Analytical method of auger electron spectroscopy for insulating sample
    1.
    发明授权
    Analytical method of auger electron spectroscopy for insulating sample 失效
    绝缘样品螺旋电子能谱分析方法

    公开(公告)号:US5889282A

    公开(公告)日:1999-03-30

    申请号:US919154

    申请日:1997-08-28

    CPC分类号: G01N23/2276 H01J2237/2511

    摘要: A method of Auger Electron Spectroscopic (AES) analysis for a surface of an insulating sample. The method is characterized by performing an AES analysis after depositing a conductive layer of a designated thickness on the surface of a sample containing an insulating layer by means of an ion beam sputtering for the purpose of the preventing charge accumulation. The conductive layer preferably is deposited to have a thickness of at least 6 .ANG. to 50 .ANG. and a beam voltage used for applying the conductive layer is at least 3 Kev. The conductive layer is made of any of iridium(Ir), chrome(Cr) and gold(Au). Because any electron charge generated on the sample is discharged via the conductive layer, the AES analysis can be performed for a sample containing an insulating layer.

    摘要翻译: 绝缘样品表面的俄歇电子能谱(AES)分析方法。 该方法的特征在于,为了防止电荷累积,通过离子束溅射,在含有绝缘层的样品的表面上沉积指定厚度的导电层之后进行AES分析。 导电层优选沉积为具有至少6安培至50埃的厚度,并且用于施加导电层的束电压为至少3Kev。 导电层由铱(Ir),铬(Cr)和金(Au)中的任一种制成。 因为在样品上产生的任何电子电荷通过导电层放电,所以可以对含有绝缘层的样品进行AES分析。