Powder supply apparatus and plating system

    公开(公告)号:US11359304B2

    公开(公告)日:2022-06-14

    申请号:US16234299

    申请日:2018-12-27

    Abstract: There is provided a powder supply apparatus that prevents powder from scattering as much as possible. There is provided the powder supply apparatus that supplies a powder containing a metal used for a plating to a plating solution. This powder supply apparatus includes a plating solution tank, a feed pipe, a gas supply line, and a spiral-air-flow-generating component. The plating solution tank is configured to house the plating solution. The feed pipe is configured to feed the powder into the plating solution tank. The gas supply line is configured to supply a gas. The spiral-air-flow-generating component is configured to receive the gas from the gas supply line to generate a spiral air flow heading toward the plating solution tank inside the feed pipe.

    Method of cleaning substrate holder

    公开(公告)号:US10119198B2

    公开(公告)日:2018-11-06

    申请号:US15163588

    申请日:2016-05-24

    Abstract: A method of cleaning a substrate holder comprises suspending the substrate holder in a substrate holder cleaning bath while the substrate holder holds a dummy substrate with a sealing member sealing a peripheral portion of the dummy substrate. The dummy substrate has a larger area of contact with a substrate contact portion of the sealing member and has a larger area of contact with a substrate contact portion of an electrical contact of the substrate holder than those of a substrate to be plated. The method further comprises supplying a cleaning liquid into the substrate holder cleaning bath until the substrate holder is immersed in the cleaning liquid to clean the substrate holder. Different types of cleaning liquids are individually and sequentially supplied into the substrate holder cleaning bath to clean the substrate holder sequentially with the cleaning liquids.

    Substrate holder, plating apparatus, and plating method

    公开(公告)号:US10113246B2

    公开(公告)日:2018-10-30

    申请号:US15116197

    申请日:2015-01-29

    Abstract: A substrate holder includes: inner contacts (45) to be brought into contact with a periphery of a substrate (W) for passing an electric current to the substrate; outer contacts (42) each having elasticity, the outer contacts (42) having contact surfaces (42a), respectively, to be brought into contact with a feeding terminal (51) coupled to a power source (18), the outer contacts (42) being coupled to the inner contacts (45), respectively; and a conductive block (60) arranged in back of the contact surfaces (42a) and located away from the outer contacts (42). The outer contacts (42) are deformable until the outer contacts (42) are brought into contact with the conductive block (60) when the contact surfaces (42a) are pressed against the feeding terminal (51).

    Powder supply apparatus and plating system

    公开(公告)号:US12116687B2

    公开(公告)日:2024-10-15

    申请号:US17722879

    申请日:2022-04-18

    CPC classification number: C25D21/16 C25D17/00 C25D17/02 C25D21/14 C25D21/18

    Abstract: There is provided a powder supply apparatus that prevents powder from scattering as much as possible. There is provided the powder supply apparatus that supplies a powder containing a metal used for a plating to a plating solution. This powder supply apparatus includes a plating solution tank, a feed pipe, a gas supply line, and a spiral-air-flow-generating component. The plating solution tank is configured to house the plating solution. The feed pipe is configured to feed the powder into the plating solution tank. The gas supply line is configured to supply a gas. The spiral-air-flow-generating component is configured to receive the gas from the gas supply line to generate a spiral air flow heading toward the plating solution tank inside the feed pipe.

    Leak check method, leak check apparatus, plating method, and plating apparatus

    公开(公告)号:US11385125B2

    公开(公告)日:2022-07-12

    申请号:US16711983

    申请日:2019-12-12

    Abstract: A leak check method includes: performing a first inspection of measuring a pressure in an internal space formed by a seal of the substrate holder, while evacuating the internal space, and detecting that the pressure reaches a first pressure threshold value within a predetermined first inspection time; performing a second inspection of closing the internal space that has been evacuated, measuring the pressure in the closed internal space, and detecting that the pressure in the closed internal space does not exceed a second pressure threshold value within a predetermined second inspection time; and performing a third inspection of measuring a pressure difference between the pressure in the closed internal space and a vacuum pressure in a master container, and detecting that an amount of increase in the pressure difference within a predetermined third inspection time is kept equal to or below a pressure difference threshold value.

    METHOD AND APPARATUS FOR PROCESSING A SUBSTRATE

    公开(公告)号:US20180179656A1

    公开(公告)日:2018-06-28

    申请号:US15849371

    申请日:2017-12-20

    Abstract: A method which can perform a soft pre-wetting treatment of a substrate, such as a wafer, with use of a pre-wetting liquid in a smaller amount. This method includes: holding a substrate between a first holding member and a second holding member, with the surface of the substrate being exposed through an opening of the second holding member, and pressing a sealing ridge of the substrate holder against a peripheral portion of the substrate; pressing a sealing block against the substrate holder; forming a vacuum in an external space; performing a seal inspection to check a sealed state provided by the sealing ridge based on a change in pressure in the external space; and performing a pre-wetting treatment by supplying a pre-wetting liquid to the external space while evacuating air from the external space to bring the pre-wetting liquid into contact with the exposed surface of the substrate.

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