Systems and methods for providing a system-on-a-substrate
    1.
    发明授权
    Systems and methods for providing a system-on-a-substrate 有权
    用于提供衬底上系统的系统和方法

    公开(公告)号:US08334704B2

    公开(公告)日:2012-12-18

    申请号:US12565085

    申请日:2009-09-23

    IPC分类号: G01R31/20

    摘要: This relates to systems and methods for providing a system-on-a-substrate. In some embodiments, the necessary components for an entire system (e.g., a processor, memory, accelerometers, I/O circuitry, or any other suitable components) can be fabricated on a single microchip in “bare die” form. The die can, for example, be coupled to suitable flash memory through a substrate and flexible printed circuit board (“flex”). In some embodiments, the flex can extend past the substrate, die, or both, to allow additional, relatively large components to be coupled to the flex. In some embodiments, the die can be coupled to the flash memory through the flex and without a substrate. In some embodiments, component test points can be placed on the flash memory side of the substrate.

    摘要翻译: 这涉及用于提供衬底上系统的系统和方法。 在一些实施例中,整个系统(例如,处理器,存储器,加速度计,I / O电路或任何其它合适的部件)的必要组件可以在裸片形式的单个微芯片上制造。 例如,管芯可以通过基板和柔性印刷电路板(挠性)耦合到合适的闪存。 在一些实施例中,柔性件可以延伸经过衬底,管芯或两者,以允许附加的相对较大的部件联接到弯曲部。 在一些实施例中,管芯可以通过弯曲而不与衬底耦合到闪存。 在一些实施例中,组件测试点可以放置在衬底的闪存侧。

    SYSTEMS AND METHODS FOR PROVIDING A SYSTEM-ON-A-SUBSTRATE
    2.
    发明申请
    SYSTEMS AND METHODS FOR PROVIDING A SYSTEM-ON-A-SUBSTRATE 有权
    用于提供基片系统的系统和方法

    公开(公告)号:US20100213958A1

    公开(公告)日:2010-08-26

    申请号:US12565085

    申请日:2009-09-23

    IPC分类号: G01R31/02 H05K1/00

    摘要: This relates to systems and methods for providing a system-on-a-substrate. In some embodiments, the necessary components for an entire system (e.g., a processor, memory, accelerometers, I/O circuitry, or any other suitable components) can be fabricated on a single microchip in “bare die” form. The die can, for example, be coupled to suitable flash memory through a substrate and flexible printed circuit board (“flex”). In some embodiments, the flex can extend past the substrate, die, or both, to allow additional, relatively large components to be coupled to the flex. In some embodiments, the die can be coupled to the flash memory through the flex and without a substrate. In some embodiments, component test points can be placed on the flash memory side of the substrate.

    摘要翻译: 这涉及用于提供衬底上系统的系统和方法。 在一些实施例中,整个系统(例如,处理器,存储器,加速度计,I / O电路或任何其它合适的部件)的必要组件可以以“裸模”形式制造在单个微芯片上。 例如,管芯可以通过基板和柔性印刷电路板(“挠曲”)耦合到合适的闪存。 在一些实施例中,柔性件可以延伸经过衬底,管芯或两者,以允许附加的相对较大的部件联接到弯曲部。 在一些实施例中,管芯可以通过弯曲而不与衬底耦合到闪存。 在一些实施例中,组件测试点可以放置在衬底的闪存侧。

    Systems and methods for providing vias through a modular component
    3.
    发明授权
    Systems and methods for providing vias through a modular component 有权
    通过模块化组件提供通孔的系统和方法

    公开(公告)号:US08310835B2

    公开(公告)日:2012-11-13

    申请号:US12769086

    申请日:2010-04-28

    IPC分类号: H05K7/02 H01R43/00

    摘要: This relates to systems and methods for providing one or more vias through a module of an electrical system. For example, in some embodiments, the module can include one or more passive and/or active elements of the electrical system around which a packaging has been plastic molded. The module can be stacked under another component of the electrical system. Vias can then be provided that extend through the module. The vias can include, for example, electrically conductive pathways. In this manner, the vias can provide electrical pathways for coupling the component stacked on top of the module to other entities of an electronic device including the electrical system. For example, the component can be coupled to other entities such as other components, other modules, printed circuit boards, other electrical systems, or to any other suitable entity.

    摘要翻译: 这涉及用于通过电气系统的模块提供一个或多个通孔的系统和方法。 例如,在一些实施例中,该模块可以包括电气系统的一个或多个被动和/或有源元件,其中包装已经被塑料模制。 该模块可以堆叠在电气系统的另一个部件下。 然后可以提供通过模块延伸的通孔。 通孔可以包括例如导电通路。 以这种方式,通孔可以提供用于将堆叠在模块顶部上的部件耦合到包括电气系统的电子设备的其他实体的电路径。 例如,组件可以耦合到诸如其他组件,其他模块,印刷电路板,其他电气系统或任何其它合适实体的其他实体。

    SYSTEMS AND METHODS FOR PROVIDING VIAS THROUGH A MODULAR COMPONENT
    4.
    发明申请
    SYSTEMS AND METHODS FOR PROVIDING VIAS THROUGH A MODULAR COMPONENT 有权
    通过模块化组件提供VIAS的系统和方法

    公开(公告)号:US20110013373A1

    公开(公告)日:2011-01-20

    申请号:US12769086

    申请日:2010-04-28

    IPC分类号: H05K7/02 H01R43/00

    摘要: This relates to systems and methods for providing one or more vias through a module of an electrical system. For example, in some embodiments, the module can include one or more passive elements and/or active of the electrical system around which a packaging has been plastic molded. The module can be stacked under another component of the electrical system. Vias can then be provided that extend through the module. The vias can include, for example, electrically conductive pathways. In this manner, the vias can provide electrical pathways for coupling the component stacked on top of the module to other entities of an electronic device including the electrical system. For example, the component can be coupled to other entities such as other components, other modules, printed circuit boards, other electrical systems, or to any other suitable entity.

    摘要翻译: 这涉及用于通过电气系统的模块提供一个或多个通孔的系统和方法。 例如,在一些实施例中,模块可以包括电气系统的一个或多个无源元件和/或主动元件,其中包装已经被塑料模制。 该模块可以堆叠在电气系统的另一个部件下。 然后可以提供通过模块延伸的通孔。 通孔可以包括例如导电通路。 以这种方式,通孔可以提供用于将堆叠在模块顶部上的部件耦合到包括电气系统的电子设备的其他实体的电路径。 例如,组件可以耦合到诸如其他组件,其他模块,印刷电路板,其他电气系统或任何其它合适实体的其他实体。

    Circuit boards including removable test point portions and configurable testing platforms
    5.
    发明授权
    Circuit boards including removable test point portions and configurable testing platforms 有权
    电路板包括可拆卸测试点部分和可配置的测试平台

    公开(公告)号:US08362793B2

    公开(公告)日:2013-01-29

    申请号:US11973793

    申请日:2007-10-09

    IPC分类号: G01R31/02

    摘要: Circuit boards are provided that include a functional portion and at least one removable test point portion. The removable test point portion may include test points which are accessed to verify whether the functional portion is operating properly or whether installed electronic components are electrically coupled to the board. If multiple boards are manufactured together on a single panel (in which the individual boards are broken off), the test points can be placed on bridges (e.g., removable portions) that connect the individual boards together during manufacturing and testing. Configurable test boards are also provided that can be adjusted to accommodate circuit boards of different size and electrical testing requirements. Methods and systems for testing these circuit boards are also provided.

    摘要翻译: 提供了包括功能部分和至少一个可拆卸测试点部分的电路板。 可拆卸测试点部分可以包括被访问以验证功能部分是否正常操作或者是否安装的电子部件电耦合到板的测试点。 如果在单个面板(其中单独的电路板被断开)中一起制造多个电路板,则测试点可以放置在在制造和测试期间将各个电路板连接在一起的桥接器(例如,可拆卸部分)上。 还提供了可配置的测试板,可以调整以适应不同尺寸和电气测试要求的电路板。 还提供了用于测试这些电路板的方法和系统。