Method for high performance inductor fabrication using a triple damascene process with copper BEOL
    1.
    发明授权
    Method for high performance inductor fabrication using a triple damascene process with copper BEOL 有权
    使用铜BEOL的三重镶嵌工艺的高性能电感器制造方法

    公开(公告)号:US07399696B2

    公开(公告)日:2008-07-15

    申请号:US11161415

    申请日:2005-08-02

    IPC分类号: H01L21/4763

    摘要: A method of forming a high performance inductor comprises providing a substrate; forming a plurality of wiring levels over the substrate, wherein each of the wiring levels comprise a dielectric layer; forming a first trench having a first depth in a first dielectric layer on a first wiring level; forming a second trench in the first dielectric layer having a second depth extending at least into a second wiring level; forming a conductor layer substantially simultaneously in the first and second trenches; and removing portions of the conductor layer overfilling the first and second trenches to form a spiral-shaped inductor in the second trench. The method may further comprise forming an interconnect structure in the first trench.

    摘要翻译: 形成高性能电感器的方法包括:提供衬底; 在衬底上形成多个布线层,其中每个布线层包括介电层; 在第一布线层上形成在第一介电层中具有第一深度的第一沟槽; 在所述第一介电层中形成具有至少延伸至第二布线层的第二深度的第二沟槽; 在第一和第二沟槽中基本上同时地形成导体层; 以及去除超过第一和第二沟槽的导体层的部分,以在第二沟槽中形成螺旋形电感器。 该方法还可以包括在第一沟槽中形成互连结构。

    Structure and design structure for high-Q value inductor and method of manufacturing the same
    2.
    发明授权
    Structure and design structure for high-Q value inductor and method of manufacturing the same 有权
    高Q值电感器的结构和设计结构及其制造方法

    公开(公告)号:US08232173B2

    公开(公告)日:2012-07-31

    申请号:US12917029

    申请日:2010-11-01

    IPC分类号: H01L21/20

    摘要: Structures with high-Q value inductors, design structure for high-Q value inductors and methods of fabricating such structures is disclosed herein. A method in a computer-aided design system for generating a functional design model of an inductor is also provided. The method includes: generating a functional representation of a plurality of vertical openings simultaneously formed in a substrate, wherein a first of the plurality of vertical openings is used as through silicon vias and is etched deeper than a second of the plurality of vertical openings used for high-Q inductors; generating a functional representation of a dielectric layer formed in the plurality of vertical openings; and generating a functional representation of a metal layer deposited on the dielectric layer in the plurality of vertical.

    摘要翻译: 具有高Q值电感器的结构,高Q值电感器的设计结构和制造这种结构的方法在本文中公开。 还提供了一种用于产生电感器的功能设计模型的计算机辅助设计系统中的方法。 该方法包括:产生同时形成在衬底中的多个垂直开口的功能性表示,其中多个垂直开口中的第一个用作通过硅通孔,并且被蚀刻比用于多个垂直开口的多个垂直开口中的第二个 高Q电感; 产生形成在所述多个垂直开口中的电介质层的功能性表示; 以及生成沉积在所述多个垂直方向上的所述电介质层上的金属层的功能表示。

    Structure and design structure for high-Q value inductor and method of manufacturing the same
    3.
    发明授权
    Structure and design structure for high-Q value inductor and method of manufacturing the same 有权
    高Q值电感器的结构和设计结构及其制造方法

    公开(公告)号:US08645898B2

    公开(公告)日:2014-02-04

    申请号:US13535412

    申请日:2012-06-28

    IPC分类号: G06F17/50 H01L27/08

    摘要: Structures with high-Q value inductors, design structure for high-Q value inductors and methods of fabricating such structures is disclosed herein. A method in a computer-aided design system for generating a functional design model of an inductor is also provided. The method includes: generating a functional representation of a plurality of vertical openings simultaneously formed in a substrate, wherein a first of the plurality of vertical openings is used as through silicon vias and is etched deeper than a second of the plurality of vertical openings used for high-Q inductors; generating a functional representation of a dielectric layer formed in the plurality of vertical openings; and generating a functional representation of a metal layer deposited on the dielectric layer in the plurality of vertical.

    摘要翻译: 具有高Q值电感器的结构,高Q值电感器的设计结构和制造这种结构的方法在本文中公开。 还提供了一种用于产生电感器的功能设计模型的计算机辅助设计系统中的方法。 该方法包括:产生同时形成在衬底中的多个垂直开口的功能表示,其中多个垂直开口中的第一个用作通过硅通孔,并且被蚀刻比用于多个垂直开口 高Q电感; 产生形成在所述多个垂直开口中的电介质层的功能性表示; 以及生成沉积在所述多个垂直方向上的所述电介质层上的金属层的功能表示。

    METHOD FOR HIGH PERFORMANCE INDUCTOR FABRICATION USING A TRIPLE DAMASCENE PROCESS WITH COPPER BEOL
    4.
    发明申请
    METHOD FOR HIGH PERFORMANCE INDUCTOR FABRICATION USING A TRIPLE DAMASCENE PROCESS WITH COPPER BEOL 有权
    高性能电感器制造方法使用三倍体大黄方法

    公开(公告)号:US20070032030A1

    公开(公告)日:2007-02-08

    申请号:US11161415

    申请日:2005-08-02

    IPC分类号: H01L21/44

    摘要: A method of forming a high performance inductor comprises providing a substrate; forming a plurality of wiring levels over the substrate, wherein each of the wiring levels comprise a dielectric layer; forming a first trench having a first depth in a first dielectric layer on a first wiring level; forming a second trench in the first dielectric layer having a second depth extending at least into a second wiring level; forming a conductor layer substantially simultaneously in the first and second trenches; and removing portions of the conductor layer overfilling the first and second trenches to form a spiral-shaped inductor in the second trench. The method may further comprise forming an interconnect structure in the first trench.

    摘要翻译: 形成高性能电感器的方法包括:提供衬底; 在衬底上形成多个布线层,其中每个布线层包括介电层; 在第一布线层上形成在第一介电层中具有第一深度的第一沟槽; 在所述第一介电层中形成具有至少延伸至第二布线层的第二深度的第二沟槽; 在第一和第二沟槽中基本上同时地形成导体层; 以及去除超过第一和第二沟槽的导体层的部分,以在第二沟槽中形成螺旋形电感器。 该方法还可以包括在第一沟槽中形成互连结构。

    SEMICONDUCTOR GROUND SHIELD
    10.
    发明申请
    SEMICONDUCTOR GROUND SHIELD 有权
    半导体接地屏蔽

    公开(公告)号:US20090146247A1

    公开(公告)日:2009-06-11

    申请号:US12371662

    申请日:2009-02-16

    IPC分类号: H01L29/70

    摘要: A ground shield is disclosed that includes a ‘cheesed’ metal positioned within a dielectric layer and a metal region positioned within a first metal level over the cheesed metal. The ground shield can have different forms depending on the metal used, and provisions are made to prevent diffusion of copper (Cu) when that is used as the metal in the cheese metal of the ground shield. The ground shield provides a low resistance, very thick metal at a first metal (M1) level for passive RF elements in conjunction with the standard back-end-of-line (BEOL) integration. The invention also includes a method of forming the ground shield.

    摘要翻译: 公开了一种接地屏蔽,其包括位于电介质层内的“干酪”金属和位于干酪金属上的第一金属层内的金属区域。 接地屏蔽可以根据所使用的金属具有不同的形式,并且当用作接地屏蔽的奶酪金属中的金属时,设置防止铜(Cu)的扩散。 接地屏蔽为第一金属(M1)级别提供低电阻,非常厚的金属,用于与标准后端(BEOL)集成结合的无源RF元件。 本发明还包括形成接地屏蔽的方法。