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公开(公告)号:US20150035384A1
公开(公告)日:2015-02-05
申请号:US14337627
申请日:2014-07-22
发明人: Ahmad R. ASHRAFZADEH
IPC分类号: H03K17/94
CPC分类号: H03K17/0828 , H01L2224/48145 , H01L2224/48247 , H01L2224/48257 , H01L2224/49111 , H01L2924/13055 , H03K17/127 , H03K2017/0806 , Y10T307/773 , H01L2924/00 , H01L2924/00012
摘要: In a general aspect, an apparatus can include a temperature measurement circuit configured to produce a first signal indicating a first operating temperature of a first semiconductor device and a temperature comparison circuit operationally coupled with the temperature measurement circuit. The temperature comparison circuit can be configured to compare the first signal with a second signal indicating a second operating temperature of at least a second semiconductor device and produce a comparison signal indicating whether the indicated first operating temperature is higher, lower or equal to the indicated second operating temperature. The apparatus can also include an adjustment circuit configured to adjust operation of the first semiconductor device based on the comparison signal.
摘要翻译: 在一般方面,装置可以包括温度测量电路,其被配置为产生指示第一半导体器件的第一工作温度的第一信号和与温度测量电路可操作地耦合的温度比较电路。 温度比较电路可以被配置为将第一信号与表示至少第二半导体器件的第二工作温度的第二信号进行比较,并产生指示所指示的第一工作温度是高于还是等于指示的第二半导体器件的比较信号 工作温度 该装置还可以包括调整电路,其被配置为基于比较信号来调整第一半导体器件的操作。
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公开(公告)号:US20160126219A1
公开(公告)日:2016-05-05
申请号:US14927871
申请日:2015-10-30
发明人: Ahmad R. ASHRAFZADEH , Vijay G. ULLAL , Justin CHIANG , Daniel KINZER , Michael M. DUBE , Oseob JEON , Chung-Lin WU , Maria Cristina ESTACIO
IPC分类号: H01L25/065
CPC分类号: H01L25/0652 , H01L23/145 , H01L23/147 , H01L23/15 , H01L23/3121 , H01L23/5389 , H01L23/645 , H01L24/19 , H01L25/16 , H01L2224/0401 , H01L2224/06181 , H01L2224/16225 , H01L2224/32245 , H01L2224/73267 , H01L2225/06531 , H01L2225/06548 , H01L2225/06582 , H01L2225/06589 , H01L2924/12042 , H01L2924/1305 , H01L2924/13055 , H01L2924/1306 , H01L2924/13091 , H01L2924/1431 , H01L2924/1433 , H01L2924/1532 , H01L2924/15787 , H01L2924/181 , H01L2924/19041 , H01L2924/19042 , H01L2924/19043 , H01L2924/19105 , H01L2924/19106 , H01L2924/19107 , H01L2924/00
摘要: In one general aspect, a method can include forming a redistribution layer on a substrate using a first electroplating process, and forming a conductive pillar on the redistribution layer using a second electroplating process. The method can include coupling a semiconductor die to the redistribution layer, and can include forming a molding layer encapsulating at least a portion of the redistribution layer and at least a portion of the conductive pillar.
摘要翻译: 在一个一般方面,一种方法可以包括使用第一电镀工艺在衬底上形成再分配层,以及使用第二电镀工艺在再分配层上形成导电柱。 该方法可以包括将半导体管芯耦合到再分配层,并且可以包括形成封装再分布层的至少一部分和导电柱的至少一部分的成型层。
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公开(公告)号:US20150162270A1
公开(公告)日:2015-06-11
申请号:US14560856
申请日:2014-12-04
IPC分类号: H01L23/495 , H01L23/31
CPC分类号: H01L23/3107 , H01L23/49503 , H01L23/49541 , H01L23/49548 , H01L23/49551 , H01L23/49562 , H01L23/49575 , H01L24/97 , H01L2224/16245 , H01L2924/13055 , H01L2924/181 , H01L2924/00 , H01L2924/00012
摘要: In one general aspect, a package can include a semiconductor die having a first terminal on a first side of the semiconductor die and a second terminal on a second side of the semiconductor die, a leadframe portion electrically coupled to the second terminal of the semiconductor die, and a molding compound. The first terminal on the first side of the semiconductor die, a first surface of the leadframe portion, and a first surface of the molding compound can define at least a portion of a first surface of the package. A second surface of the molding compound and a second surface of the leadframe portion can define at least a portion of a second surface of the package parallel to the first surface of the package, and the second surface can be on an opposite side of the package from the first surface of the package.
摘要翻译: 在一个一般的方面,封装可以包括半导体管芯,半导体管芯具有半导体管芯的第一侧上的第一端子和半导体管芯的第二侧上的第二端子,电连接到半导体管芯的第二端子的引线框架部分 ,和模塑料。 半导体芯片的第一侧上的第一端子,引线框架部分的第一表面和模制化合物的第一表面可以限定封装的第一表面的至少一部分。 模制化合物的第二表面和引线框架部分的第二表面可以限定平行于包装的第一表面的包装的第二表面的至少一部分,并且第二表面可以在包装的相对侧上 从包装的第一个表面。
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