarity adjustment mechanism 失效
    具有平面度调节机构的探头接触系统

    公开(公告)号:US06762612B2

    公开(公告)日:2004-07-13

    申请号:US10233935

    申请日:2002-09-03

    IPC分类号: G01R3102

    CPC分类号: G01R1/07314 G01R1/07342

    摘要: A probe contact system is capable of adjusting distances between tips of the contactors and contact targets with simple and low cost mechanism. The probe contact system includes a contact substrate having a large number of contactors, a probe card for fixedly mounting the contact substrate for establishing electrical communication between the contactors and a test system, a stiffener made of rigid material for fixedly mounting and reinforcing the probe card, a probe card ring attached to a frame of the probe contact system for mechanically coupling the probe card to the frame, and a plurality of adjustment members for up/down moving the stiffener relative to the probe card ring at three or more locations so that a gap between the probe card and the probe card ring can be altered.

    摘要翻译: 探头接触系统能够以简单且低成本的机制调节接触器的尖端和接触目标之间的距离。 探针接触系统包括具有大量接触器的接触基板,用于固定地安装用于建立接触器和测试系统之间的电气连接的接触基板的探针卡,用于固定地安装和加强探针卡的刚性材料制成的加强件 附接到探针接触系统的框架的探针卡环,用于将探针卡机械地耦合到框架;以及多个调节构件,用于在三个或更多个位置上使加强件相对于探针卡环上下移动,使得 可以改变探针卡和探针卡环之间的间隙。