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    Laboratory diffraction-based phase contrast imaging technique
    1.
    发明授权
    Laboratory diffraction-based phase contrast imaging technique 有权
    实验室衍射相位成像技术

    公开(公告)号：US09068927B2

    公开(公告)日：2015-06-30

    申请号：US13725480

    申请日：2012-12-21

    Applicant: General Electric Company

    Inventor： Susanne Madeline Lee ,  Sudeep Mandal

    IPC: G01N23/223 ,  G21K1/06 ,  G01N23/207 ,  H01J35/08 ,  H01J35/14 ,  H01J35/12

    CPC classification number: G01N23/207 ,  G21K1/06 ,  G21K2207/005 ,  H01J35/08 ,  H01J35/12 ,  H01J35/14 ,  H01J2235/086 ,  H01J2235/186

    Abstract: Embodiments of the disclosure relate to X-ray imaging systems. In one embodiment, the X-ray imaging system features a target configured to receive a focused electron beam from an electron emitter and emit a line source X-ray beam as a result of receiving the focused electron beam; and a monochromator crystal configured to receive the line source X-ray beam from the target and diffract only a portion of the X-rays, wherein the portion of X-rays satisfies the Bragg diffraction condition for the monochromator crystal, and wherein the monochromator crystal is oriented relative to the target such that the portion of the X-rays from the target that satisfy the Bragg condition illuminate an entire length of a surface of the monochromator crystal.

    Abstract translation: 本公开的实施例涉及X射线成像系统。 在一个实施例中，X射线成像系统具有被配置为从电子发射器接收聚焦的电子束并且作为接收聚焦的电子束而发射线源X射线束的靶; 以及单色器晶体，被配置为从所述目标接收所述线源X射线束，并且仅衍射所述X射线的一部分，其中所述X射线部分满足所述单色器晶体的布拉格衍射条件，并且其中所述单色器晶体 相对于目标取向，使得来自目标的满足布拉格条件的X射线的部分照亮单色器晶体的表面的整个长度。

    MULTILAYER X-RAY SOURCE TARGET WITH HIGH THERMAL CONDUCTIVITY
    2.
    发明申请
    MULTILAYER X-RAY SOURCE TARGET WITH HIGH THERMAL CONDUCTIVITY 有权
    具有高导热性的多层X射线源头

    公开(公告)号：US20140185778A1

    公开(公告)日：2014-07-03

    申请号：US13730303

    申请日：2012-12-28

    Applicant: GENERAL ELECTRIC COMPANY

    Inventor： Susanne Madeline Lee ,  Raj Bahadur ,  Sudeep Mandal

    IPC: H01J35/12

    CPC classification number: G21K1/06 ,  H01J5/18 ,  H01J35/12 ,  H01J2235/086 ,  H01J2235/087 ,  H01J2235/088

    Abstract: In one embodiment, an X-ray source is provided that includes one or more electron emitters configured to emit one or more electron beams and one or more source targets configured to receive the one or more electron beams emitted by the one or more electron emitters and, as a result of receiving the one or more electron beams, to emit X-rays. Each source target of the X-ray source includes a first layer having one or more first materials; and a second layer in thermal communication with the first layer and having one or more second materials. The first layer is positioned closer to the one or more emitters than the second layer, the first material has a higher overall thermal conductivity than the second layer, and the second layer produces the majority of the X-rays emitted by the source target.

    Abstract translation: 在一个实施例中，提供了一种X射线源，其包括被配置为发射一个或多个电子束的一个或多个电子发射器和被配置为接收由一个或多个电子发射器发射的一个或多个电子束的一个或多个源极，以及 作为接收一个或多个电子束的结果，发射X射线。 X射线源的每个源目标包括具有一个或多个第一材料的第一层; 以及与第一层热连通并具有一个或多个第二材料的第二层。 第一层被定位成比第二层更靠近一个或多个发射体，第一材料具有比第二层更高的整体热导率，第二层产生由源靶发射的大部分X射线。

    Gas well integrity inspection system
    5.
    发明授权
    Gas well integrity inspection system 有权

    公开(公告)号：US09746583B2

    公开(公告)日：2017-08-29

    申请号：US14470348

    申请日：2014-08-27

    Applicant: General Electric Company

    Inventor： Ertugrul Berkcan ,  John Scott Price ,  Edward James Nieters ,  William Robert Ross ,  Clifford Bueno ,  Yuri Alexeyevich Plotnikov ,  Susanne Madeline Lee

    IPC: G01V5/14

    CPC classification number: G01V5/145

    Abstract: A well integrity inspection system configured to inspect a well structure including multiple concentric layers. The well integrity inspection system includes an inspection probe positioned in the well structure. The inspection probe includes a plurality of excitation assemblies for transmitting a plurality of radiation emissions into the well structure. The plurality of excitation assemblies includes at least a neutron excitation assembly and an X-ray excitation assembly. The inspection probe also includes a plurality of detection assemblies configured to receive a plurality of backscatter radiation returns from the well structure. The plurality of detection assemblies includes at least a neutron detection assembly and an X-ray detection assembly. The well integrity inspection system further including a processor operatively coupled to the inspection probe. The processor is configured to determine a well integrity parameter of the well structure based on at least one of the plurality of backscatter radiation returns.

    GAS WELL INTEGRITY INSPECTION SYSTEM
    7.
    发明申请
    GAS WELL INTEGRITY INSPECTION SYSTEM 有权
    气体良好检测系统

    公开(公告)号：US20160061991A1

    公开(公告)日：2016-03-03

    申请号：US14470348

    申请日：2014-08-27

    Applicant: General Electric Company

    Inventor： Ertugrul Berkcan ,  John Scott Price ,  Edward James Nieters ,  William Robert Ross ,  Clifford Bueno ,  Yuri Alexeyevich Plotnikov ,  Susanne Madeline Lee

    IPC: G01V5/14

    CPC classification number: G01V5/145

    Abstract: A well integrity inspection system configured to inspect a well structure including multiple concentric layers. The well integrity inspection system includes an inspection probe positioned in the well structure. The inspection probe includes a plurality of excitation assemblies for transmitting a plurality of radiation emissions into the well structure. The plurality of excitation assemblies includes at least a neutron excitation assembly and an X-ray excitation assembly. The inspection probe also includes a plurality of detection assemblies configured to receive a plurality of backscatter radiation returns from the well structure. The plurality of detection assemblies includes at least a neutron detection assembly and an X-ray detection assembly. The well integrity inspection system further including a processor operatively coupled to the inspection probe. The processor is configured to determine a well integrity parameter of the well structure based on at least one of the plurality of backscatter radiation returns.

    Abstract translation: 一种良好完整性检查系统，其被配置为检查包括多个同心层的井结构。 井完整性检查系统包括位于井结构中的检查探针。 检查探针包括用于将多个辐射发射物传输到井结构中的多个激发组件。 多个激励组件至少包括中子激发组件和X射线激发组件。 检查探针还包括多个检测组件，其被配置为从井结构接收多个反向散射辐射返回。 多个检测组件至少包括中子检测组件和X射线检测组件。 井完整性检查系统还包括可操作地耦合到检查探针的处理器。 处理器被配置为基于多个反向散射辐射返回中的至少一个来确定井结构的井完整性参数。

    Multilayer X-ray source target with high thermal conductivity
    9.
    发明授权
    Multilayer X-ray source target with high thermal conductivity 有权
    具有高导热性的多层X射线源靶

    公开(公告)号：US09008278B2

    公开(公告)日：2015-04-14

    申请号：US13730303

    申请日：2012-12-28

    Applicant: General Electric Company

    Inventor： Susanne Madeline Lee ,  Raj Bahadur ,  Sudeep Mandal

    IPC: H01J35/06 ,  B82Y99/00 ,  H01J5/18 ,  G21K1/06 ,  H01J35/12

    CPC classification number: G21K1/06 ,  H01J5/18 ,  H01J35/12 ,  H01J2235/086 ,  H01J2235/087 ,  H01J2235/088

    Abstract: In one embodiment, an X-ray source is provided that includes one or more electron emitters configured to emit one or more electron beams and one or more source targets configured to receive the one or more electron beams emitted by the one or more electron emitters and, as a result of receiving the one or more electron beams, to emit X-rays. Each source target of the X-ray source includes a first layer having one or more first materials; and a second layer in thermal communication with the first layer and having one or more second materials. The first layer is positioned closer to the one or more emitters than the second layer, the first material has a higher overall thermal conductivity than the second layer, and the second layer produces the majority of the X-rays emitted by the source target.

    Abstract translation: 在一个实施例中，提供了一种X射线源，其包括被配置为发射一个或多个电子束的一个或多个电子发射器和被配置为接收由一个或多个电子发射器发射的一个或多个电子束的一个或多个源极，以及 作为接收一个或多个电子束的结果，发射X射线。 X射线源的每个源目标包括具有一个或多个第一材料的第一层; 以及与第一层热连通并具有一个或多个第二材料的第二层。 第一层被定位成比第二层更靠近一个或多个发射体，第一材料具有比第二层更高的整体热导率，第二层产生由源靶发射的大部分X射线。

    LABORATORY DIFFRACTION-BASED PHASE CONTRAST IMAGING TECHNIQUE
    10.
    发明申请
    LABORATORY DIFFRACTION-BASED PHASE CONTRAST IMAGING TECHNIQUE 有权
    基于实验基于差分的相位对比成像技术

    公开(公告)号：US20140177801A1

    公开(公告)日：2014-06-26

    申请号：US13725480

    申请日：2012-12-21

    Applicant: GENERAL ELECTRIC COMPANY

    Inventor： Susanne Madeline Lee ,  Sudeep Mandal

    IPC: G01N23/207

    CPC classification number: G01N23/207 ,  G21K1/06 ,  G21K2207/005 ,  H01J35/08 ,  H01J35/12 ,  H01J35/14 ,  H01J2235/086 ,  H01J2235/186

    Abstract: Embodiments of the disclosure relate to X-ray imaging systems. In one embodiment, the X-ray imaging system features a target configured to receive a focused electron beam from an electron emitter and emit a line source X-ray beam as a result of receiving the focused electron beam; and a monochromator crystal configured to receive the line source X-ray beam from the target and diffract only a portion of the X-rays, wherein the portion of X-rays satisfies the Bragg diffraction condition for the monochromator crystal, and wherein the monochromator crystal is oriented relative to the target such that the portion of the X-rays from the target that satisfy the Bragg condition illuminate an entire length of a surface of the monochromator crystal.

    Abstract translation: 本公开的实施例涉及X射线成像系统。 在一个实施例中，X射线成像系统具有被配置为从电子发射器接收聚焦的电子束并且作为接收聚焦的电子束而发射线源X射线束的靶; 以及单色器晶体，被配置为从所述目标接收所述线源X射线束，并且仅衍射所述X射线的一部分，其中所述X射线部分满足所述单色器晶体的布拉格衍射条件，并且其中所述单色器晶体 相对于目标取向，使得来自目标的满足布拉格条件的X射线的部分照亮单色器晶体的表面的整个长度。

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