Apparatus for doping a semiconductor crystalline rod
    2.
    发明授权
    Apparatus for doping a semiconductor crystalline rod 失效
    用于掺杂半导体结晶棒的装置

    公开(公告)号:US4048508A

    公开(公告)日:1977-09-13

    申请号:US603680

    申请日:1975-08-11

    CPC分类号: G21K1/00 C30B31/20 G21K5/08

    摘要: An apparatus for doping a semiconductor crystalline rod by nuclear or radiogenic reactions comprised of a hollow irradiation housing having axially and rotatably movable rod support means within the chamber thereof and a neutron conductive sleeve connected with the housing and providing communication between a neutron source and the housing chamber. Accurate and controlled doping of a semiconductor crystalline rod mounted on the rod support means within the housing chamber occurs via controlled rod movement in relation to the neutron source.

    摘要翻译: 一种用于通过核或放射反应掺杂半导体晶体棒的装置,包括在其室内具有轴向和可旋转地移动的杆支撑装置的中空辐射壳体和与壳体连接并提供中子源和壳体之间的连通的中子导电套筒 房间。 安装在壳体室内的杆支撑装置上的半导体晶体棒的精确和受控的掺杂通过相对于中子源的受控棒移动发生。

    Method for manufacturing regions having adjustable uniform doping in
silicon crystal wafers by neutron irradiation
    5.
    发明授权
    Method for manufacturing regions having adjustable uniform doping in silicon crystal wafers by neutron irradiation 失效
    用于通过中子照射制造在硅晶片中具有可调均匀掺杂的区域的方法

    公开(公告)号:US4728371A

    公开(公告)日:1988-03-01

    申请号:US838326

    申请日:1986-03-11

    摘要: A method for manufacturing regions having adjustable uniform doping in silicon crystal wafers by neutron irradiation according to the reaction Si.sup.30 (n,.gamma.) Si.sup.31 .beta..sup.- P.sup.31 includes the steps of covering the silicon crystal wafer with neutron-absorbing materials of different thicknesses during the irradiation, and selecting materials having isotopes having a high absorption cross-section which yield stable isotopes in the nuclear reaction having small or short-lived activity. Suitable isotopes are B.sup.10, Cd.sup.113, Sm.sup.149, Gd.sup.155 and Gd.sup.157. The regions are generated photolithographically. By such specific material selection, very small layer thicknesses can be used and microfine surface zones or areas can be doped with high geometrical precision and large penetration depth. The method is particularly suited for manufacturing power thyristors.

    摘要翻译: 根据反应Si30(n,γ)Si31β-P31通过中子照射在硅晶片中制造具有可调均匀掺杂的区域的方法包括以下步骤:在照射期间用不同厚度的中子吸收材料覆盖硅晶片 以及选择具有高吸收截面的同位素的材料,其在具有小或短寿命的核反应中产生稳定的同位素。 合适的同位素是B10,Cd113,Sm149,Gd155和Gd157。 光刻地产生这些区域。 通过这样的具体材料选择,可以使用非常小的层厚度,并且可以以高几何精度和大的穿透深度掺杂微细表面区域或区域。 该方法特别适用于制造功率晶闸管。