Non-Volatile Memory Device and Program Method Thereof
    1.
    发明申请
    Non-Volatile Memory Device and Program Method Thereof 有权
    非易失性存储器件及其程序方法

    公开(公告)号:US20100142281A1

    公开(公告)日:2010-06-10

    申请号:US12575735

    申请日:2009-10-08

    IPC分类号: G11C16/04

    CPC分类号: G11C11/5628 G11C2211/5621

    摘要: Disclosed is a program method of a non-volatile memory device which comprises classifying plural memory cells into aggressor cells and victim cells based on program data to be written in the plural memory cells; and programming the aggressor cells by a program manner different from the victim cells.

    摘要翻译: 本发明公开了一种非易失性存储器件的程序方法,该方法包括:根据要写入多个存储器单元的程序数据,将多个存储单元分为侵略单元和受害单元; 并且通过与受害细胞不同的程序方式对攻击者细胞进行编程。

    Non-volatile memory device and program method thereof
    2.
    发明授权
    Non-volatile memory device and program method thereof 有权
    非易失性存储器件及其程序方法

    公开(公告)号:US08331144B2

    公开(公告)日:2012-12-11

    申请号:US12575735

    申请日:2009-10-08

    IPC分类号: G11C11/34

    CPC分类号: G11C11/5628 G11C2211/5621

    摘要: Disclosed is a program method of a non-volatile memory device which comprises classifying plural memory cells into aggressor cells and victim cells based on program data to be written in the plural memory cells; and programming the aggressor cells by a program manner different from the victim cells.

    摘要翻译: 本发明公开了一种非易失性存储器件的程序方法,该方法包括:根据要写入多个存储器单元的程序数据,将多个存储单元分为侵略单元和受害单元; 并且通过与受害细胞不同的程序方式对攻击者细胞进行编程。

    Method analyzing threshold voltage distribution in nonvolatile memory
    3.
    发明授权
    Method analyzing threshold voltage distribution in nonvolatile memory 有权
    方法分析非易失性存储器中的阈值电压分布

    公开(公告)号:US08116141B2

    公开(公告)日:2012-02-14

    申请号:US12558627

    申请日:2009-09-14

    IPC分类号: G11C11/34

    CPC分类号: G11C16/26 G11C16/3427

    摘要: A distribution analyzing method for a nonvolatile memory device having memory cells exhibiting overlapping first and second threshold voltage distributions includes; detecting a degree of overlap between the first and second threshold voltage distributions by reading data stored in the memory cells and determining read index data from the read data, and estimating a distribution characteristic for at least one of the overlapping threshold voltage distributions using the read index data.

    摘要翻译: 一种具有显示重叠的第一和第二阈值电压分布的存储单元的非易失性存储器件的分布分析方法包括: 通过读取存储在存储单元中的数据并根据读取的数据确定读取的索引数据来检测第一和第二阈值电压分布之间的重叠程度,并且使用读取的索引来估计至少一个重叠阈值电压分布的分布特性 数据。

    Memory systems and defective block management methods related thereto
    4.
    发明授权
    Memory systems and defective block management methods related thereto 有权
    与其相关的存储器系统和有缺陷的块管理方法

    公开(公告)号:US08417988B2

    公开(公告)日:2013-04-09

    申请号:US12784683

    申请日:2010-05-21

    IPC分类号: G06F11/26 G06F11/00

    CPC分类号: G11C29/82

    摘要: Memory systems and related defective block management methods are provided. Methods for managing a defective block in a memory device include allocating a defective block when a memory block satisfies a defective block condition. The allocated defective block is cancelled when the allocated defective block satisfies a defective block cancellation condition.

    摘要翻译: 提供了存储器系统和相关的有缺陷的块管理方法。 用于管理存储器件中的缺陷块的方法包括当存储器块满足缺陷块状态时分配缺陷块。 当分配的缺陷块满足缺陷块取消条件时,分配的缺陷块被取消。

    Methods of accessing storage devices
    5.
    发明授权
    Methods of accessing storage devices 有权
    访问存储设备的方法

    公开(公告)号:US08310876B2

    公开(公告)日:2012-11-13

    申请号:US12662103

    申请日:2010-03-31

    IPC分类号: G11C16/04

    摘要: Methods of accessing storage devices. The methods include rearranging a writing order of continuous first and second data according to a reading order, and writing the first and second data in a first and second storage region of the storage device, respectively, according to the writing order. The reading order reads the second storage region first that provides interference on the first storage region.

    摘要翻译: 访问存储设备的方法 这些方法包括根据读取顺序重新排列连续的第一和第二数据的写入顺序,以及根据写入顺序将第一和第二数据分别写入存储装置的第一和第二存储区域。 读取顺序首先读取在第一存储区域上提供干扰的第二存储区域。

    Memory Systems and Defective Block Management Methods Related Thereto
    6.
    发明申请
    Memory Systems and Defective Block Management Methods Related Thereto 有权
    与其相关的内存系统和缺陷块管理方法

    公开(公告)号:US20100306583A1

    公开(公告)日:2010-12-02

    申请号:US12784683

    申请日:2010-05-21

    IPC分类号: G06F11/20

    CPC分类号: G11C29/82

    摘要: Memory systems and related defective block management methods are provided. Methods for managing a defective block in a memory device include allocating a defective block when a memory block satisfies a defective block condition. The allocated defective block is cancelled when the allocated defective block satisfies a defective block cancellation condition.

    摘要翻译: 提供了存储器系统和相关的有缺陷的块管理方法。 用于管理存储器件中的缺陷块的方法包括当存储器块满足缺陷块状态时分配缺陷块。 当分配的缺陷块满足缺陷块取消条件时,分配的缺陷块被取消。

    Methods of accessing storage devices
    7.
    发明申请
    Methods of accessing storage devices 有权
    访问存储设备的方法

    公开(公告)号:US20100265764A1

    公开(公告)日:2010-10-21

    申请号:US12662103

    申请日:2010-03-31

    IPC分类号: G11C16/02

    摘要: Methods of accessing storage devices. The methods include rearranging a writing order of continuous first and second data according to a reading order, and writing the first and second data in a first and second storage region of the storage device, respectively, according to the writing order. The reading order reads the second storage region first that provides interference on the first storage region.

    摘要翻译: 访问存储设备的方法 这些方法包括根据读取顺序重新排列连续的第一和第二数据的写入顺序,以及根据写入顺序将第一和第二数据分别写入存储装置的第一和第二存储区域。 读取顺序首先读取在第一存储区域上提供干扰的第二存储区域。

    Data Processing System Having ECC Encoding and Decoding Circuits Therein with Code Rate Selection Based on Bit Error Rate Detection
    9.
    发明申请
    Data Processing System Having ECC Encoding and Decoding Circuits Therein with Code Rate Selection Based on Bit Error Rate Detection 审中-公开
    具有基于误码率检测的码率选择的ECC编码和解码电路的数据处理系统

    公开(公告)号:US20100241928A1

    公开(公告)日:2010-09-23

    申请号:US12716793

    申请日:2010-03-03

    IPC分类号: H03M13/05 G06F11/10

    摘要: A data processing system includes an error checking and correction (ECC) encoding circuit, an integrated circuit memory and a code rate control circuit. The ECC encoding circuit is configured to selectively apply a plurality of unique ECC code rates to write data received by the data processing system during an operation to convert the write data into encoded data, in response to a code rate selection signal. The integrated circuit memory includes a plurality of storage regions therein. These storage regions are configured to receive respective portions of the encoded data from the ECC encoding circuit. The code rate control circuit is configured to generate the code rate selection signal. This code rate selection signal has a value that specifies the corresponding ECC code rate to be applied to respective portions of the write data.

    摘要翻译: 数据处理系统包括纠错(ECC)编码电路,集成电路存储器和码率控制电路。 ECC编码电路被配置为响应于码率选择信号,在操作期间选择性地应用多个唯一ECC码率来写入由数据处理系统接收的数据,以将写入数据转换为编码数据。 集成电路存储器包括多个存储区域。 这些存储区域被配置为从ECC编码电路接收编码数据的相应部分。 码率控制电路被配置为产生码率选择信号。 该码率选择信号具有指定应用于写入数据的各个部分的相应的ECC码率的值。