摘要:
Latch-up propagation is periodically triggered and the intensity of infrared radiation emanating from a CMOS circuit is successively detected at a plurality of measuring points covering the circuit in a grid-like manner at prescribed points in time after the appearance of the trigger signal which triggers latch-up and a measured value representing the intensity of infrared radiation is recorded in a location-dependent manner. The measured values are monitored with a display and the intensity thereof is utilized as the brightness control for the picture elements. Also, the measured values are stored in an image store.
摘要:
Since known methods for investigating latch-up propagation have only a comparatively slight chronological resolution, a method and apparatus are proposed in which latch-up is periodically triggered and the intensity of the infrared radiation emanating from an integrated circuit is sensed at a plurality of measuring points that cover the circuit in a grid-like manner in order to respectively determine, at the measuring points, within what time span the intensity of the infrared radiation reaches a threshold, and to respectively register a measured value representing the time interval in a location-dependent manner.
摘要:
An electrostatic-magnetic lens is provided having either a symmetrical or asymmetrical magnetic lens which is overlaid with an electrostatic immersion lens. One electrode of the immersion lens is formed as a hollow cylinder, which is within an upper pole piece of the magnetic lens concentrically relative to the axis of symmetry thereof and extending into the region of the pole piece gap. The lower pole piece of the magnetic lens is preferably at a ground potential and clad with the beam guiding tube for protection against contamination and forming the lower electrode of the electrostatic immersion lens.
摘要:
A spectrometer-lens for particle beam apparatus is formed by a short focal length magnetic lens having an integrated electrostatic retarding field spectrometer and a single-stage deflection unit arranged within said lens. To avoid deflecting secondary particles that are triggered at a specimen by a primary particle beam, nearly uniform electrical and magnetic deflection fields are generated by the deflection unit oriented relative to one another such that their field vectors reside perpendicular to one another and respectively perpendicular to a velocity vector of the secondary particles attracted from the specimen.
摘要:
An apparatus for deflecting and focusing a beam of neutral particles for operating on extremely small workpieces, such as for doping or inscribing micro-electronic components, has a deflection system for generating at least one magnetic field through which the beam of neutral particles is directed for focusing and shaping of the beam on the workpiece. The lens system may include one or more six-pole or eight-pole lenses.
摘要:
A corpuscular beam blanking system for generating high-frequency corpuscular pulses with monochromator effect utilizes a three-electrode Einzel-lens designed as a filter lens and which is employed as a blanking lens. A "breathing" effect of a probe spot of the corpuscular beam is avoided and a monochromator effect is achieved with a blanking pin-hole diaphragm positioned after the blanking lens.
摘要:
Conventional beam blanking system generate electron pulses having a minimum width of about 100 through 200 ps. Although a reduction of the pulse width to a few tens of picoseconds is fundamentally possible, the reduction of the probe current accompanying this would result to a considerable lengthening of the measuring times. In the invention a photo-cathode (PK) is charged by a pulsed laser beam (LA) which is attached to the column of an electron beam measuring instrument and the photo-electron source is stigmatically imaged onto the beam axis (OA1) using a focusing deflection unit (SFM). A sector field magnet is used as a focusing deflection unit (SFM).
摘要:
For indirect identification of an intensity distribution of particle beam pulses generated in a particle beam measuring instrument by use of a beam blanking system, a signal s(t) known in terms of its time-dependency is periodically fed into a specimen and stroboscopically sampled according to the sampling principle. The desired intensity distribution of the particle beam pulses is subsequently calculated by de-convolution of the measured signal h(t) recorded by the measuring chain.
摘要:
A deflection structure for a corpuscular beam blanking system has two deflection electrodes, a first of which is supplied with a chronologically varying potential, the second of which being connected to a chronologically constant potential for generating standard corpuscular beam pulses. The structure further includes auxiliary electrodes disposed in front of and behind the deflection electrodes in the direction of beam travel for reducing the energy spread of the corpuscular beam, the auxiliary electrodes being supplied with a static voltage.
摘要:
The invention relates to a monochromator on the basis of Wien filters. According to a first aspect, four Wien filters are arranged in series along a common optical axis of which the two center Wien filters are each rotated by 90° relative to the two outer Wien filters. The two center Wien filters (W2, W3) are orientated simultaneously anti-parallel to each other. Such a monochromator has inherent stigmatic imaging characteristics and is, as a unit, free of dispersion. According to a further aspect, each of the Wien filters is configured symmetrically with reference to a 90° rotation about the optical axis. The magnetic and the electrostatic poles of the Wien filter are identically dimensioned so that the orientation of the Wien filter azimuthally about the optical axis (OA) can be varied by a corresponding drive of the particular contacts for the voltage supply and current supply of the electrodes and coils.